Semiconductor device
    3.
    发明授权

    公开(公告)号:US12034093B2

    公开(公告)日:2024-07-09

    申请号:US17310146

    申请日:2019-11-25

    发明人: Toshiki Koyama

    IPC分类号: H01L31/024 H01L27/146

    CPC分类号: H01L31/024 H01L27/14634

    摘要: Heat is efficiently discharged without impairing an imaging characteristic of a solid-state imaging element mounted on a substrate. A semiconductor device is provided with a substrate, the solid-state imaging element, and an adhesive portion that adheres the substrate and the solid-state imaging element. The substrate is a substrate provided with metal wiring. The solid-state imaging element is mounted on a surface of the substrate. The adhesive portion adheres a predetermined region on one surface of the solid-state imaging element to the substrate. The adhesive portion has predetermined thermal conductivity and discharges heat generated in the solid-state imaging element toward the substrate.

    Photosensor
    4.
    发明授权

    公开(公告)号:US12002894B2

    公开(公告)日:2024-06-04

    申请号:US17567194

    申请日:2022-01-03

    摘要: A photosensor includes: a support; a thermoelectric conversion material section that is disposed on a first main surface of the support and that includes a plurality of first material layers each having an elongated shape, a plurality of second material layers each having electrical conductivity and an elongated shape, and an insulating film, the first material layers and the second material layers each being configured to convert thermal energy into electrical energy; a heat sink that is disposed on a second main surface of the support and along an outer edge of the support; a light-absorbing film that is disposed in a region surrounded by inner edges of the heat sink as viewed in a thickness direction of the support so as to form temperature differences on the first main surface of the support in longitudinal directions of the first material layers.

    Stack chip air gap heat insulator

    公开(公告)号:US11942504B2

    公开(公告)日:2024-03-26

    申请号:US17819821

    申请日:2022-08-15

    发明人: Sing-Chung Hu

    摘要: Image sensors include a pixel die that is stacked on a logic die. The logic die includes at least one function logic element disposed on a bond side thereof, and a logic oxide array of raised logic oxide features also disposed on the bond side. The pixel die includes a pixel array disposed on a light receiving side thereof, and a pixel oxide array of raised pixel oxide features disposed on a bond side of the pixel die. A plurality of outer bonds is disposed between an outer region of the logic die and an outer region of the pixel die. A plurality of inner bonds is formed at an inner region of the image sensor between the pixel oxide array and the logic oxide array, the inner bonds being spaced apart by a plurality of fluidly connected air gaps that extend between the logic die and the pixel die.

    IMAGE PICKUP ELEMENT PACKAGE, IMAGE PICKUP APPARATUS, AND MANUFACTURING METHOD FOR AN IMAGE PICKUP ELEMENT PACKAGE

    公开(公告)号:US20190067350A1

    公开(公告)日:2019-02-28

    申请号:US15773617

    申请日:2016-10-07

    申请人: SONY CORPORATION

    发明人: KEIKI FUKUDA

    IPC分类号: H01L27/146 H01L31/024

    摘要: An image pickup element package according to an embodiment of the present technology includes a solid-state image pickup element, a circuit board, a translucent substrate, and a support. The solid-state image pickup element includes a light-receiving surface, and a back surface on a side opposite to the light-receiving surface. The circuit board supports the back surface of the solid-state image pickup element. The translucent substrate is opposed to the light-receiving surface. The support includes a resin frame portion and a conductor portion and is disposed between the circuit board and the translucent substrate. The resin frame portion includes a hollow portion that houses the solid-state image pickup element, and a fixation portion that is fixed to a casing portion of an image-pickup device. The conductor portion is integrally provided in the resin frame portion and provides thermal connection between the circuit board and the fixation portion.