Multi-mode thermal imaging device and operation method thereof

    公开(公告)号:US11300454B2

    公开(公告)日:2022-04-12

    申请号:US15733806

    申请日:2019-05-22

    Abstract: Disclosed are a multi-mode thermal imaging device and an operation method thereof. According to an embodiment of the present invention, in a first mode, a first sample is scanned with an optical signal from a light source, signals reflected from the first sample by the scanning are detected separately for each wavelength, a reflectance change spectrum according to the wavelength is derived on the basis of the signals detected separately for each wavelength, a wavelength is selected on the basis of the derived reflectance change spectrum, and a thermal image of the first sample is obtained, through a filter, by detecting an optical signal limited to the selected wavelength from among the signals reflected from the first sample. In a second mode, thermal radiation of a second sample is detected to obtain a thermal image of the second sample.

    HELIUM GAS LIQUEFIER AND METHOD FOR LIQUEFYING HELIUM GAS

    公开(公告)号:US20210199377A1

    公开(公告)日:2021-07-01

    申请号:US17126036

    申请日:2020-12-18

    Abstract: Disclosed are a helium gas liquefier and a method for liquefying a helium gas. The disclosed helium gas liquefier includes: a first cooling part including a first cooling column; a first cold head installed on the first cooling column, and a first cylinder in which the first cooling column and the first cold head are built; a second cooling part including a second cooling column, a second cold head installed on the second cooling column, and a second cylinder in which the second cooling column and the second cold head are built; and a liquid helium storage disposed under the second cooling part.

    MASS SPECTROMETRY SYSTEM AND METHOD

    公开(公告)号:US20210090873A1

    公开(公告)日:2021-03-25

    申请号:US16937862

    申请日:2020-07-24

    Abstract: A mass spectrometry system includes a sample holder provided in a vacuum changer and on which a sample is disposed, an irradiator configured to perform sputtering or ionization on the sample, an analyzer configured to analyze an ionized sample generated from the sample by the irradiator, and a controller configured to control the irradiator or the analyzer and perform a first process and a second process. The first process is to determine position information of materials in the sample by irradiating a laser or ion beam to a portion of the sample, and the second process is to irradiate a laser or ion beam of a first output value to another portion of the sample in a section in which the materials in the sample change and irradiate a laser or ion beam of a second output value in other sections.

    Ultra microtome device
    49.
    发明授权

    公开(公告)号:US10935470B2

    公开(公告)日:2021-03-02

    申请号:US16671099

    申请日:2019-10-31

    Abstract: Provided is an ultra microtome device including: a specimen restraint part having a sample holder formed on one side in a length direction, wherein a specimen is mounted on the sample holder; a power part for providing power for implementing a motion of the specimen restraint part; an up and down motion implementing part including a first cam rotated by a force transmitted from the power part and a first shaft for implementing an up and down motion of the specimen restraint part in response to the rotation of the first cam; and a forward and backward motion implementing part including a second cam rotated by the force transmitted from the power part and a second shaft for implementing a forward and backward motion of the specimen restraint part in response to the rotation of the second cam, thereby implementing a more precise motion.

    Microscope apparatus based on laser scanning and operating method thereof

    公开(公告)号:US10761309B2

    公开(公告)日:2020-09-01

    申请号:US16659655

    申请日:2019-10-22

    Abstract: Disclosed is a laser scanning based microscope apparatus including a light source configured to output a laser signal, a scanning unit configured to scan a heating sample with a first laser signal corresponding to a portion of the output laser signal, and output an optical signal reflected from the sample by the scanning to a first detector, the first detector configured to generate a first electrical signal through the reflected optical signal, a second detector configured to generate a second electrical signal through a second laser signal corresponding to a remaining portion of the output laser signal, and a controller configured to acquire a thermal image of the sample by performing a frequency domain analysis based on the first electrical signal and a differential electrical signal.

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