摘要:
In an active matrix type liquid crystal display apparatus, each of pixel electrodes has overhanging portions at its opposite side edges. These overhanging portions of the pixel electrode cover two signal lines placed on opposite sides of the pixel electrode, respectively.
摘要:
The object of the present invention is to form a low-concentration impurity region with good accuracy in a top gate type TFT. Phosphorus is added to a semiconductor layer by using a pattern made of a conductive film as a mask to form an N-type impurity region in a self-alignment manner. A positive photoresist is applied to a substrate so as to cover the pattern and then is exposed to light applied to the back of the substrate and then is developed, whereby a photoresist 110 is formed. The pattern is etched by using the photoresist pattern as an etching mask to form a gate electrode. A channel forming region, a source region, a drain region, and low-concentration impurity regions, are formed in the semiconductor layer in a self-alignment manner by using the gate electrode as a doping mask.
摘要:
An exposure mask for a liquid crystal display device includes a central exposure area for exposing a first pattern for a liquid crystal display panel area of a substrate and a top exposure area for exposing a second pattern on a top peripheral portion of the substrate, wherein the top exposure area is interconnected to the central exposure area.
摘要:
The present invention relates to a method of forming a pattern on a substrate and a method of manufacturing a liquid crystal display panel using the same. In order to decrease stitch defect, the shot boundary lines for respective layers of patterns do not overlap each other to be dispersed. Specifically, according to a method of forming patterns of the present invention, after a first material layer is first formed on a substrate, a first pattern is formed by performing a first photo etching including divisional light exposure with at least two areas across at least one shot boundary line on the first material layer. Subsequently, after a second material layer is formed on the first pattern, a second pattern is formed by performing a second photo etching including divisional light exposure with at least two areas across at least one shot boundary line on the second material layer. The shot boundary line in the second photo etching is spaced apart from the shot boundary line in the first photo etching. A liquid crystal display panel is manufactured by using this forming method.
摘要:
A mask for fabricating a liquid crystal display with a substrate includes a first mask pattern placed at the center of the substrate with the center line to expose the center of the substrate to light. A second mask pattern is placed to the left of the first mask pattern to expose the left side of the substrate to light. The second mask pattern is spaced apart from the first mask pattern with a first distance. A third mask pattern is placed to the right of the first mask pattern to expose the right side of the substrate to light. The third mask pattern is spaced apart from the first mask pattern with a second distance.
摘要:
In an active matrix type liquid crystal display apparatus, each of pixel electrodes has overhanging portions at its opposite side edges. These overhanging portions of the pixel electrode cover two signal lines placed on opposite sides of the pixel electrode, respectively.
摘要:
In an active matrix type liquid crystal display apparatus, each of pixel electrodes has overhanging portions at its opposite side edges. These overhanging portions of the pixel electrode cover two signal lines placed on opposite sides of the pixel electrode, respectively.
摘要:
An object of the technology of our invention is to solve a luminance defect viewed as a "seam" or the like and to provide a liquid crystal display device having a screen for equally displaying an image. For example, when an exposing process is performed for one conductor layer or a dielectric layer, a total of four photomasks are used corresponding to four shot areas. A light insulation layer of a photomask used for the exposing process for patterning for example a signal line is formed so that it becomes a projection pattern of the signal line. The photomasks corresponding to adjacent shot areas are formed so that patterns of the light insulation layers of the boundary portion are engaged with each other on the plane.
摘要:
A thin film transistor panel comprises a substrate, pixel electrodes arranged on the substrate in a matrix form, TFTs each having a source electrode connected to the associated pixel electrode, gate lines and data lines, both connected to the associated TFTs. An auxiliary electrode connected to the associated gate line and a capacitance compensation electrode are provided in such a manner as to cancel a change in gate-source capacitance caused by an alignment error in the manufacturing process. The capacitance compensation electrode is shifted by the same amount as the shift of the source electrode. When the facing area between the gate electrode and source electrode increases (or decreases) due to an alignment error in the manufacturing process, the facing area between the auxiliary electrode and capacitance compensation electrode decreases (or increases). Therefore, the total gate-source capacitance or the sum of the capacitance between the facing portions of the gate electrode and source electrode and the capacitance between the facing portions of the auxiliary electrode and capacitance compensation electrode is constant regardless of a variation in the position of the source electrode.
摘要:
An improved method for stitching together reticle patterns on a substrate is described. One or more reticles, whose reticle border patterns are to be blended together on the substrate, are provided on an X-Y movable stage in a scanning type exposure system. Each of the reticles has a border pattern which is identical to the border pattern of at least one of the other reticles so that, when the images of these reticles border patterns overlap on the substrate, the overlapping border patterns effectively form a single image on the substrate. To prevent the double exposure of the overlapping border patterns from overexposing the photoresist and to reduce any detrimental effects resulting from misalignment between the overlapping patterns, either a triangular end portion of the scanning source, a filter, or a movable blind is used to partially shade the overlapping border pattern as the UV source is scanned over the border pattern. The graded exposures of the photoresist by the overlapping border patterns combine to fully expose the overlapping border patterns on the substrate. This procedure is continued so as to provide repeated reticle patterns in two dimensions which blend together.