Heterodyne interferometer system
    32.
    发明授权
    Heterodyne interferometer system 失效
    异步干涉仪系统

    公开(公告)号:US4688940A

    公开(公告)日:1987-08-25

    申请号:US710928

    申请日:1985-03-12

    Abstract: A heterodyne interferometer system utilizes a single stabilized frequency linearly polarized laser input beam (18) from a light source (10) which is provided to an acousto-optic device (20) along with a frequency stabilized electrical reference signal (32) from an oscillator (30) for transforming the input beam (18) into a pair of orthogonally polarized beams (40,50) differing in frequency by the reference signal frequency prior to providing these beams (40,50) to a polarization type interferometer (70). A mixing polarizer (60) mixes the beams (46,56) after they traverse the interferometer (70) and provides the mixed beams (62,64) to a photoelectric detector (65) where they are utilized to produce an electrical measurement signal (66). This electrical measurement signal (66) is processed in a phase meter/accumulator (68) along with the reference signal (32) to produce an output signal (80) which is the sum of phase difference on a cycle-by-cycle basis between the measurement signal (66) and the reference signal (32). The phase meter/accumulator (68) includes an analog-to-digital converter (83) and a memory register (92) for the previous cycle, with the measurement resolution being determined by the number of bits of the analog-to-digital converter (83).

    Abstract translation: 外差干涉仪系统利用来自光源(10)的单个稳定频率线性偏振激光输入光束(18),光源(10)连同来自振荡器的频率稳定的电参考信号(32)一起提供给声光器件 (30),用于在将这些光束(40,50)提供给偏振型干涉仪(70)之前将输入光束(18)变换为频率不同的一对正交偏振光束(40,50)与参考信号频率。 混合偏振器(60)在它们穿过干涉仪(70)之后混合光束(46,56),并将混合光束(62,64)提供给光电检测器(65),在光电检测器(65)中,它们被用于产生电测量信号 66)。 该电测量信号(66)与参考信号(32)一起在相位计/累加器(68)中处理,以产生输出信号(80),该输出信号(80)是逐周期的相位差之和, 测量信号(66)和参考信号(32)。 相位计/累加器(68)包括用于前一周期的模拟 - 数字转换器(83)和存储器寄存器(92),其中测量分辨率由模数转换器的位数确定 (83)。

    Process and apparatus for the coherent detection and demodulation of a
phase-modulated carrier wave in a random polarization state
    33.
    发明授权
    Process and apparatus for the coherent detection and demodulation of a phase-modulated carrier wave in a random polarization state 失效
    用于随机偏振状态的相位调制载波的相干检测和解调的过程和装置

    公开(公告)号:US4506388A

    公开(公告)日:1985-03-19

    申请号:US443143

    申请日:1982-11-19

    Abstract: Process for the coherent detection and demodulation of a carrier wave in a variable polarization state and apparatus for performing this process.According to the invention, the incident wave is subdivided into two components having orthogonal polarization states and these two components form the object of a coherent detection. For this purpose, a local oscillator supplies a local wave, which is itself divided into two components having orthogonal polarization states, which supply two detection - demodulation channels. The demodulation signals of these two channels are combined, and in particular added, and the resulting signal makes it possible to recover the information independently of the polarization state of the incident wave.Application to optical transmission.

    Abstract translation: 用于可变偏振状态的载波的相干检测和解调的处理以及用于执行该处理的装置。 根据本发明,入射波被细分为具有正交偏振态的两个分量,这两个分量形成相干检测的对象。 为此,本地振荡器提供本地波,其本身被分成具有正交极化状态的两个分量,其提供两个检测 - 解调信道。 这两个信道的解调信号被组合,特别是相加,并且所得到的信号使得可以独立于入射波的偏振状态恢复信息。 适用于光传输。

    Non-scanned heterodyne imaging sensor
    34.
    发明授权
    Non-scanned heterodyne imaging sensor 失效
    非扫描外差成像传感器

    公开(公告)号:US4417813A

    公开(公告)日:1983-11-29

    申请号:US301265

    申请日:1981-09-11

    CPC classification number: H01S3/08068 G01J9/04 H01S3/082

    Abstract: A non-scanning heterodyne optical imaging sensor which utilizes a multi-frequency coherent light source to provide a plurality of points of different frequencies on a single detector on which the image of an object is also projected. Each point acts as a local oscillator which is sensed/filtered to construct the image of the object without mechanical scanning.

    Abstract translation: 一种非扫描外差光学成像传感器,其利用多频相干光源在单个检测器上提供不同频率的多个点,物体的图像也在其上投影。 每个点用作本地振荡器,其被感测/滤波以在没有机械扫描的情况下构建对象的图像。

    Process and apparatus for sensing defects on a smooth surface
    35.
    发明授权
    Process and apparatus for sensing defects on a smooth surface 失效
    用于感测光滑表面上的缺陷的工艺和设备

    公开(公告)号:US4030830A

    公开(公告)日:1977-06-21

    申请号:US647264

    申请日:1976-01-05

    Applicant: Sandor Holly

    Inventor: Sandor Holly

    CPC classification number: G01M11/005 G01B11/30 G01J9/04 G01N21/8901

    Abstract: Method and apparatus for sensing the effective magnitude and/or number and/or position of individual depression and/or protrusion defects on a high-precision smooth surface of an article which may have said defects randomly distributed and relatively spatially distant each from the other, comprising continuously scanning the surface with a laterally-moving interference fringe pattern adjusted in size to have a cross-sectional area substantially smaller than the surface and no larger than an area which includes about an average predetermined spatial incidence of about one defect per pattern area; adjusting the fringe period to a size substantially larger than the effective cross-sectional dimension of a predetermined, maximum size defect; continuously sensing the AC and DC or AC signal components of the backscattered light; and substantially determining the effective magnitude and/or number and/or surface position of said defects by determining the magnitude of the AC or AC and DC signals obtained at each instantaneous relative position of the fringe pattern and the smooth surface. Said scan can thus provide information as to effective magnitude, number of defects, and topography of the defects on the surface. By the use of appropriate electronics, the information can be recorded and/or displayed.

