-
公开(公告)号:US09964597B2
公开(公告)日:2018-05-08
申请号:US15255044
申请日:2016-09-01
Applicant: Texas Instruments Incorporated
Inventor: Sundarrajan Rangachari , Saket Jalan
IPC: G01R31/319 , G01R31/317 , G01R31/3177
CPC classification number: G01R31/31901 , G01R31/31701 , G01R31/31703 , G01R31/31724 , G01R31/31727 , G01R31/3177
Abstract: Methods and apparatus for self test of safety logic in safety critical devices is provided in which the safety logic includes comparator logic coupled to a circuit under test (CUT) in a safety critical device and the self test logic is configured to test the comparator logic. The self test logic may be implemented as a single cycle parallel bit inversion approach, a multi-cycle serial bit inversion approach, or a single cycle test pattern injection approach.
-
公开(公告)号:US09929744B2
公开(公告)日:2018-03-27
申请号:US15782052
申请日:2017-10-12
Applicant: Texas Instruments Incorporated
Inventor: Sundarrajan Rangachari , Desmond Pravin Martin Fernandes , Rakesh Channabasappa Yaraduyathinahalli
CPC classification number: H03M7/30 , G06F3/06 , G06F13/00 , G06F2212/401 , H03M7/6047
Abstract: Disclosed embodiments include a system having a first memory for storing a plurality of data quantities, each data quantity consisting of a first number of bits, and a second memory for storing a plurality of compressed data quantities, each compressed data quantity consisting of a second number of bits that is less than the first number of bits. The system includes circuitry for reading data quantities from the first memory and for writing compressed data quantities, corresponding to respective read data quantities, to non-sequential addresses in the second memory. The circuitry for reading data quantities from the first memory is for reading along a read orientation selected from one of row-orientation or column-orientation from the first memory, and the circuitry for writing compressed data quantities in the second memory is for writing along a write orientation in the second memory that differs from the read orientation.
-
公开(公告)号:US09025705B2
公开(公告)日:2015-05-05
申请号:US14046479
申请日:2013-10-04
Applicant: Texas Instruments Incorporated
Inventor: Sundarrajan Rangachari , Jaiganesh Balakrishnan
CPC classification number: H04L25/061
Abstract: A digital circuit includes at least one input node, a biasing circuit, and a digital baseband circuit. The input node receives a digital signal including samples at a plurality of sample instances, the samples including a positive sample and a negative sample and represented by first plurality of bits. The biasing circuit generates a biased digital signal by adding a bias value to the digital signal so as to change the positive sample and the negative sample to first sample and second sample respectively and represented by second plurality of bits. The digital baseband circuit is configured to receive and process the biased digital signal such that reduced current consumption is realized based on a number of bit toggles in the second plurality of bits being less than a number of bit toggles in the first plurality of bits.
Abstract translation: 数字电路包括至少一个输入节点,偏置电路和数字基带电路。 输入节点接收包括多个采样实例的采样的数字信号,采样包括正采样和负采样并由第一多个位表示。 偏置电路通过向数字信号添加偏置值来产生偏置数字信号,以分别将正采样和负采样改变为第一采样和第二采样,并由第二多位表示。 数字基带电路被配置为接收和处理偏置的数字信号,使得基于第二多个位中的多个比特切换小于第一多个比特中的比特切换的数量来实现减少的电流消耗。
-
公开(公告)号:US11757475B2
公开(公告)日:2023-09-12
申请号:US17492710
申请日:2021-10-04
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Jaiganesh Balakrishnan , Sriram Murali , Sundarrajan Rangachari , Yeswanth Guntupalli
CPC classification number: H04B1/0025 , H04B1/001 , H04B1/0042
Abstract: A radio-frequency (RF) sampling transmitter (e.g., of the type that may be used in 5G wireless base stations) includes a complex baseband digital-to-analog converter (DAC) response compensator that operates on a complex baseband signal at a sampling rate lower than the sampling rate of an RF sampling DAC in the RF sampling transmitter. The DAC response compensator flattens the sample-and-hold response of the RF sampling DAC only in the passband of interest, addressing the problem of a sin c response introduced by the sample-and-hold operation of the RF sampling DAC and avoiding the architectural complexity and high power consumption of an inverse sin c filter that operates on the signal at a point in the signal chain after it has already been up-converted to an RF passband.
-
公开(公告)号:US11709203B2
公开(公告)日:2023-07-25
申请号:US17690821
申请日:2022-03-09
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Prakash Narayanan , Sundarrajan Rangachari , Prashanth Saraf
IPC: G01R31/3183 , G01R31/3185 , G01R31/3181 , G01R31/317
CPC classification number: G01R31/318307 , G01R31/31726 , G01R31/31727 , G01R31/31813 , G01R31/318552 , G01R31/318558 , G01R31/31708
Abstract: A circuit includes a test circuit in an integrated circuit to test signal timing of a logic circuit under test in the integrated circuit. The signal timing includes timing measurements to determine if an output of the logic circuit under test changes state in response to a clock signal. The test circuit includes a bit register that specifies which bits of the logic circuit under test are to be tested in response to the clock signal. A configuration register specifies a selected clock source setting from multiple clock source settings corresponding to a signal speed. The selected clock source is employed to perform the timing measurements of the specified bits of the bit register.
