Abstract:
A non-volatile semiconductor memory device and related method of determining a read voltage are disclosed. The non-volatile semiconductor memory device includes; a memory cell array including a plurality of memory cells, a read voltage determination unit configured to determine an optimal read voltage by comparing reference data obtained during a program operation with comparative data obtained during a subsequent read operation and changing a current read voltage to a new read voltage based on a result of the comparison, and a read voltage generation unit configured to generate the new read voltage in response to a read voltage control signal provided by the read voltage determination unit.
Abstract:
A memory device includes a memory cell array, a self interleaver configured to interleave and load data on the fly into a buffer circuit using an interleaving scheme, and a control logic configured to control programming of the interleaved data in the memory cell array.
Abstract:
The memory device selects any one of a first memory cell and a second memory cell based on a number of times that the first memory cell is erased, an elapsed time after the first memory cell is erased, a number of times that the second memory cell is erased, and an elapsed time after the second memory cell is erased, and program data in the selected memory cell. The memory device may improve distribution of threshold voltage of memory cells and endurance of the memory cells.
Abstract:
A 1-bit error correction method is provided. In the method, a variable node at which an error has occurred is detected based on a number of unsatisfied check nodes that do not satisfy a parity condition among check nodes connected to each of variable nodes and an error in a bit corresponding to the detected variable node is corrected.
Abstract:
Provided are data processing methods for a non-volatile memory. The data processing methods include obtaining read data and erasure information from the non-volatile memory and correcting an error in the read data by referencing the erasure information obtained from the non-volatile memory. Memory systems may be provided. Such memory systems may include a non-volatile memory and a memory controller that is operable to perform an error correction operation according to the methods described herein.
Abstract:
A data processing which includes a conversion circuit and a pseudo random number generator including a series connection of plural shift registers. The conversion circuit receives a pseudo random number sequence from an output of one of the plural shift registers excluding a last shift register of the series connection, and converts first data to second data using the received pseudo random number sequence.
Abstract:
The flash memory device includes a control logic circuit and a bit level conversion logic circuit. The control logic circuit programs first through Nth bits of data in a memory cell array of the N-bit MLC flash memory device or reads the first through Nth bits of the data from the memory cell array in response to one of a program command and a read command. The bit level conversion control logic circuit, after the first through Nth bits of the data are completely programmed or read, programs or reads an (N+1)th bit of the data in response to a control signal. The bit level conversion control logic circuit converts voltage levels of voltages, which are used for programming or reading the first through Nth bits of the data, to program or read for 2N cell distributions of 2N+1 cell distributions corresponding to the (N+1)th bit of the data and then programs or reads for other 2N cell distributions.
Abstract:
A method, implemented by at least an error correction code (ECC) decoder and a controller, estimates and corrects errors in memory cells. The method includes identifying a first candidate group of memory cells having an error-generation possibility using a first method for error estimation; identifying a second candidate group of memory cells having an error-generation possibility using a second method for error estimation; and correcting errors in at least one cell commonly included in the first and second candidate groups.
Abstract:
A memory device including a randomizer and a memory system including the memory device are provided. The memory device includes: a randomizer including a sequence generator which generates a first sequence from a seed and a converter which converts the first sequence into a second sequence in response to a conversion factor, the randomizer randomizing data to be programmed using the second sequence and outputting the randomized data; and a storage area which receives the randomized data from the randomizer and storing the randomized data.
Abstract:
A method may be provided to detect and correct data errors in a data system where a data message has been encoded with outer parity bits based on the data message using an outer encoding technique to provide an outer codeword and with inner parity bits based on the outer codeword using an inner encoding technique different than the outer encoding technique to provide an inner codeword. The method may include using the inner parity bits and an inner decoding technique corresponding to the inner encoding technique to perform inner decoding of the inner codeword. Responsive to performing inner decoding of the inner codeword without error, the data message may be extracted from a result of inner decoding the inner codeword without using the outer parity bits to decode the result of inner decoding the inner codeword. Related systems are also discussed.