公开(公告)号：US07988841B2

公开(公告)日：2011-08-02

申请号：US11531679

申请日：2006-09-13

Applicant: Mario Scurati ,  Torsten Mueller ,  Thomas Schnelle

Inventor： Mario Scurati ,  Torsten Mueller ,  Thomas Schnelle

IPC: B03C5/02

CPC classification number: B03C5/026

Abstract: A plurality of planar electrodes (5) in a microchannel (4) is used for separation, lysis and PCR in a chip (10). Cells from a sample are brought to the electrodes (5). Depending on sample properties, phase pattern, frequency and voltage of the electrodes and flow velocity are chosen to trap target cells (16) using DEP, whereas the majority of unwanted cells (17) flushes through. After separation the target cell (16) are lysed while still trapped. Lysis is carried out by applying RF pulses and/or thermally so as to change the dielectric properties of the trapped cells. After lysis, the target cells (16) are amplified within the microchannel (4), so as to obtain separation, lysis and PCR on same chip (1).

Abstract translation: 微通道（4）中的多个平面电极（5）用于芯片（10）中的分离，裂解和PCR。 来自样品的细胞被带到电极（5）。 根据样品性质，选择电极的相图，频率和电压以及流速，以使用DEP捕获靶细胞（16），而大多数不需要的细胞（17）冲洗通过。 分离后，靶细胞（16）裂解，同时仍被捕获。 通过施加RF脉冲和/或热来进行裂解以改变被捕获的细胞的介电性质。 裂解后，在微通道（4）内扩增靶细胞（16），以在同一芯片（1）上获得分离，裂解和PCR。

公开(公告)号：US07521351B2

公开(公告)日：2009-04-21

申请号：US11172366

申请日：2005-06-30

Applicant: Thomas Mikolajick ,  Torsten Mueller ,  Nicolas Nagel ,  Lars Bach ,  Dominik Olligs ,  Veronika Polei

Inventor： Thomas Mikolajick ,  Torsten Mueller ,  Nicolas Nagel ,  Lars Bach ,  Dominik Olligs ,  Veronika Polei

IPC: H01L21/4763

CPC classification number: H01L21/76816 ,  H01L21/76838 ,  H01L27/115 ,  H01L27/11568

Abstract: A semiconductor product includes, a substrate with a first dielectric layer having contact hole fillings for contacting active areas in the substrate. A second dielectric layer with contact holes is provided therein. The contact holes have a width in a first lateral direction. The product further includes conductive lines, each conductive line passing over contact holes in the second dielectric layer and contacting a plurality of contact hole fillings in the first dielectric layer. The conductive lines have a width, in the first lateral direction, that is smaller than the width of the contact holes of the second dielectric layer. The conductive lines are in direct mechanical contact with the contact hole fillings and thereby remove the need to provide any conventional “contact to interconnect” structures.

Abstract translation: 半导体产品包括具有第一电介质层的衬底，该第一电介质层具有用于接触衬底中的有源区的接触孔填充物。 在其中设置有具有接触孔的第二介质层。 接触孔在第一横向具有宽度。 该产品还包括导线，每个导线穿过第二介电层中的接触孔，并接触第一介电层中的多个接触孔填充物。 导电线在第一横向方向上的宽度小于第二介电层的接触孔的宽度。 导线与接触孔填充物直接机械接触，从而消除了提供任何传统的“接触互连”结构的需要。

公开(公告)号：US20080205294A1

公开(公告)日：2008-08-28

申请号：US11722523

申请日：2005-11-14

Applicant: Andreas Brune ,  Torsten Mueller

Inventor： Andreas Brune ,  Torsten Mueller

IPC: H04L12/28 ,  H04J3/06

CPC classification number: H04J3/0641 ,  H04J3/0679

Abstract: A communications network and corresponding method comprising topology means for detecting the topology of the network means for detecting the timing status of each node and for providing to at least one node of the communications network information on the detected topology of the network and timing status and for selecting a source of timing information on the basis of the information detected.

