摘要:
An entry detection device includes first light marks and second light marks. A control signal corresponding to a part of the first light marks is an error detection code of the control signal corresponding to the other part of the first light marks. A first inspection value is generated based on a first part of a light receiving signal corresponding to the other part of the first light marks. A second inspection value is generated based on a reverse bit string of a third part of the light receiving signal corresponding to a part of the second light mark paired with the other part of the first light marks. An entry is detected based on the first inspection value and the second inspection value.
摘要:
A computer executable three-dimensional device simulation program product for the purpose of making a three-dimensional device simulation system which generates a three-dimensional model of a device by using a mask data performing the procedures of inputting cross-sectional feature information indicating a cross-sectional feature of an edge part of a mask, and calculating the three-dimensional model based on the mask data and input cross-sectional feature information, thereby enabling an easy generation of a complex three-dimensional feature by using pattern forming-use mask data when generating a three-dimensional feature model of a minute device.
摘要:
Interference checking device including: a modeling database that stores data for three-dimensional modeling of tools, workpieces, and machine-tool constituting structures; an interference data memory for storing interference data defining inter-component interference relationships among the tool, the workpiece, and the structures; and an interference checking processor that, based on structure movement commands sent from a program analyzer for the machine tool, and on data stored in the modeling database and interference data memory, determines whether the tool, the workpiece, and the structures will interfere with each other. Movement commands in a block at least one block succeeding the block being executed in order to control the drive mechanisms that move the structures are sent from the program analyzer to the interference checking processor.
摘要:
Disclosed are Array Element Mesh Systems (AEMSs) using configurable robotic surface(s) to “sample” 3D objects. Methods are disclosed for implementing “Array Element” components on flexible “interconnector substrate(s)”. Methods are disclosed, using Array Elements like “building blocks” to construct AEMSs. AEMSs sample, playback, and/or replicate 3D objects and/or 3d sequences. “Learning Mode” occurs when an AEMS spatially conforms to an object and acquires “3D shape data” to store it in memory. Optionally, acquired 3D shape data is displayed graphically. “Learning Mode” collects “shape data” representing sampled objects. In Playback Mode”, stored 3D shape data (e.g. a 3D-CAD image) is accessed and sent to movable joint position actuators, to move individual Array Elements to “playback” shape(s) of learned object(s), allowing designers to see “draft(s)” of designs, prior to prototyping. In “Replication Mode”, an AEMS “replicates” learned 3D shapes, to produce a “replication” using similar material(s) and/or functionality as sampled 3D objects.
摘要:
An injection mold design system for correcting a profile of a product to be fabricated into a releasable profile from a mold to design an injection mold based on a corrected product shape, comprising storing information of product shape and mold profile, displaying the product shape or the mold profile on a screen based on the information read from the storing, inputting designation information necessary for correction of the product shape or the mold profile, and unloading information of lines or planes being obstructive to correction of the product shape and the mold profile into the storing in response to the designation information input removing the lines or the planes from the screen, and replotting the line or the planes on the screen in terms of the information of lines or planes unloaded into the storing after the correction operation of the product shape or the mold profile is completed.
摘要:
A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine (CMM), including a user interface that comprises a workpiece inspection program simulation portion configurable to display a 3-D view of a workpiece; an editing user interface portion comprising an editable plan representation of a current workpiece feature inspection plan for the workpiece; and an editable alignment program plan representation for the workpiece. The system is configured with the editable alignment program plan representation being automatically responsive to editing operations, regardless of whether the editing operations are performed in the 3-D view or the editable plan representation. The editing operations include deleting or adding at least one workpiece feature to or from the editable alignment program plan representation.
摘要:
An automatic programming device includes: a machining-area-shape generation unit that generates machining-area shape data that is a machining area shape machined on the basis of machining-area data; and a chamfering tool-path generation unit that, when the machining area shape is a chamfering target part, generates chamfering tool-path data for chamfering according to chamfering data including the machining-area shape data, data on tool-to-be-used, and data on machining condition. When performing chamfering on a boundary of the shaped raw material and the machining area shape defined on a curved surface that is a shaped raw material, the chamfering tool-path generation unit generates a machining path, as the chamfering tool-path data, for realizing chamfering by using 2-axis machining of a rotating axis parallel to a central axis of the shaped raw material and with a linear axis parallel to a bottom surface of the machining area shape.
摘要:
An entry detection device includes first light marks and second light marks. A control signal corresponding to a part of the first light marks is an error detection code of the control signal corresponding to the other part of the first light marks. A first inspection value is generated based on a first part of a light receiving signal corresponding to the other part of the first light marks. A second inspection value is generated based on a reverse bit string of a third part of the light receiving signal corresponding to a part of the second light mark paired with the other part of the first light marks. An entry is detected based on the first inspection value and the second inspection value.
摘要:
In order to reduce the amount of computation required for ray tracing and facilitate simulating of changes in workpiece shape even on an inexpensive, low-performance computer, a device for displaying a cutting simulation includes: a rendered workpiece image update section for updating by ray tracing a portion of a rendered workpiece image buffer and a rendered workpiece depth buffer, the portion being associated with a rendering region corresponding to a change in the shape of the workpiece; a rendered tool image creation section for rendering a tool image by ray tracing for the current tool rendering region; and an image transfer section for transferring a partial image of the previous tool rendering region and the current workpiece rendering region to be updated from the rendered workpiece image buffer to a display frame buffer as well as transferring the current tool rendering image to the display frame buffer.
摘要:
An entry detection device includes first light marks and second light marks. A control signal corresponding to a part of the first light marks is an error detection code of the control signal corresponding to the other part of the first light marks. A first inspection value is generated based on a first part of a light receiving signal corresponding to the other part of the first light marks. A second inspection value is generated based on a reverse bit string of a third part of the light receiving signal corresponding to a part of the second light mark paired with the other part of the first light marks. An entry is detected based on the first inspection value and the second inspection value.