Abstract:
A transistor device having a strained channel and a method for forming the transistor device are disclosed. The transistor device includes a semiconductor region having a top surface. The transistor device includes a source region, a drain region, and a channel region in the semiconductor region. The channel region is between the source region and the drain region. The transistor device includes an oxide region within the channel region and a gate overlying the channel region. The oxide region is laterally spaced from the source and drain regions. The transistor device includes a gate dielectric between the gate and the channel region.
Abstract:
A horizontal surrounding gate MOSFET comprises a monolithic structure formed in an upper silicon layer of a semiconductor substrate which is essentially a silicon-on-insulator (SOI) wafer, the monolithic structure comprising a source and drain portion oppositely disposed on either end of a cylindrical channel region longitudinally disposed between the source and drain. The channel is covered with a gate dielectric and an annular gate electrode is formed circumferentially covering the channel.
Abstract:
A flat panel display includes a plurality of parallel row select lines and a plurality of column drive lines, with the row select lines and the column drive lines intersecting to define a matrix of pixel locations. Signals are provided to contact pads located on the periphery of the display and the signals flow over the row select lines and the column drive lines to thin film transistors located adjacent a pixel electrode at each of the pixel locations. The signals provided to each thin film transistor cause the transistor to charge a corresponding pixel electrode to control a pixel of the display. ESD protection for the display comprises a guard ring adjacent the contact pads. Capacitively coupled field effect transistors (CCFETs) connect the row select lines to the guard ring and connect the column drive lines to the guard ring. A CCFET is formed as a thin film transistor and typically has a floating gate capacitively coupled to the drain and source of the thin film transistor.
Abstract:
A rotary type swingable sprayer comprising a fixing tube head, a rotatable tube head, and a nozzle tube. The rotatable tube head is installed atop the fixing tube head, and the nozzle tube is installed atop the rotatable tube head. The lower end of the fixing tube head is connected with a water tube for guiding water. When water flows through the rotatable tube head, the rotatable tube head will swing nearly a full cycle repeatedly so as to drive the nozzle tube above to swing repeatedly. Thus, water is jetted out from the distal end of the nozzle tube. Therefore, water is sprayed out nearly through a full cycle in the whole area.
Abstract:
The present invention relates to a method of forming a self-aligned contact (SAC) window employing the liquid phase deposition (LPD) that allows low temperature deposition and selective growing of a LPD-SiO.sub.2 film as a stress-buffer layer to prevent WSi peeling during the formation of the SAC window. Specifically, the method comprises the steps of forming a nitride cap and a gate consisting of a WSi layer and a polysilicon layer over a surface of a silicon substrate followed by the formation of the sources and drain regions on the silicon substrate as well as by the process of forming the LPD-SiO.sub.2 film. A nitride spacer is formed at a sidewall of the nitride cap and the gate, and the SAC window is then formed by depositing a dielectric layer such as a SiO.sub.2 layer followed by exposing through a mask.
Abstract:
A threshold circuit that uses capacitors to form a weighted sum of its inputs uses a two stage capacitor structure. The two stages form a compact structure that increases the number of input signals that can be handled and increases the flexibility in assigning the weights to the input signals. Capacitor electrodes for the input signals are arranged in two sets and the electrodes of each set are electrostatically coupled to first and second electrodes. Third and fourth electrodes, which extend from the first and second electrodes respectively, are electrostatically coupled to a unitary structure of fifth and sixth electrodes where their voltages are summed. The fifth and sixth electrodes are conductively connected to the gate of an FET threshold circuit that responds to the weighted and summed input signals.
Abstract:
A method of fabricating a bipolar transistor with a buried subcollector by forming a collector layer and a base layer in a semiconductor substrate. A polysilicon layer is deposited over the base layer and spaced emitter and base contact regions formed in the base layer. A mask is formed over the emitter and base contact regions and the substrate anisotropically etched to form pedestals with vertical sidewalls. A masking layer is formed on the vertical sidewalls, and a large angle ion implant used to introduce ions beneath the collector layer, thereby forming a subcollector region.
Abstract:
An integrated circuit includes a first diffusion area for a first type transistor. The first type transistor includes a first drain region and a first source region. A second diffusion area for a second type transistor is separated from the first diffusion area. The second type transistor includes a second drain region and a second source region. A gate electrode continuously extends across the first diffusion area and the second diffusion area in a routing direction. A first metallic structure is electrically coupled with the first source region. A second metallic structure is electrically coupled with the second drain region. A third metallic structure is disposed over and electrically coupled with the first and second metallic structures. A width of the first metallic structure is substantially equal to or larger than a width of the third metallic structure.
Abstract:
A method to reduce the inverse narrow width effect in NMOS transistors is described. An oxide liner is deposited in a shallow trench that is formed to isolate active areas in a substrate. A photoresist plug is formed in the shallow trench and is recessed below the top of the substrate to expose the top portion of the oxide liner. An angled indium implant through the oxide liner into the substrate is then performed. The plug is removed and an insulator is deposited to fill the trenches. After planarization and wet etch steps, formation of a gate dielectric layer and a patterned gate layer, the NMOS transistor exhibits an improved Vt roll-off of 40 to 45 mVolts for both long and short channels. The improvement is achieved with no degradation in junction or isolation performance. The indium implant dose and angle may be varied to provide flexibility to the process.
Abstract:
A pulse width modulation device with a power saving mode controlled by an output voltage feedback hysteresis circuit is used in a power supply. The present invention comprises a hysteresis comparison circuit extracting a feedback voltage, a high threshold voltage and a low threshold voltage, and the voltages are executed by a comparison and hysteresis operation to a output blanking signal, a PWM control unit extracting a detecting current signal and the feedback voltage to output a modulation signal after a comparison operation is executed; an OR gate circuit connected to the hysteresis comparison circuit and the PWM control unit for receiving the blanking signal and the modulation signal to output a reset signal; and a synchronization signal output unit connected to the OR gate circuit for receiving the reset signal and an oscillation signal to output the drive signal.