公开(公告)号：US08791402B2

公开(公告)日：2014-07-29

申请号：US13325087

申请日：2011-12-14

Applicant: Bernd Widzgowski

Inventor： Bernd Widzgowski

IPC: H01L31/00

CPC classification number: H01L31/024 ,  H01J40/02 ,  H01J40/16 ,  H01J43/02 ,  H01J43/28

Abstract: A detector device is configured to receive light and generate electrical signals. The detector device includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component is at least one of: positioned so as to have a light path extend through the cooling component, where the light path is defined by light that is received for detection; designed so as to include a thermally conductive, electrically insulating intermediate element; and disposed, in direct contact a light sensor of the detector and/or a substrate bearing the light sensor.

Abstract translation: 检测器装置被配置为接收光并产生电信号。 检测器装置包括壳体，设置在壳体中的检测器和设置在壳体中的冷却部件。 所述冷却部件是以下中的至少一个：定位成具有延伸穿过所述冷却部件的光路，其中所述光路由被接收以用于检测的光限定; 被设计成包括导热的，电绝缘的中间元件; 并且与所述检测器的光传感器和/或承载所述光传感器的基板直接接触。

公开(公告)号：US20130043376A1

公开(公告)日：2013-02-21

申请号：US13325087

申请日：2011-12-14

Applicant: Bernd Widzgowski

Inventor： Bernd Widzgowski

IPC: G01J1/02

CPC classification number: H01L31/024 ,  H01J40/02 ,  H01J40/16 ,  H01J43/02 ,  H01J43/28

Abstract: A detector device is configured to receive light and generate electrical signals. The detector device includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component is at least one of: positioned so as to have a light path extend through the cooling component, where the light path is defined by light that is received for detection; designed so as to include a thermally conductive, electrically insulating intermediate element; and disposed in direct contact a light sensor of the detector and/or a substrate bearing the light sensor.

Abstract translation: 检测器装置被配置为接收光并产生电信号。 检测器装置包括壳体，设置在壳体中的检测器和设置在壳体中的冷却部件。 所述冷却部件是以下中的至少一个：定位成具有延伸穿过所述冷却部件的光路，其中所述光路由被接收以用于检测的光限定; 被设计成包括导热的，电绝缘的中间元件; 并且与检测器的光传感器和/或承载光传感器的基板直接接触。

公开(公告)号：US20110304900A1

公开(公告)日：2011-12-15

申请号：US13151055

申请日：2011-06-01

Applicant: Bernd Widzgowski ,  Holger Birk ,  Volker Seyfried

Inventor： Bernd Widzgowski ,  Holger Birk ,  Volker Seyfried

IPC: G02F1/11 ,  G02F1/33 ,  G02F1/00

CPC classification number: G02F1/113 ,  G02B21/0032 ,  G02B21/0076

Abstract: An acousto-optical system is described comprising at least one acousto-optical element having at least one transducer that is attached to a crystal, a driver unit for generating at least one acoustic signal for driving acousto-optical elements modifying light transmitted through the acousto-optical element and comprising at least one digital data processing unit, at least one digital-to-analog converter transforming the digital combination signal into an initial analog driver signal, and an amplifier for amplifying the initial analog driver signal to become said analog electronic driver signal. Further, a microscope and a method of operating the acousto-optical element is are described. Various objectives are achieved like more flexibility, real time compensation for non-linearity and reducing the number, size, costs and energy consumption of electronic components.

Abstract translation: 描述了一种声光学系统，其包括至少一个具有至少一个连接到晶体的换能器的声光元件，驱动单元，用于产生用于驱动声光元件的至少一个声信号，所述声光信号修改透过声 - 光学元件，并且包括至少一个数字数据处理单元，将数字组合信号变换为初始模拟驱动器信号的至少一个数模转换器，以及用于放大初始模拟驱动器信号以成为所述模拟电子驱动器信号的放大器 。 此外，描述了显微镜和操作声光元件的方法。 实现了各种目标，如更灵活，非线性的实时补偿和减少电子元件的数量，尺寸，成本和能耗。

公开(公告)号：US20110149290A1

公开(公告)日：2011-06-23

申请号：US12954629

申请日：2010-11-25

Applicant: Ludger Schulte ,  Bernd Widzgowski

Inventor： Ludger Schulte ,  Bernd Widzgowski

IPC: G01N21/55 ,  G02B21/06

CPC classification number: G02B21/0032

Abstract: A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.

