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公开(公告)号:US11769723B2
公开(公告)日:2023-09-26
申请号:US17237443
申请日:2021-04-22
发明人: Shih-Wei Peng , Jiann-Tyng Tzeng , Kam-Tou Sio , Wei-Cheng Lin , Wei-An Lai
IPC分类号: H01L23/522 , H01L23/528 , H01L27/02 , H01L27/06
CPC分类号: H01L23/5226 , H01L23/5283 , H01L27/0207 , H01L27/0688
摘要: A monolithic three-dimensional (3D) integrated circuit (IC) device includes a lower tier including a lower tier cell and an upper tier arranged over the lower tier. The upper tier has a first upper tier cell and a second upper tier cell separated by a predetermined lateral space. A monolithic inter-tier via (MIV) extends from the lower tier through the predetermined lateral space, and the MIV has a first end electrically connected to the lower tier cell and a second end electrically connected to the first upper tier cell.
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公开(公告)号:US20230297755A1
公开(公告)日:2023-09-21
申请号:US18325501
申请日:2023-05-30
发明人: Shih-Wei Peng , Kam-Tou Sio , Jiann-Tyng Tzeng
IPC分类号: G06F30/392 , G06F30/394 , G06F30/396
CPC分类号: G06F30/392 , G06F30/394 , G06F30/396
摘要: Generating a circuit layout is provided. A circuit layout associated with a circuit is received. A parallel pattern recognition is performed on the circuit layout. Performing the parallel pattern recognition includes determining that there is a parallel pattern in the circuit layout. In response to determining that there is a parallel pattern in the circuit layout, a cell swap for a first cell associated with the parallel pattern with a second cell is performed. After the cell swap for the first cell, engineering change order routing is performed to connect the second cell in the circuit layout. An updated circuit layout having the second cell is provided.
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公开(公告)号:US11735517B2
公开(公告)日:2023-08-22
申请号:US17590439
申请日:2022-02-01
发明人: Kam-Tou Sio , Wei-Cheng Lin , Jiann-Tyng Tzeng
IPC分类号: H01L23/522 , H01L21/768 , H01L23/528
CPC分类号: H01L23/5226 , H01L21/76804 , H01L21/76877 , H01L23/528
摘要: A method including depositing a first dielectric layer over a first conductive line. The method further includes forming a first opening in the first dielectric layer. The method further includes filling the first opening with a first conductive material to define a second conductive line. The method further includes depositing a second dielectric layer over the first dielectric layer. The method further includes forming a second opening in the second dielectric layer. The method further includes filling the second opening with a second conductive material to define a third conductive line. The method further includes forming a supervia opening in the first dielectric layer and the second dielectric layer. The method further includes filling the supervia opening with a third conductive material to define a supervia, wherein the supervia directly connects to the first conductive line and the third conductive line.
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公开(公告)号:US20230154924A1
公开(公告)日:2023-05-18
申请号:US18149128
申请日:2023-01-02
发明人: Te-Hsin Chiu , Kam-Tou Sio , Jiann-Tyng Tzeng
IPC分类号: H01L27/092 , H01L29/66 , H01L29/06 , H01L29/08 , H01L29/423 , H01L29/786 , H01L29/78 , H01L21/764 , H01L21/8238 , H01L23/528
CPC分类号: H01L27/0924 , H01L21/764 , H01L21/823814 , H01L21/823821 , H01L21/823878 , H01L23/5286 , H01L29/0653 , H01L29/0673 , H01L29/0847 , H01L29/7851 , H01L29/42392 , H01L29/66545 , H01L29/66795 , H01L29/78618 , H01L29/78696
摘要: A semiconductor device includes a semiconductor substrate. The semiconductor device includes a first fin protruding from the semiconductor substrate and extending along a first direction. The semiconductor device includes a second fin protruding from the semiconductor substrate and extending along the first direction. A first epitaxial source/drain region coupled to the first fin and a second epitaxial source/drain region coupled to the second fin are laterally spaced apart from each other by an air void.
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公开(公告)号:US11626369B2
公开(公告)日:2023-04-11
申请号:US17237530
申请日:2021-04-22
发明人: Te-Hsin Chiu , Kam-Tou Sio , Shih-Wei Peng , Wei-Cheng Lin , Jiann-Tyng Tzeng
IPC分类号: H01L21/8238 , H01L23/528 , H01L27/092
摘要: An integrated circuit includes a first, second and third active region and a first, second and third conductive line. The first, second and third active regions extend in a first direction, and are on a first level of a front-side of a substrate. The second active region is between the first active region and the third active region. The first and second conductive line extend in the first direction, and are on a second level of a back-side of the substrate. The first conductive line is between the first and second active region. The second conductive line is between the second and third active region. The third conductive line extends in the second direction, is on a third level of the back-side of the substrate, overlaps the first and second conductive line, and electrically couples the first and second active regions.
