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57 条记录 (耗时 0.029 秒)

    Cephalosporin hydroxamic acids
    41.
    发明授权
    Cephalosporin hydroxamic acids 失效
    头孢菌素异羟肟酸

    公开(公告)号：US4614797A

    公开(公告)日：1986-09-30

    申请号：US576404

    申请日：1984-02-02

    申请人： Wataru Nagata ,  Tsutomu Aoki ,  Yasuhiro Nishitani

    发明人： Wataru Nagata ,  Tsutomu Aoki ,  Yasuhiro Nishitani

    IPC分类号： A61K31/545 ,  A61K31/546 ,  A61P31/04 ,  C07D501/36 ,  C07D501/57 ,  C07D505/00

    CPC分类号： C07D505/00 ,  Y02P20/55

    摘要： An antibacterial cephalosporin hydroxamic acid derivative represented by the following formula (I), processes for its preparation, compositions containing the same as an active ingredient, and a method for killing bacteria by contacting with said compound. ##STR1## (wherein, R is acyl; R.sup.1 is hydrogen or methoxy; R.sup.2 is alkylene; R.sup.3 is hydrogen, aliphatic group or a hydroxy-protecting group; R.sup.4 is hydrogen or amino-protecting group; R.sup.5 is hydrogen, light metal atom or carboxy-protecting group; and X is oxygen, sulfur, or sulfinyl).

    摘要翻译： 由下式（I）表示的抗菌头孢菌素异羟肟酸衍生物，其制备方法，含有该活性成分的组合物，以及通过与所述化合物接触来杀死细菌的方法。 （I）（I）（其中R为酰基; R 1为氢或甲氧基; R 2为亚烷基; R 3为氢，脂族基或羟基保护基; R 4为氢或氨基保护基; R 5为氢， 金属原子或羧基保护基; X是氧，硫或亚磺酰基）。

    5-Fluorouracil derivatives
    46.
    发明授权
    5-Fluorouracil derivatives 失效
    5-氟尿嘧啶衍生物

    公开(公告)号：US4394505A

    公开(公告)日：1983-07-19

    申请号：US369110

    申请日：1982-04-16

    申请人： Susumu Kamata ,  Wataru Nagata

    发明人： Susumu Kamata ,  Wataru Nagata

    IPC分类号： C07D239/22 ,  A61K31/505 ,  A61K31/535 ,  A61P35/00 ,  C07D239/54 ,  C07D239/553 ,  C07D239/60 ,  C07D498/04 ,  C07F7/18 ,  C07D487/04 ,  C07D513/04

    CPC分类号： C07D239/553 ,  C07D239/60 ,  C07F7/1856

    摘要： Novel 5-fluorouracil derivatives of the following general formula ##STR1## wherein R.sup.1 is hydrogen, C.sub.1 -C.sub.5 alkyl, C.sub.6 -C.sub.10 aryl, C.sub.7 -C.sub.10 aralkyl, C.sub.1 -C.sub.12 alkanoyl, C.sub.2 -C.sub.6 alkoxycarbonyl, C.sub.1 -C.sub.5 alkanoyloxymethyl, carbamoyl or tri-C.sub.1 -C.sub.5 alkylsilyl;R.sup.2 is hydrogen, C.sub.1 -C.sub.5 alkyl, C.sub.6 -C.sub.10 aryl or C.sub.7 -C.sub.10 aralkyl;X is hydrogen, halogen or C.sub.2 -C.sub.6 alkoxycarbonyl;Y is O, NR' (R' is hydrogen or C.sub.1 -C.sub.5 alkyl), S, SO or SO.sub.2 ; andn is an integer of 1-3.which are orally administrable anti-tumor agents.