Abstract translation: 用于检查物体的显微镜包括产生脉冲光以激发物体的激光光源。 包括检测器的测量系统适于检测来自物体的检测光，并且测量系统基于检测光产生测量信号。 显微镜包括可编程集成电路，其包括控制元件和第一延迟元件和第二延迟元件中的至少一个。 控制元件被配置为产生适于控制检测器和测量系统的第一控制信号。 控制元件还被配置为产生适于控制激光光源的第二控制信号。 第一和第二延迟元件被配置为分别延迟第一和第二控制信号。

公开(公告)号：US07190451B2

公开(公告)日：2007-03-13

申请号：US10887539

申请日：2004-07-08

Applicant: Volker Seyfried ,  Bernd Widzgowski

Inventor： Volker Seyfried ,  Bernd Widzgowski

IPC: G01J3/28

CPC classification number: G01J3/36 ,  G01J3/02 ,  G01J3/0208

Abstract: A detection device includes a spectral splitting device located in a detection beam path for spectrally splitting detection light into individual spectral components. A deflection device is located downstream of the spectral splitting device for deflecting the individual spectral components in different deflection directions onto detectors assigned to the individual spectral components. At least one optical element is located in the detection beam path downstream of the spectral splitting device and upstream of the deflection device such that at least one of the individual spectral components incident on the deflection device is collimated.

Abstract translation: 检测装置包括位于检测光束路径中的光谱分离装置，用于将检测光谱分解成各个光谱分量。 偏转装置位于分光装置的下游，用于将不同偏转方向上的各个光谱分量偏转到分配给各个光谱分量的检测器上。 至少一个光学元件位于分光装置的下游的检测光束路径中并且位于偏转装置的上游，使得入射在偏转装置上的各个光谱分量中的至少一个被准直。

公开(公告)号：US20050012927A1

公开(公告)日：2005-01-20

申请号：US10887539

申请日：2004-07-08

Applicant: Volker Seyfried ,  Bernd Widzgowski

Inventor： Volker Seyfried ,  Bernd Widzgowski

IPC: G01J3/02 ,  G01J3/36 ,  G01J3/28

CPC classification number: G01J3/36 ,  G01J3/02 ,  G01J3/0208

Abstract: A detection device, in particular for use in a laser scanning microscope, includes a means (2) located in a detection beam path (1) to spectrally split detection light into individual spectral components (3, 4), and further includes a deflection device (5) located downstream of the means (2) for spectral splitting to deflect the individual spectral components (3, 4) in different deflection directions onto detectors (6) assigned to the individual spectral components (3, 4). With a view to reliable separation of the individual spectral components (3, 4) deflected by deflection device (5), the detection device is built and further refined in such a way that at least one optical element (7) is arranged in the detection beam path (1) downstream of the means (2) for spectral splitting and upstream of the deflection device such that at least one spectral component (3, 4) of the light incident on the deflection device (5) is collimated in at least one spatial direction.

Abstract translation: 特别是在激光扫描显微镜中使用的检测装置包括位于检测光束路径（1）中的装置（2），以将检测光谱分解成各个光谱分量（3,4），并且还包括偏转装置 （5）位于所述装置（2）的下游，用于分光，以将在不同偏转方向上的各个光谱分量（3,4）偏转到分配给各个光谱分量（3,4）的检测器（6）上。 为了可靠地分离由偏转装置（5）偏转的各个光谱分量（3,4），检测装置被构建并进一步细化，使得至少一个光学元件（7）被布置在检测中 用于分光和偏转装置上游的装置（2）下游的光束路径（1），使得入射在偏转装置（5）上的光的至少一个光谱分量（3,4）在至少一个 空间方向。

公开(公告)号：US09036232B2

公开(公告)日：2015-05-19

申请号：US13578609

申请日：2011-01-03

Applicant: Holger Birk ,  Bernd Widzgowski

Inventor： Holger Birk ,  Bernd Widzgowski

IPC: G02B26/08 ,  G02B26/10 ,  G02B21/00

CPC classification number: G02B26/101 ,  G02B21/002 ,  G02B26/0875

Abstract: The invention relates to a device for scanning an object comprising a carrier body (10) and a first electromagnetic drive (2). The carrier body (10) is movably mounted in a plane and holds an optical element (12) that focuses an illuminating light beam (19) on a first object plane of the object that is parallel to the plane. The first electromagnetic drive (2) moves the carrier body (10) with the optical element (12) and a focus region (23) of the illuminating light beam (19) within the first object plane.

