公开(公告)号：US11177347B2

公开(公告)日：2021-11-16

申请号：US16830783

申请日：2020-03-26

Applicant: GLOBALFOUNDRIES U.S. INC.

Inventor： Judson R. Holt ,  Vibhor Jain ,  Qizhi Liu ,  John J. Pekarik

IPC: H01L29/10 ,  H01L29/08 ,  H01L29/66 ,  H01L29/737 ,  H01L29/16

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to heterojunction bipolar transistors and methods of manufacture. The structure includes a collector region composed of semiconductor material; at least one marker layer over the collector region; a layer of doped semiconductor material which forms an extrinsic base and which is located above the at least one marker layer; a cavity formed in the layer of doped semiconductor material and extending at least to the at least one marker layer; an epitaxial intrinsic base layer of doped material located within the cavity; and an emitter material over the epitaxial intrinsic base layer and within an opening formed by sidewall spacer structures.

公开(公告)号：US11158722B2

公开(公告)日：2021-10-26

申请号：US16730371

申请日：2019-12-30

Applicant: GLOBALFOUNDRIES U.S. INC.

Inventor： Vibhor Jain ,  Steven M. Shank ,  John J. Pekarik ,  Anthony K. Stamper

IPC: H01L29/66 ,  H01L21/762 ,  H01L21/02 ,  H01L29/15 ,  H01L29/16 ,  H01L29/267 ,  H01L29/10

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to transistors with an oxygen lattice structure and methods of manufacture. The structure includes: a sub-collector region in a substrate; a collector region above the substrate; at least one oxygen film separating the sub-collector region and the collector region; an emitter region adjacent to the collector region; and a base region adjacent to the emitter region.

公开(公告)号：US11127831B2

公开(公告)日：2021-09-21

申请号：US16788914

申请日：2020-02-12

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Qizhi Liu ,  Vibhor Jain ,  John J. Pekarik ,  Judson R. Holt

IPC: H01L29/423 ,  H01L21/8238 ,  H01L29/08 ,  H01L29/45 ,  H01L27/092 ,  H01L29/78 ,  H01L29/49

Abstract: Embodiments of the disclosure provide a transistor structure and methods to form the same. The transistor structure may include an active semiconductor region with a channel region between a first source/drain (S/D) region and a second S/D region. A polysilicon gate structure is above the channel region of the active semiconductor region. An overlying gate is positioned on the polysilicon gate structure. A horizontal width of the overlying gate is greater than a horizontal width of the polysilicon gate structure. The transistor structure includes a gate contact to the overlying gate.

公开(公告)号：US11063139B2

公开(公告)日：2021-07-13

申请号：US16748055

申请日：2020-01-21

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Vibhor Jain ,  John J. Pekarik ,  Qizhi Liu ,  Judson Holt

IPC: H01L29/737 ,  H01L29/06 ,  H01L29/66 ,  H01L29/10 ,  H01L29/08

Abstract: Structures for a heterojunction bipolar transistor and methods of forming a structure for a heterojunction bipolar transistor. A collector layer includes an inclined side surface, and a dielectric layer is positioned in a lateral direction adjacent to the inclined side surface of the collector layer. An intrinsic base is disposed over the collector layer, and an emitter is disposed over the intrinsic base. An airgap is positioned between the dielectric layer and the inclined side surface of the collector layer in the lateral direction, and an extrinsic base is positioned in the lateral direction adjacent to the intrinsic base. The extrinsic base is positioned over the airgap.

公开(公告)号：US20210151621A1

公开(公告)日：2021-05-20

申请号：US16686973

申请日：2019-11-18

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Steven M. Shank ,  Vibhor Jain ,  Anthony K. Stamper ,  John J. Ellis-Monaghan ,  John J. Pekarik

IPC: H01L31/074 ,  H01L31/028 ,  H01L31/18

Abstract: Structures including a photodetector and methods of fabricating such structures. The photodetector is positioned over the top surface of the substrate. The photodetector includes a portion of a semiconductor layer comprised of a semiconductor alloy, a p-type doped region in the portion of the semiconductor layer, and an n-type doped region in the portion of the semiconductor layer. The p-type doped region and the n-type doped region converge along a p-n junction. The portion of the semiconductor layer has a first side and a second side opposite from the first side. The semiconductor alloy has a composition that is laterally graded from the first side to the second side of the portion of the semiconductor layer.

公开(公告)号：US11004878B2

公开(公告)日：2021-05-11

申请号：US16544074

申请日：2019-08-19

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Anthony K. Stamper ,  Vibhor Jain ,  Steven M. Shank ,  John J. Ellis-Monaghan ,  John J. Pekarik

IPC: H01L27/144 ,  H01L29/04 ,  H01L29/165 ,  H01L29/737 ,  H01L29/06 ,  H01L29/66 ,  H01L31/02 ,  H01L31/105 ,  H01L31/18 ,  H01L31/0312 ,  G01S7/481 ,  H03F3/08

Abstract: Structures including a photodiode and methods of fabricating such structures. A substrate has a top surface, a well, and a trench extending from the top surface to the well. A photodiode is positioned in the trench. The photodiode includes an electrode that is provided by a first portion of the well. A bipolar junction transistor has an emitter that is positioned over the top surface of the substrate and a subcollector that is positioned below the top surface of the substrate. The subcollector is provided by a second portion of the well.

公开(公告)号：US20210091236A1

公开(公告)日：2021-03-25

申请号：US16790084

申请日：2020-02-13

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Qizhi Liu ,  Vibhor Jain ,  John J. Pekarik ,  Judson R. Holt

IPC: H01L29/808 ,  H01L29/06 ,  H01L29/10 ,  H01L29/66 ,  H01L21/02 ,  H01L21/225 ,  H01L29/08

Abstract: A junction field effect transistor (JFET) structure includes a doped polysilicon gate over a channel region of a semiconductor layer. The doped polysilicon gate has a first doping type. A raised epitaxial source is on the source region of the semiconductor layer and adjacent a first sidewall of the doped polysilicon gate, and has a second doping type opposite the first doping type. A raised epitaxial drain is on the drain region of the semiconductor layer and adjacent a second sidewall of the doped polysilicon gate, and has the second doping type. A doped semiconductor region is within the channel region of the semiconductor layer and extending from the source region to the drain region, and a non-conductive portion of the semiconductor layer is within the channel region to separate the doped semiconductor region from the doped polysilicon gate.