公开(公告)号：US11474317B2

公开(公告)日：2022-10-18

申请号：US16748696

申请日：2020-01-21

Applicant: STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Jean-Francois Carpentier ,  Charles Baudot

IPC: G02B6/42 ,  G02B6/43 ,  G02B6/12 ,  G02B6/13

Abstract: A photonic system includes a first photonic circuit having a first face and a second photonic circuit having a second face. The first photonic circuit comprises first wave guides, and, for each first wave guide, a second wave guide covering the first wave guide, the second wave guides being in contact with the first face and placed between the first face and the second face, the first wave guides being located on the side of the first face opposite the second wave guides. The second photonic circuit comprises, for each second wave guide, a third wave guide covering the second wave guide. The first photonic circuit comprises first positioning devices projecting from the first face and the second photonic circuit comprises second positioning devices projecting from the second face, at least one of the first positioning devices abutting one of the second positioning devices in a first direction.

公开(公告)号：US11269140B2

公开(公告)日：2022-03-08

申请号：US16185654

申请日：2018-11-09

Applicant: STMicroelectronics SA ,  STMicroelectronics (Crolles 2) SAS

Inventor： Jean-Robert Manouvrier ,  Jean-Francois Carpentier ,  Patrick LeMaitre

IPC: G02B6/124 ,  G02B6/30 ,  G02F1/025 ,  G02B6/293

Abstract: An electro-optic device may include a photonic chip having an optical grating coupler at a surface. The optical grating coupler may include a first semiconductor layer having a first base and first fingers extending outwardly from the first base. The optical grating coupler may include a second semiconductor layer having a second base and second fingers extending outwardly from the second base and being interdigitated with the first fingers to define semiconductor junction areas, with the first and second fingers having a non-uniform width. The electro-optic device may include a circuit coupled to the optical grating coupler and configured to bias the semiconductor junction areas and change one or more optical characteristics of the optical grating coupler.

公开(公告)号：US11131602B2

公开(公告)日：2021-09-28

申请号：US16188537

申请日：2018-11-13

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01M11/00 ,  H04B10/07

Abstract: An intermediate signal is separated into a first sub-signal and a second sub-signal according to a separation coefficient having a known real value. The first sub-signal is delivered to a first photonic circuit containing at least one photonic device to be characterized and a first photonic part. The second sub-signal is delivered to a second photonic circuit containing a second photonic part having a same transfer function as the first photonic part but lacking the at least one photonic device. Optical output signals from the first and second photonic circuits are converted into first and second electrical signals. Losses of the at least one photonic device are determined from processing the electrical signals and from the known real value of the separation coefficient.

公开(公告)号：US10921370B2

公开(公告)日：2021-02-16

申请号：US16249530

申请日：2019-01-16

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01R31/317 ,  G02B6/12 ,  G02B6/27 ,  G02B6/293 ,  G01M11/00

Abstract: The invention concerns an optoelectronic chip including a pair of optical inputs having a same bandwidth, and each being adapted to a different polarization, at least one photonic circuit to be tested, and an optical coupling device configured to couple the two inputs to the circuit to be tested.

公开(公告)号：US10677684B2

公开(公告)日：2020-06-09

申请号：US16211511

申请日：2018-12-06

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe Grosse ,  Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G02B6/00 ,  G01M11/00 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US10274395B2

公开(公告)日：2019-04-30

申请号：US15694156

申请日：2017-09-01

Applicant: STMicroelectronics (Crolles 2) SAS ,  STMICROELECTRONICS SA

Inventor： Jean-Francois Carpentier ,  Patrick Le Maitre ,  Jean-Robert Manouvrier ,  Charles Baudot ,  Bertrand Borot

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00 ,  G02B6/00 ,  G01M11/00

Abstract: A semiconductor device may include a semiconductor wafer, and a reference circuit carried by the semiconductor wafer. The reference circuit may include optical DUTs, a first set of photodetectors coupled to outputs of the optical DUTs, an optical splitter coupled to inputs of the optical DUTs, and a second set of photodetectors coupled to the optical splitter. The optical splitter is to be coupled to an optical source and configured to transmit a reference optical signal to the first set of photodetectors via the optical DUTs and the second set of photodetectors.

