摘要:
A method and system for creating knowledge and selecting features in a supervised classifier is disclosed. The method and system comprises changing a feature space of a plurality of defects and marking at least a portion of the samples of the defects in the feature space. The method and system includes labeling the at least a portion of the samples as training samples, determining if the training samples are of the same type and creating knowledge based upon the training samples if the samples are of the same type.
摘要:
A power generation system driven by heat pump which produces a heat source by heating and a cold source by cooling for the driving of a heat engine to produce mechanical energy to drive a generator generating electrical power. Part of the power generated by the generator is fed back to the heat pump continuously, and the remaining power is provided to end users in need of electrical power. The heat engine of the power generation system can be Stirling engine or a steam turbine, wherein the heat efficiency of the Stirling engine can reach 25%, and the heat efficiency of the steam turbine can reach above 30%. The heat pump used in the power generation system can be a vapor-compression heat pump. Under operating conditions where temperature difference between the generated heat and cold sources is over 25 degree celcius, the coefficient of performance can reach above 7.
摘要:
A lighting device with mixed LEDs for cultivating young plants. The lighting device comprises a lamp set, a plurality of light modules, a waveform generating module and a control module. The light modules can be selectively disposed on the lamp set. Each light module comprises a plurality of mixed light emitting diodes with various arrangements. The waveform generating module is electrically connected to the light module mounted in the lamp. The control module houses a waveform database comprising preset waveform data for different light modules, such that the control module can directs the waveform generating module to provide power of different waveforms according to each light module mounted on the lamp set and corresponding plants.
摘要:
An artificial lighting apparatus for young plants that includes at least one electric track and a plurality of lamps. The lamps are detachably mounted on the electric track. Each of the lamps includes a box and a plurality of light emitting diodes mounted on the box. The electric track supplies the lamps with power to light the light emitting diodes. The driver provides the controlling capability on light quantity, quality, frequency and duty ratio.
摘要:
A vapor compressed air conditioning or refrigeration equipment includes an accumulator connected between the high pressure side of the compressor and, the inlet of the condenser; a flow-rate control unit is provided at the outlet of the accumulator. Also provided is a dipped type heat exchanger device disposed at the high pressure side of the compressor and connected between the compressor and the condenser via refrigerant pipes and a submersible heat dissipated tube. The dipped type heat exchanger includes a container for storing a heat transfer medium for heat exchange with a waste heat recycled tube combined with the container in heat transfer relationship. The tube is disposed between the low-pressure side of the air conditioning equipment and the compressor, for the purpose of reducing the temperature of the heat transfer medium and thus reducing the temperature of the high temperature superheated refrigerant vapor within the submersible heat dissipated tube.
摘要:
A method and system for inspecting defects saves scanned raw data as an original image so as to save time for repeated scanning and achieve faster defect inspection and lower false rate by reviewing suspicious defects and other regions of interest in the original image by using the same or different image-processing algorithm with the same or different parameters.
摘要:
A method for promoting semiconductor manufacturing yield comprising the following steps and a computer readable medium encoded with a computer program implementing the method is provided. First, a processed layer is inspected to generate an inspected image with defects thereon. Next, the inspected image is aligned to an original design layout information of the processed layer. In addition, the defects are classified according to geometric features of the original design layout information of the processed layer and at least previous one layer and/or at least next one layer.
摘要:
Embodiments include apparatuses, method, and systems for organizing individual memory dice of a memory device into a plurality of virtual dice and designating one of the virtual dice of the memory device for storage of redundancy information. In one embodiment, a memory controller includes memory allocation logic to organize memory resources of individual memory dice of a memory device into a plurality of virtual dice, including a redundancy virtual die for storing redundancy information and a plurality of data virtual dice for storing data. The memory controller may further include input/output logic to write data to the data virtual dice of the non-volatile memory device, and redundancy information logic to generate redundancy information based on the data and to write the redundancy information to the redundancy virtual die of the non-volatile memory device
摘要:
A method of inspecting an EUV reticle is proposed, which uses an original design layout information to align the plurality of patterns on an image, which is got by scanning the surface of an EUV reticle, such that the defect can be identified and classified according to the aligned patterns. In the scanning process, a step of conditioning surface charge is followed by a step of inspecting surface of the EUV reticle wherein the step of conditioning surface can neutralize the surface charge and the step of inspecting can obtain an image of the EUV reticle. The method of inspecting an EUV reticle also tuning a retarding electrode to attract more secondary electrons such that the greylevels of different patterns may be shown and the defect can be identified and classified.
摘要:
A method for determining a defect during charged particle beam inspection of a sample locates at least one examination region within a charged particle microscopic image of the sample by making reference to a database graphic of the sample corresponding to the charged particle microscopic image. Each located examination region concerns at least one element of the sample, and each element has at least one characteristic in common. At least one point response value is then generated for each point in the located examination regions. The presence of a defect at the location of the concerned point is then determined by applying at least one decision tree operator to the generated point response values of the concerned point. Applications of the proposed method as a computing agent and a charged particle beam inspection system are also disclosed.