Method for authenticating a program and corresponding integrated circuit

    公开(公告)号:US11269986B2

    公开(公告)日:2022-03-08

    申请号:US16660243

    申请日:2019-10-22

    Abstract: A memory stores a program to be executed by a microprocessor. The program includes a first program part and a second program part. An authenticator is configured to authenticate the program and includes a module that is external to the microprocessor and configured to authenticate said first program part when the microprocessor is inactive. The authenticator further activates the microprocessor to execute the first program part and authenticate said second program part using instructions of the first program part if the module has authenticated the first program part. The microprocessor then executes the second program part if the microprocessor has authenticated said second program part.

    INTEGRATED CIRCUIT, METHOD FOR RESETTING AND COMPUTER PROGRAM PRODUCT

    公开(公告)号:US20220066524A1

    公开(公告)日:2022-03-03

    申请号:US17396070

    申请日:2021-08-06

    Abstract: Integrated circuit, method for resetting and computer program product. The integrated circuit comprises a first portion and a second portion. The first portion comprises a reset input configured to receive a reset signal, an activation module connected to the reset input. The activation module is configured to activate the second portion upon reception of the reset signal. The first portion comprises an emissions module configured to emit a replicated reset signal. The second portion can be selectively activated or deactivated. The second portion comprises a reset input configured to receive the replicated reset signal of the emissions module, a determination module configured to determine that an elapsed time starting from the activation of the second portion of the circuit oversteps a threshold.

    INSULATION OF PHASE-CHANGE MEMORY CELLS

    公开(公告)号:US20210408374A1

    公开(公告)日:2021-12-30

    申请号:US17362670

    申请日:2021-06-29

    Inventor: Philippe BOIVIN

    Abstract: Memory devices and methods of manufacturing such devices are provided herein. In at least one embodiment, a memory device includes a plurality of phase-change memory cells. An electrically-insulating layer covers lateral walls of each of the phase-change memory cells, and a thermally-insulating material is disposed on the electrically-insulating layer and covers the lateral walls of the phase-change memory cells.

    Integrated circuit including transistors having a common base

    公开(公告)号:US11211428B2

    公开(公告)日:2021-12-28

    申请号:US16375557

    申请日:2019-04-04

    Inventor: Philippe Boivin

    Abstract: The disclosure relates to integrated circuits including one or more rows of transistors and methods of forming rows of transistors. In an embodiment, an integrated circuit includes a row of bipolar transistors including a first semiconductor layer having a plurality of first conduction regions, a second semiconductor layer having a second conduction region, a common base between the first semiconductor layer and the second semiconductor layer, and a plurality of insulator walls extending in a first direction. The first conduction regions are separated from one another by the insulator walls. The integrated circuit further includes an insulating trench extending in a second direction and in contact with each of the bipolar transistors of the row of bipolar transistors. A conductive layer is coupled to the base, and the conductive layer extends through the insulator walls and extends at least partially into the insulating trench.

    INTEGRATED PHYSICAL UNCLONABLE FUNCTION DEVICE

    公开(公告)号:US20210377058A1

    公开(公告)日:2021-12-02

    申请号:US17329609

    申请日:2021-05-25

    Abstract: An integrated physical unclonable function device includes at least one reference capacitor and a number of comparison capacitors. A capacitance determination circuit operates to determine a capacitance of the at least one reference capacitor and a capacitance of each comparison capacitor. The determined capacitances of the comparison capacitors are then compared to the determined capacitance of the reference capacitor by a comparison circuit. A digital word is then generated with bit values indicative of a result of the comparisons made by the comparison circuit.

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