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公开(公告)号：US11002764B2
公开(公告)日：2021-05-11
申请号：US16788176
申请日：2020-02-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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公开(公告)号：US20240353449A1
公开(公告)日：2024-10-24
申请号：US18641307
申请日：2024-04-19
Applicant: Tektronix, Inc.
Inventor： Joshua J. O'Brien
IPC: G01R13/02
CPC classification number: G01R13/0254 , G01R13/029
Abstract: A test and measurement instrument includes an array of data pipes, in which each of the array of data pipes further includes an input coupled to an output of an interleaved Analog-to-Digital Converter (ADC), a hysteresis processor coupled to the input to receive a present pipe data value, and coupled to another hysteresis processor in the array of data pipes to receive a previous data value and a previous data direction, the hysteresis processor structured to perform a comparison of the present pipe data value to the previous data value to determine whether a magnitude of a difference between the present pipe data value and the previous data value exceeds a hysteresis value, and a pipeline trigger comparator. Methods are also described.
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公开(公告)号：US20240069094A1
公开(公告)日：2024-02-29
申请号：US18387810
申请日：2023-11-07
Applicant: Tektronix, Inc.
Inventor： Charles W. Case , Daniel G. Knierim , Joshua J. O'Brien , Josiah A. Bartlett , Julie A. Campbell
CPC classification number: G01R31/2886 , G01R29/26
Abstract: A test system includes a test and measurement device having an input port for receiving signals for testing or measuring, a reprogrammable test accessory having an output coupled to the input port of the test and measurement device. The reprogrammable test accessory includes a test port structured to accept one or more test signals from a Device Under Test (DUT), a processor, a reprogrammable data protocol analyzer for determining whether data carried by the one or more test signals from the DUT conform to a predetermined data protocol, and a reprogramming facility for modifying the reprogrammable data protocol analyzer from a first configuration to a second configuration. Methods of operation are also described.
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公开(公告)号：US11650225B2
公开(公告)日：2023-05-16
申请号：US17539160
申请日：2021-11-30
Applicant: Tektronix, Inc.
Inventor： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
CPC classification number: G01R1/025 , G01R13/0218
Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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Patent Agency Ranking
公开(公告)号：US20230055303A1
公开(公告)日：2023-02-23
申请号：US17891901
申请日：2022-08-19
Applicant: Tektronix, Inc.
Inventor： Joshua J. O'Brien , Jed H. Andrews
IPC: G01R13/02
Abstract: A test and measurement instrument includes an auxiliary trigger input port for receiving an auxiliary trigger signal, a digital trigger processor for generating a digital trigger signal from the auxiliary trigger signal, an analog trigger processor for generating an analog trigger signal from the auxiliary trigger signal, a user-configurable selector coupled to the digital trigger processor and to the analog trigger processor, the user-configurable selector configured to output either the digital trigger signal or the analog trigger signal as a selected trigger output signal of the instrument. Methods of creating parallel triggers are also described.
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公开(公告)号：US20220196701A1
公开(公告)日：2022-06-23
申请号：US17539160
申请日：2021-11-30
Applicant: Tektronix, Inc.
Inventor： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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公开(公告)号：US11187720B2
公开(公告)日：2021-11-30
申请号：US16622847
申请日：2018-06-18
Applicant: Tektronix, Inc.
Inventor： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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公开(公告)号：US11181552B2
公开(公告)日：2021-11-23
申请号：US16695795
申请日：2019-11-26
Applicant: Tektronix, Inc.
Inventor： Joshua J. O'Brien , Brian S. Mantel
Abstract: A method of classifying waveform data includes receiving input waveform data at a test and measurement system, accessing a repository of reference waveform data and corresponding classes, analyzing the input waveform data and the reference waveform data to designate a class of the input waveform data, and using the class designation to provide information to a user. A test and measurement system has a user interface, at least one input port, a communications port, a processor, the processor configured to execute instructions causing the processor to: receive input waveform data through at least one of the input port or the user interface; access a repository of reference waveform data; analyze the input waveform data using the reference waveform data; designate a class of the input waveform data; and use the class to provide information to the user about the input waveform.
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公开(公告)号：US20210263076A1
公开(公告)日：2021-08-26
申请号：US17317841
申请日：2021-05-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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