-
公开(公告)号:US10911057B2
公开(公告)日:2021-02-02
申请号:US16680046
申请日:2019-11-11
Applicant: TEXAS INSTRUMENTS INCORPORATED
Abstract: A digital clock generator for a digital clock domain interfaced to another clock domain through a FIFO, includes division selector circuitry to provide an input randomizing sequence of clock division factors, selected from a defined set of clock division factors corresponding to a target average clock division, and division arbitration circuitry to generate a drift-corrected randomizing sequence of clock division factors, based at least in part on the input randomizing sequence of clock division factors, and an accumulated drift correction signal. A clock drift control loop generates the accumulated drift correction signal, based at least in part on an accumulated clock drift relative to the target average clock division. Clock generation can be based on randomized division with the drift-corrected randomizing sequence of clock division factors. The drift-corrected randomizing sequence of clock division factors can be generated so that clock drift is bounded based on a FIFO depth.
-
公开(公告)号:US10574246B2
公开(公告)日:2020-02-25
申请号:US15949294
申请日:2018-04-10
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Sarma Sundareswara Gunturi , Sundarrajan Rangachari , Aswath Vs , Raunak Dhaniwala
Abstract: A digital local oscillator includes a look-up table and oscillator control circuitry. The look-up table contains samples of the digital local oscillator signal. The oscillator control circuitry is configured to select samples from the look-up table based on an accumulated phase value. The oscillator control circuitry is also configured to add a correction value to the accumulated phase value based on a difference of a frequency of the digital local oscillator signal and a desired frequency.
-
公开(公告)号:US10320412B2
公开(公告)日:2019-06-11
申请号:US15895721
申请日:2018-02-13
Applicant: Texas Instruments Incorporated
Inventor: Sundarrajan Rangachari , Desmond Pravin Martin Fernandes , Rakesh Channabasappa Yaraduyathinahalli
Abstract: Disclosed embodiments include a system having a first memory, a second memory, circuitry that reads data quantities from the first memory along a first orientation, a compression engine that compresses each of the read data quantities to produce corresponding compressed data quantities, and circuitry that writes the compressed data quantities to the second memory along a second orientation which differs from the first orientation. The read data quantities have a first bit width and the compressed data quantities have a second bit width that is less than the first bit width.
-
公开(公告)号:US20180367169A1
公开(公告)日:2018-12-20
申请号:US16110478
申请日:2018-08-23
Applicant: Texas Instruments Incorporated
Inventor: Jaiganesh Balakrishnan , Suvam Nandi , Sundarrajan Rangachari
CPC classification number: H04B1/0042 , G06F5/01 , H03H17/0211 , H03H17/0273 , H03H17/0275 , H03H17/0657 , H03H17/0664 , H04B1/0046 , H04B1/0475 , H04B1/1027
Abstract: A digital filter for interpolation or decimation and a device incorporating the digital filter is disclosed. The digital filter includes a filter block, a first transformation circuit coupled to the filter block and an input stream coupled to provide input values to a component selected from the filter block and the first transformation circuit. The filter block includes a pair of sub-filters having respective transformed coefficients, the respective transformed coefficients of a first sub-filter of the pair of sub-filters being symmetric and the respective transformed coefficients of a second sub-filter of the pair of sub-filters being anti-symmetric. The first transformation circuit is coupled to perform a first transformation; the filter block and the first transformation circuit together provide suppression of undesired spectral images in final outputs of the digital filter.
-
公开(公告)号:US20180191383A1
公开(公告)日:2018-07-05
申请号:US15395135
申请日:2016-12-30
Applicant: Texas Instruments Incorporated
Inventor: Jaiganesh Balakrishnan , Suvam Nandi , Sundarrajan Rangachari
CPC classification number: H04B1/0042 , G06F5/01 , H03H17/0211 , H03H17/0275 , H03H17/0657 , H03H17/0664 , H04B1/0046 , H04B1/0475 , H04B1/1027
Abstract: A digital filter for interpolation or decimation and a device incorporating the digital filter is disclosed. The digital filter includes a filter block, a first transformation circuit coupled to the filter block and an input stream coupled to provide input values to a component selected from the filter block and the first transformation circuit. The filter block includes a pair of sub-filters having respective transformed coefficients, the respective transformed coefficients of a first sub-filter of the pair of sub-filters being symmetric and the respective transformed coefficients of a second sub-filter of the pair of sub-filters being anti-symmetric. The first transformation circuit is coupled to perform a first transformation; the filter block and the first transformation circuit together provide suppression of undesired spectral images in final outputs of the digital filter.
-
-
-
-
-
-
-
-
-