LPP EUV plasma source material target delivery system
    32.
    发明授权
    LPP EUV plasma source material target delivery system 失效
    LPP EUV等离子体源材料目标传送系统

    公开(公告)号:US07589337B2

    公开(公告)日:2009-09-15

    申请号:US12075631

    申请日:2008-03-12

    IPC分类号: A61N5/06 G01J3/10 H05G2/00

    CPC分类号: H05G2/001

    摘要: An EUV light generation system and method is disclosed that may comprise a droplet generator producing plasma source material target droplets traveling toward the vicinity of a plasma source material target irradiation site; a drive laser; a drive laser focusing optical element having a first range of operating center wavelengths; a droplet detection radiation source having a second range of operating center wavelengths; a drive laser steering element comprising a material that is highly reflective within at least some part of the first range of wavelengths and highly transmissive within at least some part of the second range of center wavelengths; a droplet detection radiation aiming mechanism directing the droplet detection radiation through the drive laser steering element and the lens to focus at a selected droplet detection position intermediate the droplet generator and the irradiation site.

    摘要翻译: 公开了一种EUV发光系统和方法,其可以包括产生等离子体源材料的液滴发生器,目标液滴朝向等离子体源材料目标照射位置附近行进; 驱动激光器 具有第一操作中心波长范围的驱动激光聚焦光学元件; 具有第二操作中心波长范围的液滴检测辐射源; 驱动激光操纵元件,其包括在第一波长范围的至少一部分内具有高度反射性的材料,并且在第二中心波长范围的至少一部分内具有高度透射性的材料; 液滴检测辐射瞄准机构,其引导液滴检测辐射通过驱动激光转向元件和透镜,以聚焦在液滴发生器和照射部位之间的选定液滴检测位置。

    System managing gas flow between chambers of an extreme ultraviolet (EUV) photolithography apparatus
    34.
    发明申请
    System managing gas flow between chambers of an extreme ultraviolet (EUV) photolithography apparatus 有权
    系统管理极紫外(EUV)光刻设备的腔室之间的气流

    公开(公告)号:US20090154642A1

    公开(公告)日:2009-06-18

    申请号:US12002073

    申请日:2007-12-14

    IPC分类号: G21K5/00

    摘要: A gas flow management system may comprise a first and second enclosing walls at least partially surrounding first and second respective spaces; a system generating plasma in the first space, the plasma emitting extreme ultraviolet light; an elongated body restricting flow from the first space to the second space, the body at least partially surrounding a passageway and having a first open end allowing EUV light to enter the passageway from the first space and a second open end allowing EUV light to exit the passageway into the second space, the body shaped to establish a location having a reduced cross-sectional area relative to the first and second ends; and a flow of gas exiting an aperture, the aperture positioned to introduce gas into the passageway at a position between the first end of the body and the location having a reduced cross-sectional area.

    摘要翻译: 气体流量管理系统可以包括至少部分地围绕第一和第二相应空间的第一和第二封闭壁; 在第一空间中产生等离子体的系统,等离子体发射极紫外光; 限制从第一空间流到第二空间的细长体,所述主体至少部分地围绕通道并且具有允许EUV光从第一空间进入通道的第一开口端,以及允许EUV光从第二空间退出的第二开口端 通道进入第二空间,身体形状以建立相对于第一和第二端具有减小的横截面面积的位置; 以及离开孔的气流,所述孔定位成在主体的第一端和具有减小的横截面积的位置之间的位置处将气体引入通道。

    LPP EUV light source drive laser system
    35.
    发明授权
    LPP EUV light source drive laser system 有权
    LPP EUV光源驱动激光系统

    公开(公告)号:US07482609B2

    公开(公告)日:2009-01-27

    申请号:US11217161

    申请日:2005-08-31

    IPC分类号: G01J1/00

    CPC分类号: H05G2/003 H05G2/005 H05G2/008

    摘要: An apparatus and method is disclosed which may comprise a laser produced plasma EUV system which may comprise a drive laser producing a drive laser beam; a drive laser beam first path having a first axis; a drive laser redirecting mechanism transferring the drive laser beam from the first path to a second path, the second path having a second axis; an EUV collector optical element having a centrally located aperture; and a focusing mirror in the second path and positioned within the aperture and focusing the drive laser beam onto a plasma initiation site located along the second axis. The apparatus and method may comprise the drive laser beam is produced by a drive laser having a wavelength such that focusing on an EUV target droplet of less than about 100 μm at an effective plasma producing energy if not practical in the constraints of the geometries involved utilizing a focusing lens. The drive laser may comprise a CO2 laser. The drive laser redirecting mechanism may comprise a mirror.

