摘要:
A semiconductor device has a first operation mode and a second operation mode in which power supply with a higher voltage value than that in the first operation mode is provided. The semiconductor device includes a memory portion having memory cells for storing data and a power supply circuit portion supplying a first voltage and a second voltage to the memory portion. The memory portion writes or reads data to or from the memory cells based on the first voltage and the second voltage, and the power supply circuit portion provides a smaller voltage difference between the first voltage and the second voltage in the second operation mode as compared with the voltage difference in the first operation mode.
摘要:
The present invention provides a current-limited oscillator capable of performing stable operation even when it is driven with a low power-supply voltage, and a charge pump circuit using the oscillator. A current-limited oscillator has a delay section that includes a plurality of series-connected inverters to delay an output pulse on the basis of a current limiting level indication signal, and the oscillator further includes at least one first transistor that limits a first current between the inverters and a high potential power supply and at least one second transistor that limits a second current between the inverters and a low potential power supply, wherein at least one of the plurality of inverters is configured as a first inverter that is connected with the first transistor and is not connected with the second transistor, and at least another of the plurality of inverters is configured as a second inverter that is not connected with the first transistor and is connected with the second transistor.
摘要:
A voltage for reference at a voltage level higher than a target value is produced from a constant current provided from a constant current generating circuit, and is subjected to resistance division by a resistance division circuit to produce a reference voltage at the target level, and then a final reference voltage is produced by a voltage follower. An internal voltage generating circuit thus provided can generate the reference voltage having the desired voltage level with high accuracy as well as an internal voltage based on the reference voltage by controlling temperature characteristic even with a low power supply voltage.
摘要:
A semiconductor memory device includes a memory cell array, a data bus, a reference voltage generating circuit, a voltage down converter, a VPP generating circuit, a circuit group, and a test circuit. The reference voltage generating circuit, voltage down converter, and VPP generating circuit include thick film transistors having a gate oxide film thickness suitable to a power supply voltage of 3.3 V. Circuits included in the circuit group include thin film transistors having a gate oxide film thickness suitable to a power supply voltage of 1.5 V. The reference voltage generating circuit, voltage down converter, and VPP generating circuit including the thick film transistors are arranged to form units corresponding to the position of the memory cell array.
摘要:
In a voltage down converter, an internal power supply potential can be made equal to an external power supply potential by rendering an output driving transistor included in differential amplifiers conductive in accordance with an activation of a burn-in mode detection signal. The differential amplifiers include a comparison circuit having an output changed to an inactive state in response to the burn-in mode detection signal and a transistor setting a level of a gate voltage of the drive transistor to a fixed level.
摘要:
A semiconductor device includes a constant voltage generation circuit generating a constant voltage commonly to reference voltages corresponding to a plurality of internal voltages. The plurality of reference voltages are generated from the common constant voltage. Thus, the semiconductor device for generating internal voltages is implemented, which allows reduction in layout area and decrease in test time for voltage adjustment.
摘要:
A voltage generation circuit includes a digital type VDC. The digital VDC includes a differential amplify circuit amplifying a voltage deviation of a reference voltage signal from a detection voltage signal to output the amplified voltage to a control node, a signal conversion circuit providing either an H level or an L level according to the voltage level of the control node, and an output transistor connecting an external power supply line and an internal power supply voltage node according to an output voltage of the signal conversion circuit. The center of the range of the varying voltage level of the control node is set by shifting to the logic threshold value of the signal conversion circuit.
摘要:
A voltage generating circuit of the present invention includes a charge pump regulator and a voltage converting circuit. Charge pump regulator receives Ext.Vcc and a ground voltage as inputs and outputs a negative voltage Vbb1. Charge pump regulator receives Int.Vcc and negative voltage Vbb1 as inputs and outputs negative voltage Vbb2(
摘要:
The interlayer capacitance between a first metal interconnection through which a control signal is transmitted to the gate of a drive transistor and respective power supply interconnections through which a power supply potential and a ground potential is supplied is sufficiently smaller than the interlayer capacitance between an interconnection connecting a drain of the drive transistor and the first metal interconnection. The power supply interconnection is not coupled to a signal input to the gate of the drive transistor.
摘要:
In a dynamic random access memory, at a time of body-refresh operation, a bit-line potential VBL is set to a body-refresh-potential VBR, and the body-refresh-potential VBR is supplied to bit-line pairs via a bit-line precharging/equalizing circuit 111c, thereby the charge accumulated in the body of the n channel MOS transistor 72cb in a memory cell is drained to the bit-line pairs.