Semiconductor memory device and test method therefor
    41.
    发明授权
    Semiconductor memory device and test method therefor 失效
    半导体存储器件及其测试方法

    公开(公告)号:US5761141A

    公开(公告)日:1998-06-02

    申请号:US782038

    申请日:1997-01-13

    摘要: A switching circuit for switching a bit line potential VBL of a DRAM to a power supply potential Vcc, an intermediate potential Vcc/2 or the ground potential GND is provided. In normal operation, the bit line potential VBL is set to Vcc/2. In a special write mode, Vcc or GND is applied to all the bit lines through an equalizer, a desired word line is raised to "H" level, and Vcc or GND is written to the storage nodes of all the memory cells connected to the word line. It is possible to write Vcc or GND even to the storage node of a memory cell which has been replaced by a redundant memory cell.

    摘要翻译: 提供了用于将DRAM的位线电位VBL切换到电源电位Vcc,中间电位Vcc / 2或地电位GND的开关电路。 在正常操作中,位线电位VBL被设定为Vcc / 2。 在特殊写入模式下,Vcc或GND通过均衡器施加到所有位线,所需字线上升至“H”电平,Vcc或GND写入连接到所有位线的所有存储单元的存储节点 字线。 可以将Vcc或GND甚至写入由冗余存储单元替换的存储单元的存储节点。

    Semiconductor memory device suitable for high integration
    42.
    发明授权
    Semiconductor memory device suitable for high integration 失效
    半导体存储器件适合高集成度

    公开(公告)号:US5448516A

    公开(公告)日:1995-09-05

    申请号:US301753

    申请日:1994-09-07

    CPC分类号: G11C5/025

    摘要: A chip is divided into at least four regions of two rows and two columns. In each region, memory array blocks are provided between corresponding first control circuits disposed in the column direction at a constant pitch. A column decoder is disposed adjacent to the first control circuit. Second control circuits are disposed corresponding to the first control circuits. The second control circuits excluding the second control circuit on the column decoder side are formed in the same pattern.

    摘要翻译: 芯片被分成至少四行和两列的区域。 在每个区域中,存储器阵列块以恒定的间距设置在列方向上布置的对应的第一控制电路之间。 列解码器被布置为与第一控制电路相邻。 对应于第一控制电路设置第二控制电路。 排列在列解码器侧的第二控制电路的第二控制电路以相同的图案形成。