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公开(公告)号：US20240353462A1
公开(公告)日：2024-10-24
申请号：US18465058
申请日：2023-09-11
Applicant: NORTHROP GRUMMAN SYSTEMS CORPORATION
Inventor： ERIC A. IMHOF , STEVEN WERNER GEIBEL , STEVEN RYAN JEFFERTS
IPC: G01R29/14 , G01R23/02 , G01R31/308
CPC classification number: G01R29/14 , G01R23/02 , G01R31/308
Abstract: One embodiment includes an electrometer system. The system includes a sensor cell comprising alkali metal atoms within and an optical beam system configured to provide at least one optical beam through the sensor cell to provide a Rydberg energy state of the alkali metal atoms, the at least one optical beam exiting the sensor cell as a detection beam. The system also includes a signal generator configured to generate a radio frequency (RF) tuning signal. The system also includes a waveguide extending along a length of the sensor cell, the waveguide being configured to propagate the RF tuning signal in the sensor cell to tune at least one energy state of the alkali metal atoms relative to the Rydberg energy state. The system further includes a detection system configured to monitor the detection beam to detect an external signal based on monitoring the detection beam.
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公开(公告)号：US12055570B2
公开(公告)日：2024-08-06
申请号：US17752816
申请日：2022-05-24
Applicant: ADVANTEST CORPORATION
Inventor： Masayuki Kawabata , Mitsuo Matsumoto , Shinya Sato , Masakatsu Suda
CPC classification number: G01R23/02 , G01R31/2851
Abstract: Provided is a measurement apparatus including a signal source configured to output a binary digital signal configuring a multi-tone waveform, a waveform acquisition unit configured to acquire an analog signal waveform generated in response to application of the digital signal to a device under test, and a computation unit configured to calculate a frequency characteristic of the device under test from the waveform acquired by the waveform acquisition unit, in which the signal source is configured to repeatedly output a signal upconverted by multiplying a pseudo-random binary sequence (PRBS) signal by a repeating rectangular wave with a reference frequency and a reference duty ratio.
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公开(公告)号：US11885688B2
公开(公告)日：2024-01-30
申请号：US16934386
申请日：2020-07-21
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Guanghua Wang , Bryon Edward Knight , Andrew Lee Trimmer , Jason Edward Dees , Bernard Patrick Bewlay , Sean Robert Farrell
CPC classification number: G01J5/0088 , F01D21/003 , G01J5/0022 , G01J5/027 , F05D2270/303 , F05D2270/804 , G01J5/48 , G01J2005/0077 , G01N25/18 , G01R23/02
Abstract: A method of imaging a turbine engine component with a first surface and a second surface that is spaced from the first surface. The turbine engine component includes a plurality of holes with inlets formed in the second surface or interior that are fluidly coupled to outlets formed in the first surface or exterior. The method includes determining at least one fluid frequency, determining at least one sampling frequency, and pulsing fluid through at least a portion of the interior of turbine engine component while imaging the turbine engine component.
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公开(公告)号：US20230384356A1
公开(公告)日：2023-11-30
申请号：US18141390
申请日：2023-04-29
Applicant: University of Houston System
Inventor： Goran Majkic , Venkat Selvamanickam , Jarek Wosik
CPC classification number: G01R23/02 , H10N60/857 , H01P3/081
Abstract: A method and system for quench detection in high temperature superconductors, such as REBCO (rare-earth barium copper oxide), before thermal runaway. A REBCO superconducting tape is excited as a transmission line forming standing waves. A quench may then be detected in response to detecting a disturbance of the standing waves. In this manner, quench in high temperature superconductors, such as REBCO, is rapidly detected before thermal runaway.
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公开(公告)号：US20230358794A1
公开(公告)日：2023-11-09
申请号：US18351455
申请日：2023-07-12
Applicant: K-ENERGY SYSTEM CO., LTD.
Inventor： Eung Seok KIM
Abstract: The present invention proposes an arc detector having a multi-band frequency detection function, which divides an arc frequency band using multiple band-pass filters and detects whether or not an arc occurs in each of the divided frequency bands, thereby eliminating switching noise or power supply noise that mainly occurs in a certain frequency band, and consequently increasing the accuracy of arc detection. In addition, the arc detector of the present invention may minimize the use of expensive analog-to-digital converters and increase the accuracy of arc detection through overlapping area detection.