公开(公告)号：US10180373B2

公开(公告)日：2019-01-15

申请号：US15489127

申请日：2017-04-17

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe Grosse ,  Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00 ,  G02B6/00

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US09766417B2

公开(公告)日：2017-09-19

申请号：US15350901

申请日：2016-11-14

Applicant: STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Patrick Lemaitre ,  Jean-Francois Carpentier

IPC: G02B6/24 ,  G02B6/42 ,  G02B6/34 ,  G02B6/124

CPC classification number: G02B6/4225 ,  G02B6/124 ,  G02B6/34 ,  G02B6/4222 ,  G02B6/4227 ,  G02B6/4249 ,  G02B6/425

Abstract: A method is for aligning an electro-optic device. The method may include initially positioning an optical fiber array adjacent to optical grating couplers, and actively aligning the optical fiber array relative to the optical grating couplers in a yaw direction and a roll direction to determine a yaw and roll alignment at a first operating wavelength. The method may include actively aligning the optical fiber array relative to optical grating couplers in an x direction and a y direction to determine a first x and y alignment at the first operating wavelength, determining a second operating wavelength, and actively aligning the optical fiber array again relative to the optical grating couplers in the x direction and y direction to determine a second x and y alignment at the second operating wavelength.

公开(公告)号：US09529165B1

公开(公告)日：2016-12-27

申请号：US14755437

申请日：2015-06-30

Applicant: STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Patrick Lemaitre ,  Jean-Francois Carpentier

IPC: G02B6/24 ,  G02B6/42 ,  G02B6/34

CPC classification number: G02B6/4225 ,  G02B6/124 ,  G02B6/34 ,  G02B6/4222 ,  G02B6/4227 ,  G02B6/4249 ,  G02B6/425

Abstract: A method is for aligning an electro-optic device. The method may include initially positioning an optical fiber array adjacent to optical grating couplers, and actively aligning the optical fiber array relative to the optical grating couplers in a yaw direction and a roll direction to determine a yaw and roll alignment at a first operating wavelength. The method may include actively aligning the optical fiber array relative to optical grating couplers in an x direction and a y direction to determine a first x and y alignment at the first operating wavelength, determining a second operating wavelength, and actively aligning the optical fiber array again relative to the optical grating couplers in the x direction and y direction to determine a second x and y alignment at the second operating wavelength.

Abstract translation: 一种用于对准电光装置的方法。 该方法可以包括最初将光纤阵列定位成与光栅耦合器相邻，并且在偏转方向和滚动方向上相对于光栅耦合器主动对准光纤阵列以确定在第一工作波长处的偏航和滚动对准。 该方法可以包括在x方向和ay方向上相对于光栅耦合器主动对准光纤阵列以确定第一工作波长处的第一x和y对准，确定第二工作波长，并且再次主动对准光纤阵列 相对于光栅耦合器在x方向和y方向上，以确定在第二工作波长处的第二x和y对准。

公开(公告)号：US09500805B2

公开(公告)日：2016-11-22

申请号：US14656981

申请日：2015-03-13

Applicant: STMICROELECTRONICS SA ,  STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Jean-Robert Manouvrier ,  Patrick Lemaitre ,  Jean-Francois Carpentier

IPC: G02B6/13 ,  H01L29/74 ,  G02B6/12 ,  G02B6/132

CPC classification number: G02B6/12 ,  G02B6/122 ,  G02B6/13 ,  G02B6/132 ,  H01L29/74

Abstract: An optical waveguide in a semiconductor material, may include, between two adjacent portions of the waveguide, a plurality of parallel strips of alternating conductivity types forming a plurality of opposing bipolar junctions between the two adjacent portions.

Abstract translation: 在半导体材料中的光波导可以包括在波导的两个相邻部分之间的多个交替导电类型的平行条带，在两个相邻部分之间形成多个相对的双极结。