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公开(公告)号:US11569166B2
公开(公告)日:2023-01-31
申请号:US17123664
申请日:2020-12-16
发明人: Te-Hsin Chiu , Wei-An Lai , Meng-Hung Shen , Wei-Cheng Lin , Jiann-Tyng Tzeng , Kam-Tou Sio
IPC分类号: H01L23/528 , H01L23/522 , H01L21/768
摘要: The present disclosure provides a semiconductor structure, including a substrate, a first metal line over the substrate and extending along a first direction, a protection layer lining a sidewall of the first metal line, a second metal line above the first metal line and extending along the first direction, and a third metal line above the second metal line, extending along a second direction perpendicular to the first direction.
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公开(公告)号:US20230010409A1
公开(公告)日:2023-01-12
申请号:US17370902
申请日:2021-07-08
发明人: Kam-Tou Sio , Jiann-Tyng Tzeng
IPC分类号: H01L23/522 , H01L23/528 , H01L27/092 , H01L29/06 , H01L29/423 , H01L29/786 , H01L21/02 , H01L21/8238 , H01L29/66
摘要: A semiconductor device includes a substrate having a first side and a second side. The semiconductor device on the first side includes: an active region that extends along a first lateral direction and comprises a first sub-region and a second sub-region; a first gate structure that extends along a second lateral direction and is disposed over the active region, with the first and second sub-regions disposed on opposite sides of the first gate structure, wherein the second lateral direction is perpendicular to the first lateral direction; and a first interconnecting structure electrically coupled to the first gate structure. The semiconductor device on the second side includes a second interconnecting structure that is electrically coupled to the first and second sub-regions and configured to provide a power supply. The active region, the first gate structure, the first interconnecting structure, and the second interconnecting structure are collectively configured as a decoupling capacitor.
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公开(公告)号:US20220344258A1
公开(公告)日:2022-10-27
申请号:US17237443
申请日:2021-04-22
发明人: Shih-Wei Peng , Jiann-Tyng Tzeng , Kam-Tou Sio , Wei-Cheng Lin , Wei-An Lai
IPC分类号: H01L23/522 , H01L27/06 , H01L23/528 , H01L27/02
摘要: A monolithic three-dimensional (3D) integrated circuit (IC) device includes a lower tier including a lower tier cell and an upper tier arranged over the lower tier. The upper tier has a first upper tier cell and a second upper tier cell separated by a predetermined lateral space. A monolithic inter-tier via (MIV) extends from the lower tier through the predetermined lateral space, and the MIV has a first end electrically connected to the lower tier cell and a second end electrically connected to the first upper tier cell.
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公开(公告)号:US11444073B2
公开(公告)日:2022-09-13
申请号:US17081807
申请日:2020-10-27
发明人: Kam-Tou Sio , Jiann-Tyng Tzeng , Wei-Cheng Lin
IPC分类号: H01L27/02 , H01L21/84 , H01L27/12 , H03K3/037 , H01L27/118
摘要: An integrated circuit includes a first pair of power rails and a second pair of power rails that are disposed in a first layer, conductive lines disposed in a second layer above the first layer, and a first active area disposed in a third layer above the second layer. The first active area is arranged to overlap the first pair of power rails. The first active area is coupled to the first pair of power rails through a first line of the conductive lines and a first group of vias, and the first active area is coupled to the second pair of power rails through at least one second line of the conductive lines and a second group of vias different from the first group of vias.
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公开(公告)号:US20220238442A1
公开(公告)日:2022-07-28
申请号:US17314897
申请日:2021-05-07
发明人: Kam-Tou Sio , Jiann-Tyng Tzeng
IPC分类号: H01L23/528 , H01L27/088 , G06F30/392 , H01L21/768
摘要: A semiconductor device includes a first active region, disposed on a first side of a substrate, that extends along a first lateral direction. The semiconductor device includes a second active region, disposed on the first side, that extends along the first lateral direction. The first active region has a first conduction type and the second active region has a second conduction type opposite to the first conduction type. The semiconductor device includes a first interconnect structure, formed on a second side of the substrate opposite to the first side, that includes: a first portion extending along the first lateral direction and vertically disposed below the first active region; and a second portion extending along a second lateral direction. The first latera direction is perpendicular to the first lateral direction.
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