METHOD AND APPARATUS FOR DETERMINING ABNORMAL OBJECT

    公开(公告)号:US20180150701A1

    公开(公告)日:2018-05-31

    申请号:US15583339

    申请日:2017-05-01

    Abstract: Disclosed is a method and apparatus for determining an abnormal object, the method including selecting a candidate object from target objects extracted from a two-dimensional (2D) image of a front view captured from a host vehicle, generating a three-dimensional (3D) model of the candidate object, determining, based on the 3D model, whether the candidate object corresponds to an abnormal object that interferes with driving of the host vehicle, and outputting the abnormal object, in response to the candidate object corresponding to the abnormal object.

    SEMICONDUCTOR DEVICE AND ELECTRONIC APPARATUS INCLUDING THE SEMICONDUCTOR DEVICE

    公开(公告)号:US20230070266A1

    公开(公告)日:2023-03-09

    申请号:US17670949

    申请日:2022-02-14

    Abstract: A semiconductor device includes a first source/drain structure including a first semiconductor region and a first electrode in electrical contact with the first semiconductor region; a second source/drain structure including a second semiconductor region and a second electrode in electrical contact with the second semiconductor region; a channel between the first semiconductor region and the second semiconductor region; and a gate structure including a gate insulating film covering the channel and a gate electrode covering the gate insulating film. The first source/drain structure further includes a silicide film between the first semiconductor region and the first electrode and a conductive barrier between the silicide film and the first electrode. The conductive barrier includes a conductive two-dimensional material.

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