Data processor and data processing method for wavemeter
    341.
    发明授权
    Data processor and data processing method for wavemeter 失效
    数据处理器和数据处理方法

    公开(公告)号:US06690977B1

    公开(公告)日:2004-02-10

    申请号:US09677099

    申请日:2000-09-29

    CPC classification number: G01J3/45 G01J9/02

    Abstract: A DSP#B 6 executes, prior to data conversion, interpolation (see FIG. 2) in order to interpolate discrete spectra obtained via the FFT processing by a DSP#A 5. In the interpolation, the DSP#B 6 executes two-point interpolation if the difference between two discrete spectrum data pieces F(j) and F(j+1) is greater than a predetermined threshold &egr; and four-point interpolation if the difference is smaller than &egr;.

    Abstract translation: 在数据转换之前,DSP#B6执行内插(参见图2),以便内插通过DSP#A5经由FFT处理获得的离散频谱。在内插中,DSP#B6执行两点 如果两个离散的频谱数据片段F(j)和F(j + 1)之间的差值大于预定的阈值ε,并且如果差值小于ε,则进行四点插值。

    Fourier analysis method and apparatus calculating the Fourier factor Wn utilizing trigonometric relations
    342.
    发明授权
    Fourier analysis method and apparatus calculating the Fourier factor Wn utilizing trigonometric relations 失效
    傅里叶分析方法和装置利用三角关系计算傅里叶因子Wn

    公开(公告)号:US06665697B1

    公开(公告)日:2003-12-16

    申请号:US09605061

    申请日:2000-06-28

    Applicant: Stefan Wiese

    Inventor: Stefan Wiese

    CPC classification number: G01J3/45 G01R33/4625

    Abstract: The data carrying signals to be synthesized into an image, to be subject to data compression can be subjected to Fourier transformation by the formation of a Fourier factor WN which is a function of a trigonometric factor &Dgr;C1 utilizing a factor II defined by the relationship: &Dgr;c1=cos x−1=−2 sin2 (x/2) where x=2&pgr;/N and N=number of data points.

    Abstract translation: 要被合成为要进行数据压缩的图像的信号的数据可以通过利用由以下关系定义的因子II形成作为三角因子ΔC1的函数的傅里叶因子WN进行傅里叶变换:其中 x = 2pi / N,N =数据点数。

    Compact transform spectrometer based on sampling a standing wave

    公开(公告)号:US06618150B2

    公开(公告)日:2003-09-09

    申请号:US09932457

    申请日:2001-08-16

    CPC classification number: G01J3/4532 G01J3/45

    Abstract: A spectrometer for determining a spectrum of a light by using a mirror to reflect the light so that the light forms an intensity standing wave pattern through superposition of an incident portion of the light and a reflected portion of the light. The spectrometer is equipped with an intensity detector whose thickness is less than a shortest wavelength of the light being examined and which is semitransparent over the spectrum. The spectrometer has a mechanism to provide relative movement between the mirror and the intensity detector such that the intensity detector registers a variation of the intensity standing wave pattern. An analyzer, such as a Fourier transform analyzer, is employed to determine the spectrum of the light from that variation of the intensity standing wave pattern.

    Method of acquiring data from multi-element detector in infrared imaging apparatus
    344.
    发明申请
    Method of acquiring data from multi-element detector in infrared imaging apparatus 有权
    红外成像装置中多元素检测器采集数据的方法

    公开(公告)号:US20030146386A1

    公开(公告)日:2003-08-07

    申请号:US10355295

    申请日:2003-01-31

    CPC classification number: G01J3/45

    Abstract: It is an object of the present invention to provide a method capable of acquiring data at a high speed while holding proper precision in measurement in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of starting to scan a element of the said multi-element detector synchronously with a sampling signal (12) based on a reference signal (10) of an interferometer, scanning the element at a higher frequency than a sampling frequency of the sampling signal (12), completing the scanning of all the elements before a next sampling signal to the sampling signal starting the element scanning is generated, and repeating a series of operations every time the sampling signal is generated.

    Abstract translation: 本发明的一个目的是提供一种能够在保持适当的测量精度的同时以高速度获取数据的红外成像装置中的方法,所述红外成像装置包括用于通过多元件检测器检测信号的连续扫描类型的FTIR装置 。 一种从红外成像设备中的多元件检测器获取数据的方法,包括以下步骤:基于参考信号(10)开始与采样信号(12)同步地扫描所述多元素检测器的元件, 干涉仪以比采样信号(12)的采样频率更高的频率扫描元件,完成对开始元素扫描的采样信号的下一个采样信号之前的所有元素的扫描,并且重复一系列操作 每次产生采样信号。

    Method and apparatus for beam directing
    346.
    发明授权
    Method and apparatus for beam directing 失效
    射束方向和装置

    公开(公告)号:US06493094B2

    公开(公告)日:2002-12-10

    申请号:US09813224

    申请日:2001-03-20

    CPC classification number: G01J3/45 G01J3/4535 G01J9/02

    Abstract: Focusing means to focus a beam upon a reflective-transmissive surface. Reflecting means to reflect a central portion of the beam from the reflective-transmissive surface. Transmitting means to transmit a portion of the beam that lies outside the central portion. Receiving means to receive the transmitted portion of the beam and combining means to combine the reflected central portion of the beam with a test beam to generate an interference pattern.