Abstract translation: 一种通信网络和相应的方法，包括用于检测用于检测每个节点的定时状态的网络装置的拓扑并用于向所述通信网络的至少一个节点提供关于所检测到的网络拓扑和定时状态的信息的拓扑装置， 基于检测到的信息选择定时信息源。

公开(公告)号：US07342807B2

公开(公告)日：2008-03-11

申请号：US11621526

申请日：2007-01-09

Applicant: Torsten Mueller ,  Birgit Seitz ,  Reiner Hausdorf ,  Rudolf Reckziegel

Inventor： Torsten Mueller ,  Birgit Seitz ,  Reiner Hausdorf ,  Rudolf Reckziegel

IPC: H05K7/10 ,  H05K7/14

CPC classification number: H05K7/1425 ,  H05K7/1424 ,  H05K7/1435 ,  H05K7/1461 ,  H05K9/0062

Abstract: The invention relates to a module for a measuring device and to a measuring device. The inventive module for a measuring device is provided with a plug-in contact element for the electrical contact of the plug-and-socket plate of the measuring device which is used for data transfer. Said module for the measuring device comprises a main circuit card arranged in the first circuit card space. Said first circuit card space is formed by at least one first element of the body which encompasses the circuit card in a closed manner on the level of the external periphery thereof.

公开(公告)号：US20070253233A1

公开(公告)日：2007-11-01

申请号：US11393363

申请日：2006-03-30

Applicant: Torsten Mueller ,  Peter Baars ,  Klaus Muemmler ,  Joern Regul ,  Christian Kapteyn

Inventor： Torsten Mueller ,  Peter Baars ,  Klaus Muemmler ,  Joern Regul ,  Christian Kapteyn

IPC: G11C5/02

CPC classification number: H01L27/115 ,  G11C5/063 ,  G11C7/18 ,  G11C8/14 ,  H01L27/11568

Abstract: A device includes an array of memory cells, which are arranged vertically to a main substrate surface. The array is provided with lower bitlines, wordlines and upper bitlines. The lower and upper bitlines are contact-connected to lower source/drain regions and corresponding upper source/drain regions, respectively, in such a manner that a unique addressing of individual memory cells is possible.

Abstract translation: 一种器件包括垂直于主衬底表面布置的存储器单元阵列。 阵列设有较低位线，字线和高位线。 下位线和上位线分别以这样的方式接触连接到下源极/漏极区域和对应的上部源极/漏极区域，使得各个存储器单元的独特寻址是可能的。

公开(公告)号：US20070109755A1

公开(公告)日：2007-05-17

申请号：US11621526

申请日：2007-01-09

Applicant: Torsten Mueller ,  Birgit Seitz ,  Reiner Hausdorf ,  Rudolf Reckziegel

Inventor： Torsten Mueller ,  Birgit Seitz ,  Reiner Hausdorf ,  Rudolf Reckziegel

IPC: H05K7/00

CPC classification number: H05K7/1425 ,  H05K7/1424 ,  H05K7/1435 ,  H05K7/1461 ,  H05K9/0062

Abstract: The invention relates to a module for a measuring device and to a measuring device. The inventive module for a measuring device is provided with a plug-in contact element for the electrical contact of the plug-and-socket plate of the measuring device which is used for data transfer. Said module for the measuring device comprises a main circuit card arranged in the first circuit card space. Said first circuit card space is formed by at least one first element of the body which encompasses the circuit card in a closed manner on the level of the external periphery thereof.

Abstract translation: 本发明涉及一种用于测量装置和测量装置的模块。 用于测量装置的本发明的模块设置有用于数据传输的测量装置的插头和插座板的电接触的插入式接触元件。 所述测量装置的模块包括布置在第一电路卡空间中的主电路卡。 所述第一电路卡空间由主体的至少一个第一元件形成，该第一元件围绕电路卡封闭地在其外周边的水平面上。

公开(公告)号：US20070077748A1

公开(公告)日：2007-04-05

申请号：US11241877

申请日：2005-09-30

Applicant: Dominik Olligs ,  Hocine Boubekeur ,  Veronika Polei ,  Nicolas Nagel ,  Torsten Mueller ,  Lars Bach ,  Thomas Mikolajick ,  Joachim Deppe

