GUIDE PLATE FOR PROBE CARD AND PROBE CARD HAVING SAME

    公开(公告)号:US20200271693A1

    公开(公告)日:2020-08-27

    申请号:US16794147

    申请日:2020-02-18

    Abstract: The present invention provides a guide plate for a probe card. The guide plate for the probe card according to the present invention includes: a first guide plate including a plurality of first pin insertion holes formed therein, and made of an anodic oxide film; and a second guide plate disposed to be spaced apart from the first guide plate by a predetermined distance, and including a plurality of second pin insertion holes through which probe pins passing through the first pin insertion holes pass, wherein a buffer part is provided at least partially on each of an upper portion and a lower portion of the first guide plate.

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