    Abstract translation: 聚焦装置将光束聚焦在反射透射表面上。 反射装置用于从反射透射表面反射光束的中心部分。 用于传输位于中心部分之外的梁的一部分的传输装置。 接收装置,用于接收光束的发送部分和组合装置,以将光束的反射中心部分与测试光束组合以产生干涉图案。

    High throughput optical scanner
    347.
    发明授权
    High throughput optical scanner 失效
    高通量光学扫描仪

    公开(公告)号:US06384951B1

    公开(公告)日:2002-05-07

    申请号:US09551088

    申请日:2000-04-18

    CPC classification number: G01J3/443 G01J3/45 G06K7/10801

    Abstract: A scanning apparatus is provided to obtain automated, rapid and sensitive scanning of substrate fluorescence, optical density or phosphorescence. The scanner uses a constant path length optical train, which enables the combination of a moving beam for high speed scanning with phase-sensitive detection for noise reduction, comprising a light source, a scanning mirror to receive light from the light source and sweep it across a steering mirror, a steering mirror to receive light from the scanning mirror and reflect it to the substrate, whereby it is swept across the substrate along a scan arc, and a photodetector to receive emitted or scattered light from the substrate, wherein the optical path length from the light source to the photodetector is substantially constant throughout the sweep across the substrate. The optical train can further include a waveguide or mirror to collect emitted or scattered light from the substrate and direct it to the photodetector. For phase-sensitive detection the light source is intensity modulated and the detector is connected to phase-sensitive detection electronics. A scanner using a substrate translator is also provided. For two dimensional imaging the substrate is translated in one dimension while the scanning mirror scans the beam in a second dimension. For a high throughput scanner, stacks of substrates are loaded onto a conveyor belt from a tray feeder.

    Abstract translation: 提供扫描装置以获得对衬底荧光,光密度或磷光的自动,快速和灵敏的扫描。 扫描仪使用恒定路径长度的光学列车,其使得用于高速扫描的移动光束与用于降噪的相敏检测的组合包括光源,扫描镜以接收来自光源的光并扫过它 转向镜,转向镜,用于接收来自扫描反射镜的光,并将其反射到基板上,由此沿着扫描弧扫过基板;以及光电检测器,用于接收来自基板的发射或散射的光,其中光路 在整个扫描过程中,从光源到光电检测器的长度基本恒定。 光学系统还可以包括波导或反射镜以收集来自基板的发射或散射的光并将其引导到光电检测器。 对于相敏检测,光源进行强度调制,检测器连接到相敏检测电路。 还提供了使用基板转换器的扫描仪。 对于二维成像,衬底在一个维度上被平移,而扫描镜在第二维度上扫描光束。 对于高通量扫描仪,将一堆基板从托盘进料器装载到传送带上。

    Diamond anvil spectroscope
    348.
    发明授权
    Diamond anvil spectroscope 有权
    钻石砧分析仪

    公开(公告)号:US6128075A

    公开(公告)日:2000-10-03

    申请号:US277533

    申请日:1999-03-26

    Abstract: A stage for an infrared spectroscope has a focusing body and a sampling element spaced apart by a mounting fixture. The focusing body and sampling element optically cooperate by transmission and internal refraction and reflection to focus an infrared beam on a sample surface and to collect the beam for analysis after it was reflected from the sample surface. The sampling element is made of a durable material and can be removably mounted in the fixture.

    Abstract translation: 用于红外分光镜的平台具有聚焦体和通过安装夹具间隔开的采样元件。 聚焦体和采样元件通过透射和内部折射和反射进行光学协调,将红外光束聚焦在样品表面上,并在从样品表面反射之后收集光束进行分析。 采样元件由耐用材料制成,并且可拆卸地安装在固定装置中。

    Spectral imaging apparatus and methodology

    公开(公告)号:US6108082A

    公开(公告)日:2000-08-22

    申请号:US316511

    申请日:1999-05-21

    CPC classification number: G01J3/2823 G01J3/45 G01J2003/2866

    Abstract: A method and apparatus for an improved spectral imaging system is provided. The system is capable of measuring the fluorescence, luminescence, or absorption at selected locations on a sample plate. The emissions detection subassembly can tune to any wavelength within a continuum of wavelengths utilizing an interferometric spectral discriminator. The interferometric spectral discriminator creates an interferogram from which the wavelength spectra for each pixel of the array can be calculated, typically using Fourier transform analysis. In one aspect, the chromatic accuracy of the system is calibrated using a calibration slit placed in the input aperture of the input relay lens but outside of the sample image. The slit is illuminated using a source of known wavelength. The fringe count versus the wavelength of the slit illumination source is monitored and used to calibrate the spectral discriminator. In another aspect, a transparent optic is included in the interferometric spectral discriminator that can be inserted into the beam path whenever a monochrome image of the sample is required. The optic produces a large offset in the legs of the interferometer resulting in the fringe density becoming too large to resolve by the individual pixels of the detector array. In another aspect, the interferometric spectral discriminator includes a polarizing beam splitter. The polarizing beam splitter preferentially reflects one polarization while preferentially transmitting a second polarization, thus achieving improved efficiency while minimizing ghosting. In another aspect, a metaphase finder is used to locate areas of interest. The sample plate containing the material of interest is illuminated with light of a wavelength determined to preferentially scatter from objects the size of the metaphase spreads. The intensity of the scattered light versus the location on the sample plate is monitored and used to locate the areas of interest. Preferably the sample plate is also illuminated by light of a second wavelength which is not preferentially scattered by the objects of interest, thus representing the background scatter. By subtracting the background scatter from the primary scattered light, improved object discrimination is achieved.

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