Inventor： Dominik Olligs ,  Hocine Boubekeur ,  Veronika Polei ,  Nicolas Nagel ,  Torsten Mueller ,  Lars Bach ,  Thomas Mikolajick ,  Joachim Deppe

IPC: H01L21/4763 ,  H01L21/3205 ,  H01L21/44

CPC classification number: H01L27/115 ,  H01L21/76838 ,  H01L27/11521 ,  H01L27/11568

Abstract: A semiconductor product (1) includes a plurality of wordlines extending along a first lateral direction (x) along a substrate surface (22) and also includes contact structures (3) as well as filling structures (4) therebetween. Along the first direction (x) the contact structures (3) and the filling structures (4) are arranged in alternating order between two respective wordlines. Each contact structure (3) serves to connect two active areas (23) separated by one respective trench isolation filling (24) to a respective bitline (14). Accordingly, the width of the first contact structures (3) is much larger than the width of the bitlines (14) along the first direction (x). According to embodiments of the invention, tapered upper portions (9) of the contact structures (3) are shaped, the upper portions (9) having a width being significantly smaller than the width of the contact structures (3) along the first direction (x). Thereby, forming the bitlines (14) in direct contact to top surfaces (7) of contact structures (3) is possible without the risk of short circuits between adjacent bitlines (14).

Abstract translation: 半导体产品（1）包括沿衬底表面（22）沿着第一横向（x）延伸的多个字线，并且还包括接触结构（3）以及它们之间的填充结构（4）。 沿着第一方向（x），接触结构（3）和填充结构（4）以两个相应字线之间的交替顺序排列。 每个接触结构（3）用于将由一个相应的沟槽隔离填充物（24）分开的两个有效区域（23）连接到相应的位线（14）。 因此，第一接触结构（3）的宽度比沿着第一方向（x）的位线（14）的宽度大得多。 根据本发明的实施例，接触结构（3）的锥形上部（9）成形，上部（9）的宽度明显小于接触结构（3）沿着第一方向（3）的宽度 X）。 因此，形成与接触结构（3）的顶表面（7）直接接触的位线（14）是可能的，而不会在相邻位线（14）之间发生短路。

公开(公告)号：US20060243594A1

公开(公告)日：2006-11-02

申请号：US10523175

申请日：2003-07-28

Applicant: Thomas Schnelle ,  Torsten Mueller ,  Stephen Shirley

Inventor： Thomas Schnelle ,  Torsten Mueller ,  Stephen Shirley

IPC: B03C5/02

CPC classification number: G01N15/1209 ,  G01N2015/1236 ,  G01N2015/1254

Abstract: Described are a method and a measuring device for measuring the impedance in a fluidic microsystem comprising a compartment (10) through which a liquid comprising at least one suspended particle (16) flows, and in which at least one impedance detector (40) is arranged, by means of which for detection of the at least one particle at least one impedance value is acquired which is characteristic for the impedance of the compartment, and which in the presence of the at least one particle changes in a predetermined way, wherein focusing of the at least one particle takes place in a predetermined space relative to the impedance detector, wherein focusing involves a movement of the at least one particle relative to the fluid flowing in the compartment as a result of dielectrophoretic forces, which forces are exerted by means of at least two focusing electrodes (30).

Abstract translation: 描述了一种用于测量流体微系统中的阻抗的方法和测量装置，其包括隔室（10），包括至少一个悬浮颗粒（16）的液体通过该隔室（10）流过，并且其中布置有至少一个阻抗检测器（40） 用于检测至少一个颗粒，获得至少一个阻抗值，该阻抗值是隔室的阻抗的特征，并且在至少一个颗粒的存在下以预定的方式改变，其中聚焦 所述至少一个颗粒相对于所述阻抗检测器发生在预定空间中，其中聚焦涉及所述至少一个颗粒相对于由于介电电泳力而在所述隔室中流动的流体的运动，所述力通过 至少两个聚焦电极（30）。