Abstract translation: 本发明涉及一种用于扫描物体的装置，包括载体主体（10）和第一电磁驱动器（2）。 载体主体（10）可移动地安装在平面中并且保持将照明光束（19）聚焦在与平面平行的物体的第一物体平面上的光学元件（12）。 第一电磁驱动器（2）使第一物体平面内的光学元件（12）的载体（10）和照明光束（19）的聚焦区域（23）移动。

公开(公告)号：US08542439B2

公开(公告)日：2013-09-24

申请号：US13347756

申请日：2012-01-11

Applicant: Holger Birk ,  Bernd Widzgowski ,  Holger Nissle

Inventor： Holger Birk ,  Bernd Widzgowski ,  Holger Nissle

IPC: G02B21/06 ,  G02B26/02 ,  H01L21/268

CPC classification number: G02B21/008 ,  G01N21/6458 ,  G02B21/0076

Abstract: A method and a device for scanning-microscopy imaging of a specimen (28) are described. Provision is made that a plurality of specimen points are scanned by means of a scanning beam (14) in successive scanning time intervals, the intensity of the radiation emitted from the respectively scanned specimen point is repeatedly sensed within the associated scanning time interval, an intensity mean value is determined, as a mean value image point signal, from the intensities sensed in the respectively scanned specimen point, and the mean value image point signals are assembled into a mean value raster image. Provision is further made for additionally determining an intensity variance value, as a variance image point signal, from the intensities sensed in the respectively scanning specimen points, and for assembling the variance image point signals into a variance raster image signal.

Abstract translation: 描述了用于样本（28）的扫描显微镜成像的方法和装置。 设置以连续的扫描时间间隔通过扫描光束（14）扫描多个样本点，从相应的扫描时间间隔内重复地感测从分别扫描的样本点发射的辐射的强度，强度 将平均值作为平均值图像点信号从分别扫描的样本点中感测的强度确定，并将平均值图像点信号组装成平均值光栅图像。 还进一步确定作为方差图像点信号的强度方差值与在各扫描样本点中检测到的强度相关，并将差异图像点信号组装成方差光栅图像信号。

公开(公告)号：US08253937B2

公开(公告)日：2012-08-28

申请号：US12626057

申请日：2009-11-25

Applicant: Vishnu Vardhan Krishnamachari ,  William C. Hay ,  Volker Seyfried ,  Bernd Widzgowski

Inventor： Vishnu Vardhan Krishnamachari ,  William C. Hay ,  Volker Seyfried ,  Bernd Widzgowski

IPC: G01J3/44

CPC classification number: G01N21/63

Abstract: An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated.

Abstract translation: 描述了用于执行所述方法的光学评估方法和装置。 第一类型的第一激光脉冲和第二类型的与第一类型不同的第二激光脉冲被发送到要检查的样品上。 在两个激光脉冲之间的非常短的时间间隔内，以两个激光脉冲的时间相关方式，以至少一种方式同时来自两个激光脉冲的第一入射光和第二激光脉冲的时间相关方式， 信号，并用来自两个激光脉冲的第二入射光击中，从而产生第二光信号。 产生的第一和第二光信号用至少一个检测器检测; 并且产生第一和第二光信号之间的电子差异。

公开(公告)号：US20120193513A1

公开(公告)日：2012-08-02

申请号：US13500160

申请日：2010-10-08

Applicant: Bernd Widzgowski ,  Volker Seyfried ,  Holger Birk

Inventor： Bernd Widzgowski ,  Volker Seyfried ,  Holger Birk

IPC: G01J1/32

CPC classification number: G02B21/0032 ,  G02B21/06

Abstract: The invention relates to a laser system (20) for a microscope, comprising a laser module (22), a beam correction device (26), an optical fiber (31), a measuring element (34), and an external controller (37). The laser module (22) generates a light beam (24). The light beam (24) penetrates the beam correction device (26), which corrects a deviation of an actual value of at least one parameter of the light beam (24) from a target value of the parameter. The corrected light beam (24) is coupled into the optical fiber (31). The measuring element (34) is connected downstream of the optical fiber (31) and captures an actual value (36) of the intensity of at least one partial beam (32) of the corrected light beam (24). The external controller (37), regulates the actual value (36) of the intensity to a prescribed target value for the intensity.

Abstract translation: 本发明涉及一种用于显微镜的激光系统（20），包括激光模块（22），光束校正装置（26），光纤（31），测量元件（34）和外部控制器 ）。 激光模块（22）产生光束（24）。 光束（24）穿透光束校正装置（26），其校正光束（24）的至少一个参数的实际值与参数的目标值的偏差。 校正光束（24）耦合到光纤（31）中。 测量元件（34）连接在光纤（31）的下游，并且捕获校正光束（24）的至少一个部分光束（32）的强度的实际值（36）。 外部控制器（37）将强度的实际值（36）调整为强度的规定目标值。