公开(公告)号：US20240169210A1

公开(公告)日：2024-05-23

申请号：US18510234

申请日：2023-11-15

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G06N3/09

CPC classification number: G06N3/09

Abstract: A test and measurement instrument includes a port to connect to a device under test (DUT) to receive waveform data, a connection to a machine learning network, and one or more processors configured to: receive one or more inputs about a three-dimensional (3D) tensor image; scale the waveform data to fit within the 3D tensor image; build the 3D tensor image; send the 3D tensor image to the machine learning network; and receive a predictive result from the machine learning network. A method includes receiving waveform data from one or more device under test (DUT), receiving one or more inputs about a three-dimensional (3D) tensor image, scaling the waveform data to fit within the 3D tensor image, building the 3D tensor image, sending the 3D tensor image to a pre-trained machine learning network, and receiving a predictive result from the machine learning network.

公开(公告)号：US20240126221A1

公开(公告)日：2024-04-18

申请号：US18482765

申请日：2023-10-06

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Mark Anderson Smith ,  Sunil Mahawar

IPC: G05B13/02

CPC classification number: G05B13/027

Abstract: A manufacturing system has a machine learning (ML) system having one or more neural networks and a configuration file associated with a trained neural network (NN), a structured data store having interfaces to the ML system a test automation application, a training store, a reference parameter store, a communications store, a trained model store, and one or more processors to control the data store to receive and store training data, allow the ML system to access the training data to train the one or more NNs, receive and store reference parameters and to access the reference parameters, receive and store prediction requests for optimal tuning parameters and associated data within the communication store, to provide requests to the ML system, allow the ML system to store trained NNs in the trained models store, and to recall a selected trained NN and provide the prediction to the test automation application.

公开(公告)号：US20230408558A1

公开(公告)日：2023-12-21

申请号：US18210583

申请日：2023-06-15

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R19/25 ,  G06N3/0442 ,  G06N3/045 ,  G06N3/08

CPC classification number: G01R19/2506 ,  G06N3/0442 ,  G06N3/045 ,  G06N3/08

Abstract: A test and measurement instrument has one or more ports configured to receive a signal one or more devices under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: acquire a waveform from the signal, derive a pattern waveform from the waveform, perform linear response extraction on the pattern waveform, present one or more data representations including a data representation of the extracted linear response to a machine learning system, and receive a prediction for a measurement from the machine learning system. A method of performing a measurement on a waveform includes acquiring the waveform at a test and measurement device, deriving a pattern waveform from the waveform, performing linear response extraction on the pattern waveform, presenting one or more data representations including a data representation of the extracted linear response to a machine learning system, and receiving a prediction of the measurement from the machine learning system.

公开(公告)号：US10432434B2

公开(公告)日：2019-10-01

申请号：US15617143

申请日：2017-06-08

Applicant: TEKTRONIX, INC.

Inventor： John J. Pickerd ,  Kan Tan ,  Pirooz Hojabri

IPC: H04L25/03 ,  H04B15/00 ,  G01R19/25 ,  G01R13/02 ,  H03M1/12

Abstract: Systems and methods directed towards reducing noise introduced into a signal when processing the signal are discussed herein. In embodiments a signal may initially be split by a multiplexer into two or more frequency bands. Each of the frequency bands can then be forwarded through an assigned channel. One or more channels may include an amplifier to independently boost the signal band assigned to that channel prior to a noise source within the assigned channel. This results in boosting the signal band relative to noise introduced by the noise source. In some embodiments, a filter may also be implemented in one or more of the channels to remove noise from the channel that is outside the bandwidth of the signal band assigned to that channel. Additional embodiments may be described and/or claimed herein.

公开(公告)号：US10345339B2

公开(公告)日：2019-07-09

申请号：US15143429

申请日：2016-04-29

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R13/02 ,  G01R19/25 ,  G01R23/175

Abstract: Embodiments of the present invention provide techniques and methods for improving signal-to-noise ratio (SNR) when averaging two or more data signals by finding a group delay between the signals and using it to calculate an averaged result. In one embodiment, a direct average of the signals is computed and phases are found for the direct average and each of the data signals. Phase differences are found between each signal and the direct average. The phase differences are then used to compensate the signals. Averaging the compensated signals provides a more accurate result than conventional averaging techniques. The disclosed techniques can be used for improving instrument accuracy while minimizing effects such as higher-frequency attenuation. For example, in one embodiment, the disclosed techniques may enable a real-time oscilloscope to take more accurate S parameter measurements.

