Abstract:
A power management controller is disclosed. Broadly speaking, the controller may, in response to receiving a timing signal, monitor a temperature of an integrated circuit including multiple processor clusters. The controller may generate a comparison of the temperature and a threshold value, and in response to a determination that the comparison indicates that the temperature is less than the threshold value, transition a particular processor cluster to a new power state.
Abstract:
A power management controller is disclosed. Broadly speaking, the controller may, in response to receiving a timing signal, monitor a temperature of an integrated circuit including multiple processor clusters. The controller may generate a comparison of the temperature and a threshold value, and in response to a determination that the comparison indicates that the temperature is less than the threshold value, transition a particular processor cluster to a new power state.
Abstract:
A power management controller is disclosed. Broadly speaking, the controller may, in response to receiving a timing signal, monitor a temperature of an integrated circuit including multiple processor clusters. The controller may generate a comparison of the temperature and a threshold value, and in response to a determination that the comparison indicates that the temperature is less than the threshold value, transition a particular processor cluster to a new power state.
Abstract:
A system is disclosed, including an interface to a DUT and a testing apparatus. The DUT includes a first plurality of temperature sensing circuits. The testing apparatus may store a plurality of control values. Each control value may depend on at least two calibration values of corresponding temperature sensing circuits of a second plurality of temperature sensing circuits. The testing apparatus may generate a plurality of calibration values for the DUT. Each calibration value corresponds to one of the first plurality of temperature sensing circuits. The testing apparatus may determine a plurality of test values for the DUT. The testing apparatus may calculate a probability value, and repeat generation of the plurality of calibration values upon determining that the probability value is less than a predetermined threshold value. The probability value corresponds to a likelihood that the plurality of calibration values is accurate.
Abstract:
A power management controller is disclosed. Broadly speaking, the controller may, in response to detecting a timing signal, determine a total power consumption for a plurality of processor clusters, each of which includes a plurality of processor cores. The controller may determine a performance metric using the total power consumption and compare the performance metric to a limit. Based on a result of the comparison, the controller may select a new power state for at least one of the processor clusters.
Abstract:
Systems, methods, and other embodiments are disclosed that are configured to provide on-chip current sensing by employing a power distribution network voltage de-convolution technique. A voltage signal on a voltage plane of a system-on-chip device is measured during operation of the system-on-chip device. The voltage signal derives from a power distribution network. The voltage signal is de-convolved, based at least in part on inverse convolution coefficients derived from the power distribution network, to recover a current signal being drawn by the system-on-chip device from the power distribution network.
Abstract:
Embodiments of the invention provide adaptive power ramp control (APRC) in microprocessors. One implementation of the APRC can compute a present core power and a present power ramp condition in the microprocessor, for example, to determine whether the present power is in a particular predefined control zone and whether the present power ramp is greater than a predefined threshold for that control zone. Those determinations can indicate a likelihood of an imminent, undesirable power ramp condition and can inform entry into a control mode. The APRC can generate an appropriate stall control signal in response to its present control mode, and the stall control signal can stall operation of at least one functional unit of the microprocessor according to a predefined stall pattern. This can effectively combat the imminent power ramp condition by reducing the power usage of the microprocessor.
Abstract:
A system includes a power management unit that may monitor the power consumed by a processor including a plurality of processor core. The power management unit may throttle or reduce the operating frequency of the processor cores by applying a number of throttle events in response to determining that the plurality of cores is operating above a predetermined power threshold during a given monitoring cycle. The number of throttle events may be based upon a relative priority of each of the plurality of processor cores to one another and an amount that the processor is operating above the predetermined power threshold. The number of throttle events may correspond to a portion of a total number of throttle events, and which may be dynamically determined during operation based upon a proportionality constant and the difference between the total power consumed by the processor and a predetermined power threshold.
Abstract:
A method for determining power dissipation within a computer system is disclosed. A circuit block may receive a regulated voltage level on a power supply signal generated by a voltage regulator circuit. A power control circuit may measure a current drawn by the circuit block, and determine a real-time voltage level for the power supply signal using the current and based on a slope value and a zero-load voltage level. Additionally, power control circuit may determine a power dissipation for the circuit block using the current and the real-time voltage level, and adjust an operation parameter of the circuit block based on the power dissipation.
Abstract:
Embodiments include systems and methods for in-system, scan-based device testing using novel narrow-parallel (NarPar) implementations. Embodiments include a virtual automated test environment (VATE) system that can be disposed within the operating environment of an integrated circuit for which scan-based testing is desired (e.g., a chip under test, or CuT). For example, the VATE system is coupled with a service processor and with the CuT via a novel NarPar interface. A sequence controller can drive a narrow set of parallel scan pins on the CuT via the NarPar interface of the VATE system in accordance with an adapted test sequence having bit vector stimulants and expected responses. Responses of the CuT to the bit vector stimulants can be read out and compared to the expected results for scan-based testing of the chip.