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公开(公告)号:US11935594B2
公开(公告)日:2024-03-19
申请号:US17672617
申请日:2022-02-15
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stanley Hong , Stephen Trinh , Anh Ly
Abstract: Various embodiments of tandem row decoders are disclosed. Each embodiment of a tandem row decoder comprises a word line decoder and a control gate decoder. The tandem row decoder exhibits reduced leakage current on the word line and the control gate line when the tandem row decoder is not enabled.
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公开(公告)号:US11875852B2
公开(公告)日:2024-01-16
申请号:US17140924
申请日:2021-01-04
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stanley Hong , Stephen Trinh , Anh Ly , Nhan Do , Mark Reiten
CPC classification number: G11C16/08 , G11C11/54 , G11C16/24 , G11C2216/04
Abstract: Numerous embodiments of analog neural memory arrays are disclosed. Certain embodiments comprise an adaptive bias decoder for providing additional bias to array input lines to compensate for instances where ground floats above 0V. This is useful, for example, to minimize the voltage drop for a read, program, or erase operation while maintaining accuracy in the operation.
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33.
公开(公告)号:US11798619B2
公开(公告)日:2023-10-24
申请号:US17857113
申请日:2022-07-04
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Vipin Tiwari , Nhan Do
CPC classification number: G11C11/54 , G06N3/065 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/16 , G11C16/3418 , G11C2216/04
Abstract: Numerous examples for performing tuning of a page or a word of non-volatile memory cells in an analog neural memory are disclosed. In one example, a method comprises programming a word or page of non-volatile memory cells in an analog neural memory system; and identifying any fast bits in the word or page of non-volatile memory cells.
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34.
公开(公告)号:US11783904B2
公开(公告)日:2023-10-10
申请号:US17839294
申请日:2022-06-13
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Nha Nguyen , Vipin Tiwari , Nhan Do
CPC classification number: G11C16/3459 , G06F3/0688 , G06N3/063 , G06N3/08 , G11C16/10 , G11C16/26 , G11C16/3436 , G11C29/10
Abstract: In one example, a method is disclosed of compensating for leakage in an array of analog neural non-volatile memory cells, wherein the array is arranged in rows and columns, wherein each row is coupled to a word line and each column is coupled to a bitline, the method comprising measuring leakage for a column of analog neural non-volatile memory cells coupled to a bitline; storing the measured leakage value; and applying the measured leakage value during a read operation of the column of analog neural non-volatile memory cells to compensate for the leakage.
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公开(公告)号:US20230119017A1
公开(公告)日:2023-04-20
申请号:US18081124
申请日:2022-12-14
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly
IPC: G06N3/065 , G11C16/10 , G11C16/04 , G06N3/08 , G06F12/0811 , G11C11/4063 , G11C11/54
Abstract: Examples of programming circuits and methods are provided. In one example, an adjustable programming circuit comprises a first adjustable voltage divider; a second adjustable voltage divider; a first operational amplifier, wherein an output terminal of the first operational amplifier provides a first programming voltage; and a second operational amplifier, wherein the first input terminal of the second operational amplifier is coupled to the output terminal of the second operational amplifier and the first input terminal of the second operational amplifier is coupled to the second output terminal of the first adjustable voltage divider.
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公开(公告)号:US11355184B2
公开(公告)日:2022-06-07
申请号:US16986812
申请日:2020-08-06
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Vipin Tiwari
Abstract: Numerous embodiments of analog neural memory arrays are disclosed. In certain embodiments, each memory cell in the array has an approximately constant source impedance when that cell is being operated. In certain embodiments, power consumption is substantially constant from bit line to bit line within the array when cells are being read. In certain embodiments, weight mapping is performed adaptively for optimal performance in power and noise.
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公开(公告)号:US11289164B2
公开(公告)日:2022-03-29
申请号:US17104385
申请日:2020-11-25
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stanley Hong , Stephen Trinh , Anh Ly
Abstract: Various embodiments of tandem row decoders are disclosed. Each embodiment of a tandem row decoder comprises a word line decoder and a control gate decoder. The tandem row decoder exhibits reduced leakage current on the word line and the control gate line when the tandem row decoder is not enabled.
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公开(公告)号:US11144824B2
公开(公告)日:2021-10-12
申请号:US16360955
申请日:2019-03-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly
IPC: G11C16/10 , G06N3/063 , G11C16/04 , G06N3/08 , G06F12/0811 , G11C11/4063 , G11C11/54
Abstract: Various algorithms are disclosed for verifying the stored weight in a non-volatile memory cell in a neural network following a multilevel programming operation of the non-volatile memory cell by converting the stored weight into a plurality of digital output bits. Circuity, such as an adjustable reference current source, for implementing the algorithms are disclosed.
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公开(公告)号:US20210020255A1
公开(公告)日:2021-01-21
申请号:US16569611
申请日:2019-09-12
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Nha Nguyen , Vipin Tiwari , Nhan Do
Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.
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公开(公告)号:US20210019608A1
公开(公告)日:2021-01-21
申请号:US16569647
申请日:2019-09-12
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Nha Nguyen , Vipin Tiwari , Nhan Do
Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.
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