-
公开(公告)号：US10748735B2
公开(公告)日：2020-08-18
申请号：US15940796
申请日：2018-03-29
Applicant: The Boeing Company
Inventor： Morteza Safai , Gary Georgeson , Barry R. Fox
Abstract: Systems, methods, and apparatus for a multi-spectral X-ray target and source are disclosed. In one or more embodiments, a disclosed method comprises emitting, by a source of the X-ray generator, electrons towards a section of a multi-spectral X-ray target of the X-ray generator. In one or more embodiments, the multi-spectral X-ray target is rotatable and comprises a plurality of sections, which each comprise an X-ray generating material and at least two of the sections comprise a different X-ray generating material. The method further comprises generating a set of X-rays, when the electrons impinge on the section of the multi-spectral X-ray target. The method further comprises rotating the multi-spectral X-ray target such that the source is in position to project the electrons towards another section of the multi-spectral X-ray target. Further, the method comprises repeating the above method steps for all of the remaining sections of the multi-spectral X-ray target.
-
公开(公告)号：US10656075B2
公开(公告)日：2020-05-19
申请号：US15946103
申请日：2018-04-05
Applicant: THE BOEING COMPANY
Inventor： Morteza Safai , Gary E. Georgeson
Abstract: A method of laser bond inspection is provided. The method includes applying a thermochromatic energy-absorbing material to an inspection site of a test article. The method includes delivering a first amount of energy to the inspection site using a laser. The first amount of energy generates stresses in the test article. The method includes absorbing the first amount of energy into the thermochromatic energy-absorbing material to produce an observable thermal response that correlates to the first amount of energy.
-
公开(公告)号：US10579049B2
公开(公告)日：2020-03-03
申请号：US14479835
申请日：2014-09-08
Applicant: The Boeing Company
Inventor： Morteza Safai , Ronald Gail Turner
IPC: G05B19/418 , G05B19/401
Abstract: An automatic component fabrication system, for use in fabricating a component, includes a control system having a memory that includes a computerized model of the component to be fabricated. A first monitoring system including a first illumination device and at least one camera is communicatively coupled to the control system and is configured to determine a position of the material at a first location. A cutting system is communicatively coupled to the control system and is configured to cut the component from a sheet of material based on the determined position and the computerized model. The automatic component fabrication system also includes a second monitoring system including a second illumination device and at least one camera. The second monitoring system is communicatively coupled to the control system and is configured to compare the fabricated component to the computerized model.
-
公开(公告)号：US10578565B2
公开(公告)日：2020-03-03
申请号：US15701244
申请日：2017-09-11
Applicant: The Boeing Company
Inventor： Morteza Safai , Gary Ernest Georgeson
IPC: G01N23/203 , G01N23/083 , G01N23/02 , G01N23/06 , G01B15/02 , G01N23/18 , G01N23/20
Abstract: A method and system for scanning an elongate structure. A scanner in a scanning system is moved axially along the elongate structure using a translating structure in the scanning system. The elongate member is scanned axially as the scanner moves axially along the elongate structure. The scanner is moved rotationally around the elongate structure at a location in which an inconsistency is detected at the location during an axial scan. The elongate structure is scanned rotationally at the location while the scanner moves rotationally around the elongate structure.
-
公开(公告)号：US20200064278A1
公开(公告)日：2020-02-27
申请号：US16667380
申请日：2019-10-29
Applicant: The Boeing Company
Inventor： Morteza Safai
Abstract: An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.
-
Patent Agency Ranking
公开(公告)号：US20200003707A1
公开(公告)日：2020-01-02
申请号：US16560429
申请日：2019-09-04
Applicant: The Boeing Company
Inventor： Matthew T. Grimshaw , Talion Edwards , Gary E. Georgeson , Daniel J. Wright , James E. Engel , Morteza Safai , Yuan-Jye Wu , Taisia Tsukruk Lou , Rodney S. Wright
IPC: G01N23/203 , H05G1/26 , G01V5/00
Abstract: A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.
-
公开(公告)号：US20190302038A1
公开(公告)日：2019-10-03
申请号：US15940558
申请日：2018-03-29
Applicant: The Boeing Company
Inventor： Morteza Safai , Gary Ernest Georgeson
IPC: G01N23/20008 , G01N23/203
Abstract: A method, a system, and an apparatus for scanning an elongate structure. A scanner in a scanning system is moved on a helical path around the elongate structure. The scanner is moved on the helical path around the elongate structure using a helical track system attached to the elongate structure using a translating structure. An x-ray beam is emitted from the scanner while the scanner moves on the helical path. Backscatter is detected from the x-ray beam encountering the elongate structure.
-
公开(公告)号：US20190079028A1
公开(公告)日：2019-03-14
申请号：US15701301
申请日：2017-09-11
Applicant: The Boeing Company
Inventor： Gary Ernest Georgeson , Morteza Safai
IPC: G01N23/02 , G01N23/203
Abstract: A method, apparatus, and system for scanning an elongate structure. A scanner in a scanning system is moved axially along the elongate structure using a translating structure in the scanning system. The elongate structure is scanned axially using an x-ray beam emitted by the scanner as the scanner moves axially along the elongate structure to perform an axial scan. The x-ray beam has a first orientation. A location on the elongate structure having an inconsistency is detected while scanning the elongate structure axially. The elongate structure is scanned at the location with the x-ray beam in a second orientation.
-
公开(公告)号：US20180304549A1
公开(公告)日：2018-10-25
申请号：US15495925
申请日：2017-04-24
Applicant: The Boeing Company
Inventor： Morteza Safai , Gary E. Georgeson
IPC: B29C67/00
CPC classification number: B29C67/0088 , B33Y10/00 , B33Y30/00 , B33Y50/00 , B33Y80/00 , B82Y35/00 , B82Y40/00 , Y10S977/774 , Y10S977/892 , Y10S977/955 , Y10S977/956
Abstract: Various techniques are provided to utilize nanostructures for process monitoring and feedback control. In one example, a method includes forming a layer of material including nanostructures distributed therein. Each nanostructure includes a quantum dot and a shell encompassing the quantum dot. The shells and quantum dots are configured to emit a first and second wavelength, respectively, in response to an excitation signal. The method further includes applying the excitation signal to at least a portion of the layer of material. The method further includes detecting an emitted signal from the portion of the layer of material, where the emitted signal is provided by at least a subset of the nanostructures in response to the excitation signal. The method further includes determining whether a manufacturing characteristic has been satisfied based at least on a wavelength of the emitted signal. Related systems and products are also provided.
-
公开(公告)号：US09958145B2
公开(公告)日：2018-05-01
申请号：US15220194
申请日：2016-07-26
Applicant: The Boeing Company
Inventor： Keith D. Humfeld , Morteza Safai
CPC classification number: F21V23/02 , B60Q3/44 , B60Q3/47 , B64D2011/0038 , F21V21/0808 , F21Y2115/10 , H01B1/12
Abstract: A lighting device includes a light-emitting diode (LED). A first carbon nanotube (CNT) is coupled to and extends from the LED. A second CNT is coupled to and extends from the LED. The first and second CNTs are configured to generate a voltage difference across the LED when the first and second CNTs are exposed to an electromagnetic (EM) field having a frequency within a predetermined range. The LED is configured to emit light when the voltage difference is greater than or equal to a threshold voltage.
-
-
-
-
-
-
-
-
-
Search Results
267
records
(took 0.026 seconds)