    Abstract translation: 用于感测物品的高精度光滑表面上的各种凹陷和/或突出缺陷的有效大小和/或数量和/或位置的方法和装置,其可以具有随机分布并且彼此相对空间相对的缺陷, 包括以尺寸调整的横向移动的干涉条纹图案连续扫描所述表面,以使得所述表面的横截面面积基本上小于所述表面,并且不大于包括围绕每个图案区域的大约一个缺陷的平均预定空间入射的区域; 将边缘周期调整到比预定的最大尺寸缺陷的有效截面尺寸大得多的尺寸; 连续感测后向散射光的交流和直流或交流信号分量; 并且通过确定在条纹图案和平滑表面的每个瞬时相对位置处获得的AC或AC和DC信号的大小来基本上确定所述缺陷的有效幅度和/或数量和/或表面位置。 因此,所述扫描可以提供关于表面上的缺陷的有效大小,缺陷数量和形貌的信息。 通过使用适当的电子设备,可以记录和/或显示信息。

    General noise suppression scheme with reference detection in optical heterodyne spectroscopy

    公开(公告)号:US10809128B2

    公开(公告)日:2020-10-20

    申请号:US15941510

    申请日:2018-03-30

    Abstract: A heterodyne optical spectroscopy system comprises a light source that acts as a local oscillator (LO); a beam splitting component that generates a reference beam from the LO; a signal component that generates a sample signal from a sample; a beam blocker that can turn off the sample signal to generate blank shots; a composite signal detection subsystem that detects a heterodyned signal that is a mix of the sample signal and a portion of the LO; a composite reference detection subsystem synchronized to the signal detection subsystem to detect a portion of the reference beam; and a processor that processes digital signals from the signal detection subsystem and the reference detection subsystem. A very versatile reference scheme is developed to treat different heterodyne spectroscopies in a unified way, which achieves optimal noise suppression.

    LASER SYSTEM
    37.
    发明申请
    LASER SYSTEM 审中-公开

    公开(公告)号:US20200295525A1

    公开(公告)日:2020-09-17

    申请号:US16755690

    申请日:2018-10-02

    Abstract: A laser system comprising two phase-locked solid-state laser sources is described. The laser system can be phase-locked at a predetermined offset between the operating frequencies of the lasers. This is achieved with high precision while exhibiting both low noise and high agility around the predetermined offset frequency. A pulse generator can be employed to generate a series of optical pulses from the laser system, the number, duration and shape of which can all be selected by a user. A phase-lock feedback loop provides a means for predetermined frequency chirps and phase shifts to be introduced throughout a sequence of generated pulses. The laser system can be made highly automated. The above features render the laser system ideally suited for use within coherent control two-state quantum systems, for example atomic interferometry, gyroscopes, precision gravimeters gravity gradiometers and quantum information processing and in particular the generation and control of quantum bits.

    WAVEFRONT DETECTOR
    38.
    发明申请
    WAVEFRONT DETECTOR 审中-公开

    公开(公告)号:US20200284661A1

    公开(公告)日:2020-09-10

    申请号:US16763857

    申请日:2018-11-20

    Inventor: Rudolf Saathof

    Abstract: A wavefront detector (100) and method for determining a signal wavefront (Ws) of a signal beam (Ls). A beam combiner (11) is configured to combine the signal beam (Ls) with a reference beam (Lr). An image detector (12) comprising an array of photosensitive pixels (12p) is configured to receive and measure an interference pattern (Wrs) of the combined signal and reference beams (Lr+Ls). A reference light source (14) is configured to generate the reference beam (Lr). A feedback controller (20) is configured to receive an interference signal (IB) based on measurement of at least part of the combined signal and reference beams (Lr+Ls), and control generation of the reference beam (Lr) by a feedback loop based on the interference signal (IB).

    Laser frequency measurement method and device using optical frequency comb

    公开(公告)号:US09995634B2

    公开(公告)日:2018-06-12

    申请号:US14791825

    申请日:2015-07-06

    CPC classification number: G01J9/04 G02F2203/54 H01S3/1305

    Abstract: To measure the frequency of a laser, the frequency of a beat signal that is generated by the interference between an optical frequency comb, used as the reference of measurement, and the laser to be measured is measured. In such a laser frequency measurement using the optical frequency comb, at least one of a repetition frequency and a CEO frequency of the optical frequency comb is changed so that the frequency of the beat signal becomes a predetermined value, and the frequency of the beat signal is measured, so that the frequency of the laser is measured. This allows measurement of the frequency of laser having large frequency variation and low stability.

    Measuring apparatus and measuring method

    公开(公告)号:US09983069B2

    公开(公告)日:2018-05-29

    申请号:US14996197

    申请日:2016-01-14

    Inventor: Kengo Koizumi

    Abstract: A measuring apparatus includes a light source unit configured to generate probe light, a bifurcating unit configured to cause Brillouin backscattered light occurring from the probe light to bifurcate into first light, which propagates through a first optical path, and second light, which propagates through a second optical path, a delay unit configured to delay one of the first light and the second light, an optical multiplexer configured to multiplex the first light and the second light to generate multiplexed light, and a coherent detector configured to perform homodyne detection of the multiplexed light and to output a difference frequency obtained as a result of the detection as a phase-difference signal.

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