公开(公告)号：US20190103999A1

公开(公告)日：2019-04-04

申请号：US16116677

申请日：2018-08-29

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Pirooz Hojabri

IPC: H04L25/03

Abstract: A continuously or step variable passive noise filter for removing noise from a signal received from a DUT added by a test and measurement instrument channel. The noise filter may include, for example, a splitter splits a signal into at least a first split signal and a second split signal. A first path receives the first split signal and includes a variable attenuator and/or a variable delay line which may be set based on the channel response of the DUT which is connected. The variable attenuator and/or the variable delay line may be continuously or stepped variable, as will be discussed in more detail below. A second path is also included to receive the second split signal and a combiner combines a signal from the first path and a signal from the second path into a combined signal.

公开(公告)号：US20180026816A1

公开(公告)日：2018-01-25

申请号：US15617143

申请日：2017-06-08

Applicant: TEKTRONIX, INC.

Inventor： John J. Pickerd ,  Kan Tan ,  Pirooz Hojabri

IPC: H04L25/03 ,  H04B15/00

CPC classification number: H04L25/03828 ,  G01R13/0218 ,  G01R19/25 ,  H04B15/00

Abstract: Systems and methods directed towards reducing noise introduced into a signal when processing the signal are discussed herein. In embodiments a signal may initially be split by a multiplexer into two or more frequency bands. Each of the frequency bands can then be forwarded through an assigned channel. One or more channels may include an amplifier to independently boost the signal band assigned to that channel prior to a noise source within the assigned channel. This results in boosting the signal band relative to noise introduced by the noise source. In some embodiments, a filter may also be implemented in one or more of the channels to remove noise from the channel that is outside the bandwidth of the signal band assigned to that channel. Additional embodiments may be described and/or claimed herein.

公开(公告)号：US20170292977A1

公开(公告)日：2017-10-12

申请号：US15476676

申请日：2017-03-31

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G01R13/02 ,  H03M1/06

CPC classification number: G01R13/0218 ,  G01R13/00 ,  G01R13/225 ,  H03H21/0012 ,  H03M1/0626 ,  H03M1/08

Abstract: Disclosed is a mechanism for reducing noise caused by an analog to digital conversion in a test and measurement system. An adaptive linear filter is generated based on a converted digital signal and measured signal noise. The adaptive linear filter includes a randomness suppression factor for alleviating statistical errors caused by a comparison of a signal circularity coefficient and a noise circularity coefficient in the adaptive linear filter. The adaptive linear filter is applied to the digital signal along with a stomp filter and a suppression clamp filter. The digital signal may be displayed in a complex frequency domain along with depictions of the adaptive linear filter frequency response and corresponding circularity coefficients. The display may be animated to allow a user to view the signal and/or filters in the frequency domain at different times.

公开(公告)号：US20160047842A1

公开(公告)日：2016-02-18

申请号：US14828790

申请日：2015-08-18

Applicant: Tektronix, Inc.

Inventor： Richard A. Booman ,  John J. Pickerd

IPC: G01R1/067

CPC classification number: G01R1/06766

Abstract: A signal acquisition probe stores compressed or compressed and filtered time domain data samples representing at least one of an impulse response or step response characterizing the signal acquisition probe. The compressed or compressed and filtered time domain data samples of the impulse response or the step response are provided to a signal measurement instrument for compensating the signal measurement instrument for the impulse or step response of the signal measurement instrument.

Abstract translation: 信号采集探针存储表示表征信号采集探针的脉冲响应或阶跃响应中的至少一个的压缩或压缩和经滤波的时域数据样本。 将脉冲响应或阶跃响应的压缩或压缩和经滤波的时域数据样本提供给用于补偿信号测量仪器用于信号测量仪器的脉冲或阶跃响应的信号测量仪器。

公开(公告)号：US20150212185A1

公开(公告)日：2015-07-30

申请号：US14164016

申请日：2014-01-24

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  William A. Hagerup ,  William Q. Law

IPC: G01R35/00 ,  G01R1/067

CPC classification number: G01R35/00 ,  G01R1/067 ,  G01R13/029 ,  G01R35/005

Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.

Abstract translation: 一种测试和测量系统，包括测试和测量仪器，连接到测试和测量仪器的探头，连接到探头的被测器件，至少一个存储器，被配置为存储用于表征探针的参数，用户界面和处理器 。 用户接口被配置为接收被测设备的标称源阻抗。 处理器被配置为从用户接口接收用于表征探针的参数和被测器件的标称源阻抗，并且使用用于表征探头的参数和来自用户界面的标称源阻抗来计算均衡滤波器 。