    摘要翻译: 公开了一种可以包括激光产生等离子体EUV系统的装置和方法,其可以包括产生驱动激光束的驱动激光器; 具有第一轴的驱动激光束第一路径; 驱动激光重定向机构,其将所述驱动激光束从所述第一路径传递到第二路径,所述第二路径具有第二轴线; 具有中心定位的孔的EUV收集器光学元件; 以及在第二路径中的聚焦反射镜并且定位在孔内并将驱动激光束聚焦到沿着第二轴线定位的等离子体起始位置。 该装置和方法可以包括驱动激光束由具有波长的驱动激光器产生,该激光器具有在有效等离子体产生能量的情况下聚焦在小于约100mum的EUV目标液滴上,如果在所涉及的几何形状的约束条件下 聚焦镜头。 驱动激光器可以包括CO2激光器。 驱动激光重定向机构可以包括镜子。

    Source material collection unit for a laser produced plasma EUV light source
    36.
    发明授权
    Source material collection unit for a laser produced plasma EUV light source 失效
    用于激光产生等离子体EUV光源的源材料收集单元

    公开(公告)号:US07476886B2

    公开(公告)日:2009-01-13

    申请号:US11509925

    申请日:2006-08-25

    IPC分类号: H01J35/20

    CPC分类号: H05G2/003 H05G2/005 H05G2/008

    摘要: An EUV light source is disclosed which may comprise a laser source generating a laser beam and a source material, e.g. tin, SnBr4, SnBr2, SnH4, tin-gallium alloys, tin-indium alloys, tin-indium-gallium alloys or combinations thereof, that is irradiated by the laser beam to form a plasma and emit EUV light. The EUV light source may also comprise a beam dump positioned to receive the laser beam and a system controlling the temperature of the beam dump within a pre-selected range. In one embodiment, the source material may be irradiated at an irradiation zone and the source may further comprises a receiving structure formed with a surface shaped to receive source material ejected from the irradiation zone and direct the received source material for subsequent collection. The receiving structure and the beam dump may be formed as a single integrated unit.

    摘要翻译: 公开了一种EUV光源,其可以包括产生激光束和源材料的激光源,例如, 锡,SnBr4,SnBr2,SnH4,锡 - 镓合金,锡 - 铟合金,锡铟镓合金或其组合,由激光束照射以形成等离子体并发射EUV光。 EUV光源还可以包括定位成接收激光束的光束倾倒装置和控制在预选范围内的光束转储器的温度的系统。 在一个实施例中,源材料可以在照射区域照射,并且源可以进一步包括形成有表面的接收结构,该表面被成形为接收从照射区域喷出的源材料并引导接收的源材料用于随后的收集。 接收结构和光束转储可以形成为单个集成单元。

    Alternative fuels for EUV light source
    37.
    发明授权
    Alternative fuels for EUV light source 失效
    EUV光源的替代燃料

    公开(公告)号:US07465946B2

    公开(公告)日:2008-12-16

    申请号:US11406216

    申请日:2006-04-17

    IPC分类号: A61N5/06 G01J3/10 H05G2/00

    摘要: An EUV light source is disclosed which may comprise at least one optical element having a surface, such as a multi-layer collector mirror; a laser source generating a laser beam; and a source material irradiated by the laser beam to form a plasma and emit EUV light. In one aspect, the source material may consist essentially of a tin compound and may generate tin debris by plasma formation which deposits on the optical element and, in addition, the tin compound may include an element that is effective in etching deposited tin from the optical element surface. Tin compounds may include SnBr4, SnBr2 and SnH4. In another aspect, an EUV light source may comprise a molten source material irradiated by a laser beam to form a plasma and emit EUV light, the source material comprising tin and at least one other metal, for example tin with Gallium and/or Indium.

