Abstract:
An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated.
Abstract:
A scanning microscope (1) and a scanning method are disclosed. The scanning microscope (1) has, arranged in the illuminating light beam path (3), an outcoupling element (60) that couples out at least a fraction of the illuminating light beam (3) and directs it to a detector (61) that detects the pulse frequency of the light source that generates the illuminating light beam; and the pulse frequency serves as a basic clock frequency for the scanner.
Abstract:
A method and an apparatus for point-by-point scanning of a specimen (15) are disclosed. The method is characterized by the steps of generation (45) of a nominal signal (10) for each scan point and transfer (47) of the nominal signal to a scanning device (7). In further steps, determination (49) of an actual signal (25) for each scan point from the setting of the scanning device (7), detection (51) of at least one detection signal (21) for each scan point, calculation (53) of a display signal (27) and an image point position (29) from the actual signal (25) and/or the nominal signal (10) and the detection signal (21), and assignment (55) of the display signal (27) to the image point position (29), are performed.
Abstract:
A method and system for compensating intensity fluctuations of an illumination system in a confocal microscope comprise a first and a second analog-to-digital converters for digitizing a first electrical signal corresponding to the light reflected from a specimen, and for digitizing a second electrical signal corresponding to an illumination reference, respectively. The digitized signals are sent to a first and a second look up tables carrying out a log conversion of the first and second electrical signals, respectively. Also provided is a calculator for correcting the first electrical signal for intensity fluctuations of the second electrical signal. The corrected electrical signal is sent to a third look up table for converting the corrected electric signal. The conversion is done by exponentiation of the corrected electrical signal.
Abstract:
An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another.
Abstract:
A detector apparatus that is embodied to receive light and to generate electrical signals has a housing and a detector arranged in the housing. The detector includes a light sensor that is embodied to receive light and to release electrons. The light sensor is at a lower electrical potential level than the housing; and that the detector is in thermally conductive contact with the housing via an electrically insulating intermediate arrangement, the thermal conduction direction inside the housing being opposite to the light propagation direction of the light to be detected.
Abstract:
An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.
Abstract:
A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a light sensor having a light incidence side and a cooling component. The cooling component is in direct contact with at least one of the light sensor, on the light incidence side, or a substrate carrying the light sensor.
Abstract:
A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component electrically insulates the detector with respect to the housing or is part of an insulator electrically that insulates the detector with respect to the housing.
Abstract:
A detector apparatus that is embodied to receive light and to generate electrical signals has a housing and a detector arranged in the housing. The detector includes a light sensor that is embodied to receive light and to release electrons. The light sensor is at a lower electrical potential level than the housing; and that the detector is in thermally conductive contact with the housing via an electrically insulating intermediate arrangement, the thermal conduction direction inside the housing being opposite to the light propagation direction of the light to be detected.