Patterning process
    41.
    发明授权
    Patterning process 有权
    图案化过程

    公开(公告)号:US08691494B2

    公开(公告)日:2014-04-08

    申请号:US13456705

    申请日:2012-04-26

    IPC分类号: G03F7/26

    CPC分类号: G03F7/0397

    摘要: A negative pattern is formed by applying a resist composition onto a substrate, baking, exposing to high-energy radiation, baking (PEB), and developing the exposed resist film in an organic solvent developer to selectively dissolve the unexposed region of resist film. The resist composition comprising a hydrogenated ROMP polymer and a (meth)acrylate resin displays a high dissolution contrast in organic solvent development, and exhibits high dry etch resistance even when the acid labile group is deprotected through exposure and PEB.

    摘要翻译: 通过将抗蚀剂组合物涂布在基材上,烘烤,暴露于高能量辐射,烘烤(PEB)和在有机溶剂显影剂中曝光的抗蚀剂膜显影以选择性地溶解抗蚀剂膜的未曝光区域,形成负图案。 包含氢化ROMP聚合物和(甲基)丙烯酸酯树脂的抗蚀剂组合物在有机溶剂显影中表现出高的溶解对比度,并且即使当酸不稳定基团通过曝光和PEB脱保护时也显示出高的耐干蚀刻性。

    Polymers, resist compositions and patterning process
    49.
    发明申请
    Polymers, resist compositions and patterning process 有权
    聚合物,抗蚀剂组合物和图案化工艺

    公开(公告)号:US20070148594A1

    公开(公告)日:2007-06-28

    申请号:US11645751

    申请日:2006-12-27

    IPC分类号: G03C1/00

    摘要: A polymer is provided comprising recurring units having formulas (1), (2), (3), (4), (5), and (6) in amounts of 1-60 mol % (1), 1-60 mol % (2), 1-50 mol % (3), 0-60 mol % (4), 0-30 mol % (5), and 0-30 mol % (6), and having a Mw of 3,000-30,000 and a Mw/Mn of 1.5-2.5. R1, R3, R4, R7, R9, and R11 are H or CH3, Y is methylene or O, R2 is CO2R10 when Y is methylene and R2 is H or CO2R10 when Y is O, R10 is C1-C15 alkyl which may be separated by O, R5 and R6 are H or OH, R8 is a tertiary ester type acid-labile protective group, and R12 is OH-containing fluoroalkyl. A resist composition comprising the polymer has a high resolution and is improved in line edge roughness and I/G bias.

    摘要翻译: 提供的聚合物包含具有式(1),(2),(3),(4),(5)和(6)的重复单元,其含量为1-60mol%(1),1-60mol% (2),1-50mol%(3),0-60mol%(4),0-30mol%(5)和0-30mol%(6),Mw为3,000〜 Mw / Mn为1.5-2.5。 R 1,R 3,R 4,R 7,R 9, 和R 11是H或CH 3,Y是亚甲基或O,R 2是CO 2 R 2, 当Y为O时,当Y为亚甲基且R 2为H或CO 2 R 10时,SUP> 10 > 10是C 1 -C 15烷基,其可以被O,R 5和R 6分开, / SUP>是H或OH,R 8是叔酯型酸不稳定保护基,R 12是含OH的氟代烷基。 包含聚合物的抗蚀剂组合物具有高分辨率并且在线边缘粗糙度和I / G偏压方面得到改善。