    摘要翻译: 公开了一种EUV光源,其可以包括具有表面的至少一个光学元件,例如多层收集镜; 产生激光束的激光源; 以及由激光束照射以形成等离子体并发射EUV光的源材料。 在一个方面,源材料可以基本上由锡化合物组成,并且可以通过沉积在光学元件上的等离子体形成而产生锡屑,此外,锡化合物可以包括有效地从光学蚀刻沉积的锡的元素 元素表面。 锡化合物可以包括SnBr4,SnBr2和SnH4。 另一方面,EUV光源可以包括由激光束照射以形成等离子体并发射EUV光的熔融源材料,源材料包含锡和至少一种其它金属,例如锡与镓和/或铟。

    Systems for protecting internal components of an EUV light source from plasma-generated debris
    38.
    发明授权
    Systems for protecting internal components of an EUV light source from plasma-generated debris 有权
    用于保护EUV光源的内部部件免受等离子体产生的碎片的系统

    公开(公告)号:US07109503B1

    公开(公告)日:2006-09-19

    申请号:US11067099

    申请日:2005-02-25

    IPC分类号: G01J1/00

    摘要: Systems and methods are disclosed for protecting an EUV light source plasma production chamber optical element surface from debris generated by plasma formation. In one aspect of an embodiment of the present invention, a shield is disclosed which comprises at least one hollow tube positioned between the optical element and a plasma formation site. The tube is oriented to capture debris while allowing light to pass through the tube's lumen via reflection at relatively small angles of grazing incidence. In another aspect of an embodiment of the present invention, a shield is disclosed which is heated to a temperature sufficient to remove one or more species of debris material that has deposited on the shield. In yet another aspect of an embodiment of the present invention, a system is disclosed which a shield is moved from a light source plasma chamber to a cleaning chamber where the shield is cleaned.

    摘要翻译: 公开了用于保护EUV光源等离子体生产室光学元件表面免受等离子体形成产生的碎片的系统和方法。 在本发明的实施例的一个方面,公开了一种屏蔽件,其包括位于光学元件和等离子体形成部位之间的至少一个中空管。 管被定向以捕获碎片,同时允许光以相对较小的掠入射角度的反射通过管的内腔。 在本发明的一个实施例的另一方面,公开了一种屏蔽件,其被加热到足以去除沉积在屏蔽上的一种或多种碎屑材料的温度。 在本发明的一个实施例的另一方面,公开了一种系统,其将屏蔽件从光源等离子体室移动到清洁室,其中屏蔽件被清洁。

    Debris protection system having a magnetic field for an EUV light source
    39.
    发明授权
    Debris protection system having a magnetic field for an EUV light source 有权
    具有用于EUV光源的磁场的碎片保护系统

    公开(公告)号:US08519366B2

    公开(公告)日:2013-08-27

    申请号:US12221822

    申请日:2008-08-06

    IPC分类号: H05G2/00

    摘要: Devices are disclosed herein which may comprise a vessel; a material disposed in the vessel for creating an EUV light emitting plasma at a plasma site, the plasma generating debris; a near normal incidence EUV reflective optic disposed in the vessel; and a source of a magnetic field for deflecting debris in the vessel to protect the optic, the source positioned to interpose the optic between the source and the plasma site.

    摘要翻译: 本文公开的装置可以包括容器; 设置在容器中的用于在等离子体位置处产生EUV发光等离子体的材料,等离子体产生碎片; 设置在容器中的近似正常入射的EUV反射光学器件; 以及用于偏转容器中的碎屑以保护光学元件的磁场源,所述源被定位成将光学元件插入在源和等离子体位置之间。

    LPP EUV Light Source Drive Laser System
    40.
    发明申请
    LPP EUV Light Source Drive Laser System 有权
    LPP EUV光源驱动激光系统

    公开(公告)号:US20110192995A1

    公开(公告)日:2011-08-11

    申请号:US13087207

    申请日:2011-04-14

    IPC分类号: H05G2/00

    CPC分类号: H05G2/003 H05G2/008

    摘要: An apparatus and method is disclosed which includes or employs an EUV light source comprising a laser device outputting a laser beam, a beam delivery system directing the laser beam to an irradiation site, and a material for interaction with the laser beam at the irradiation site to create an EUV light emitting plasma for use in processing substrates.

    摘要翻译: 公开了一种装置和方法,其包括或使用包括输出激光束的激光装置的EUV光源,将激光束引导到照射部位的光束传递系统,以及用于在照射部位与激光束相互作用的材料 创建用于处理衬底的EUV发光等离子体。