MAGNETIC RECORDING ARRAY AND MAGNETORESISTANCE EFFECT UNIT

    公开(公告)号:US20220343959A1

    公开(公告)日:2022-10-27

    申请号:US17420474

    申请日:2020-03-05

    Inventor: Tomoyuki SASAKI

    Abstract: A magnetic recording array includes a plurality of units. Each unit has a first magnetoresistance effect element, second magnetoresistance effect element, and writing transistor. Each of the first magnetoresistance effect element and the second magnetoresistance effect element has a wiring and a laminate which is laminated on the wiring. The writing transistor is connected to each of the wiring of the first magnetoresistance effect element and the wiring of the second magnetoresistance effect element. The wiring of the first magnetoresistance effect element and the wiring of the second magnetoresistance effect element are electrically connected in series at the time of writing, and a writing current flows through each of the wirings. A direction of a writing current flowing in the wiring of the first magnetoresistance effect element and a direction of a writing current flowing in the wiring of the second magnetoresistance effect element are opposite to each other.

    SPIN-ORBIT-TORQUE MAGNETIZATION ROTATIONAL ELEMENT AND MAGNETIC MEMORY

    公开(公告)号:US20220140231A1

    公开(公告)日:2022-05-05

    申请号:US17578625

    申请日:2022-01-19

    Abstract: A spin-orbit-torque magnetization rotational element includes: a ferromagnetic metal layer, a magnetization direction of the ferromagnetic metal layer being configured to change; a spin-orbit torque wiring which extends in the first direction intersecting a lamination direction of the ferromagnetic metal layer and is joined to the ferromagnetic metal layer; and two via wires, each of which extends in a direction intersecting the spin-orbit torque wiring from a surface of the spin-orbit torque wiring opposite to a side with the ferromagnetic metal layer and is connected to a semiconductor circuit, wherein a via-to-via distance between the two via wires in the first direction is shorter than a width of the ferromagnetic metal layer in the first direction.

    SPIN ELEMENT AND MAGNETIC MEMORY
    34.
    发明申请

    公开(公告)号:US20210364580A1

    公开(公告)日:2021-11-25

    申请号:US16475478

    申请日:2018-12-25

    Abstract: A spin element includes an element portion including a first ferromagnetic layer, a conducting portion that extends in a first direction as viewed in a lamination direction of the first ferromagnetic layer and faces the first ferromagnetic layer, and a current path extending from the conducting portion to a semiconductor circuit and having a resistance adjusting portion between the conducting portion and the semiconductor circuit, wherein the resistance value of the resistance adjusting portion is higher than the resistance value of the conducting portion, and the temperature coefficient of the volume resistivity of a material forming the resistance adjusting portion is lower than the temperature coefficient of the volume resistivity of a material forming the conducting portion.

    FERROMAGNETIC LAMINATED FILM, SPIN CURRENT MAGNETIZATION ROTATING ELEMENT, MAGNETORESISTANCE EFFECT ELEMENT, AND MAGNETIC MEMORY

    公开(公告)号:US20200321518A1

    公开(公告)日:2020-10-08

    申请号:US16956802

    申请日:2019-02-26

    Abstract: A ferromagnetic laminated film includes a plurality of first magnetic layers, at least one second magnetic layer, and at least one first non-magnetic layer, in which the first magnetic layers are alternately laminated with the second magnetic layer or the first non-magnetic layer, and a material forming the first magnetic layers is different from a material forming the second magnetic layer, and the first magnetic layers, the first non-magnetic layer, and the second magnetic layer are a material combination in which interface magnetic anisotropy is generated between the first magnetic layer and the first non-magnetic layer, and a material combination in which interface magnetic anisotropy is generated between the first magnetic layer and the second magnetic layer.

    MAGNETORESISTANCE EFFECT ELEMENT
    38.
    发明申请

    公开(公告)号:US20200219532A1

    公开(公告)日:2020-07-09

    申请号:US16819373

    申请日:2020-03-16

    Inventor: Tomoyuki SASAKI

    Abstract: A magnetoresistance effect element has a first ferromagnetic metal layer, a second ferromagnetic metal layer, and a tunnel barrier layer that is sandwiched between the first and second ferromagnetic metal layers, the tunnel barrier layer is expressed by a chemical formula of AB2Ox, and has a spinel structure in which cations are arranged in a disordered manner, A represents a divalent cation that is either Mg or Zn, and B represents a trivalent cation that includes a plurality of elements selected from the group consisting of Al, Ga, and In.

    MAGNETORESISTANCE EFFECT ELEMENT
    40.
    发明申请

    公开(公告)号:US20200006642A1

    公开(公告)日:2020-01-02

    申请号:US16451791

    申请日:2019-06-25

    Abstract: A magnetoresistance effect element includes a first ferromagnetic layer, a second ferromagnetic layer, and a tunnel barrier layer that is interposed between the first ferromagnetic layer and the second ferromagnetic layer. The tunnel barrier layer is a stacked body including one or more first oxide layers having a spinel structure and one or more second oxide layers having a spinel structure with a composition which is different from a composition of the first oxide layer.

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