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Patent Agency Ranking
公开(公告)号：US11808795B2
公开(公告)日：2023-11-07
申请号：US17572133
申请日：2022-01-10
Applicant: AGENCY FOR DEFENSE DEVELOPMENT
Inventor： Tae Yeob Kang , Donghwan Seo
IPC: G01R23/02
CPC classification number: G01R23/02
Abstract: Disclosed are a method and an apparatus for improving circuit health. The method includes obtaining an S-parameter plot of a circuit having an input port and an output port; determining a resonance frequency of the circuit based on the S-parameter plot; and estimating the health of the circuit based on the resonance frequency.
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公开(公告)号：US11761919B2
公开(公告)日：2023-09-19
申请号：US16510742
申请日：2019-07-12
Inventor： Benjamin R. Bunes , Leonard Cardillo , Douglas Later , Ling Zang , Douglas H. Werner , Ronald Jenkins , Micah D. Gregory
IPC: G01N27/12 , G01R23/02 , C07D471/06 , G01N33/00
CPC classification number: G01N27/122 , C07D471/06 , G01N27/127 , G01N33/0057 , G01R23/02
Abstract: A system for low power chemical sensing can include a voltage shift unit which receives a voltage signal from a chemical sensor unit. The voltage signal can be determined by a concentration of an analyte. The voltage shift unit can transform the voltage signal to an input voltage signal, and send the input voltage signal to a plurality of frequency selective surface (FSS) units of an FSS array. The FSS array can communicate a radio frequency (RF) signal in an Institute of Electrical and Electronics Engineers (IEEE) S band with a resonant frequency based on the input voltage to provide the concentration of the analyte.
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公开(公告)号：US11754602B2
公开(公告)日：2023-09-12
申请号：US17545385
申请日：2021-12-08
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： Marcos A. Donolo , Jay Hartshorn
CPC classification number: G01R23/02 , G01R23/005 , H03M1/12
Abstract: Systems and methods may be used to measure a frequency of a power delivery system and/or of a supply signal transmitted to a load. A system may record an input waveform, determine a frequency of the input waveform at a present time based at least in part on the input waveform and a derivative of the input waveform, and control an operation of a power delivery system based at least in part on the determined frequency.
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公开(公告)号：US11754601B2
公开(公告)日：2023-09-12
申请号：US17128206
申请日：2020-12-21
Applicant: SHANXI UNIVERSITY
Inventor： Jianyong Hu , Ruiyun Chen , Chengbing Qin , Guofeng Zhang , Jie Ma , Liantuan Xiao , Suotang Jia
Abstract: A frequency measurement method and a system thereof are provided. The method includes: generating to-be-detected emergent light under an action of the electro-optical crystal when a light source irradiates an electro-optical crystal disposed in the microwave electric field; detecting, by a single-photon detector, the to-be-detected emergent light to obtain a detection result of the single-photon detector; and determining a frequency of the microwave signal based on the detection result of the single-photon detector and a Fourier transform algorithm.
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公开(公告)号：US20230204642A1
公开(公告)日：2023-06-29
申请号：US17996442
申请日：2020-04-29
Applicant: Microsoft Technology Licensing, LLC
Inventor： Jonne Verneri KOSKI , Filip Kazimierz MALINOWSKI
CPC classification number: G01R27/2605 , G01R23/02 , G01R31/2621
Abstract: Provided is a method of determining a gate capacitance of a semiconductor device having a source, a drain, a gate, and a channel, the semiconductor device being arranged in a circuit further comprising an electrical resonator, wherein one of the source, the drain, and the gate is connected to the electrical resonator. The method comprises: measuring a resonance frequency of the circuit; and calculating, based on the resonance frequency, the gate capacitance. Since it is not necessary to pass a current through the semiconductor device, an accurate measurement of gate capacitance may be achieved. Also provided are an apparatus for determining a gate capacitance, a probe for measuring gate capacitance, and a related computer program product.
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