    摘要翻译： 新的5-氟尿嘧啶衍生物，其通式如下：其中R1是氢，C1-C5烷基，C6-C10芳基，C7-C10芳烷基，C1-C12烷酰基，C2-C6烷氧基羰基，C1-C5烷酰氧基甲基，氨基甲酰基或三C1-C5烷基甲硅烷基 ; R2是氢，C1-C5烷基，C6-C10芳基或C7-C10芳烷基; X是氢，卤素或C 2 -C 6烷氧基羰基; Y是O，NR'（R'是氢或C 1 -C 5烷基），S，SO或SO 2; n为1-3的整数。 其是口服给药的抗肿瘤剂。

    Sample information measuring method and scanning confocal microscope
    48.
    发明授权
    Sample information measuring method and scanning confocal microscope 有权
    样品信息测量方法和扫描共聚焦显微镜

    公开(公告)号：US07205531B2

    公开(公告)日：2007-04-17

    申请号：US10991123

    申请日：2004-11-17

    申请人： Hideo Watanabe ,  Wataru Nagata

    发明人： Hideo Watanabe ,  Wataru Nagata

    IPC分类号： H01J3/14 ,  G02B21/00

    CPC分类号： G02B21/006

    摘要： When irradiating a sample with light from a light source through an object lens, discretely changing a relative position between a beam condensing position of the object lens and the sample in an optical axis direction of the converging beam, obtaining light intensity information from the sample at each relative position, extracting plural pieces of light intensity information from a light intensity information group, estimating a maximum value on a change curve adaptive to the plural pieces of extracted light intensity information and the relative position for the maximum value, and obtaining the estimated maximum value of the light intensity information and relative position as brightness information and height information, these information about the sample can be continuously obtained by discretely performing an iterative operation on the relative position between a beam condensing position of the object lens and the sample in an optical axis direction of the converging beam.

    摘要翻译： 当通过物镜将来自光源的光照射样品时，离散地改变物镜的聚光位置和聚光束的光轴方向上的样品之间的相对位置，从样品中获得光强度信息 每个相对位置，从光强度信息组中提取多个光强度信息，根据多个提取的光强度信息和最大值的相对位置估计适应于变化曲线的最大值，并获得估计的最大值 光强度信息的值和相对位置作为亮度信息和高度信息，关于样本的这些信息可以通过离散地对物镜的光束聚光位置和光学器件的样品之间的相对位置进行迭代操作来连续获得 会聚光束的轴向。

    Semiconductor device inspection system
    49.
    发明授权
    Semiconductor device inspection system 失效
    半导体器件检测系统

    公开(公告)号：US6002792A

    公开(公告)日：1999-12-14

    申请号：US607873

    申请日：1996-02-29

    申请人： Shigehisa Oguri ,  Eiji Inuzuka ,  Kouji Suzuki ,  Wataru Nagata ,  Yasushi Hiruma

    发明人： Shigehisa Oguri ,  Eiji Inuzuka ,  Kouji Suzuki ,  Wataru Nagata ,  Yasushi Hiruma

    IPC分类号： G01N21/95 ,  G01R31/302 ,  G06K9/00

    CPC分类号： G01N21/9501 ,  G01N21/956

    摘要： The present invention relates to an inspection system for transparently taking an image of inside of a semiconductor device to analyze anomalous occurrence. First, image data obtained under infrared ray illumination are converted into a first left-to-right reversed image data in which the obtained image data are reversed left to right and the first left-to-right reversed image data are stored. Next, very weak light emitted from an anomalous portion when the semiconductor device is biased is picked up under no illumination. Then, image data of very weak light is converted into a second left-to-right reversed image data in which the image data of weak light are reversed left to right. The first and second left-to-right image data are superimposed to superimpose the image specifying the anomalous location on an image of chip patterns in the semiconductor device and the superimposed image is displayed. Further, in the infrared-ray epi-irradiation means, an optical filter made of the same material as that of the semiconductor device to be measured is used to form infrared rays for illumination, so that when the back surface of the semiconductor device is irradiated with infrared rays produced by the optical filter, light having a short wavelength which is easily reflected on the surface of the semiconductor device is interrupted and infrared rays having high transmittance against the semiconductor device can be obtined.

    摘要翻译： 本发明涉及一种用于透明地拍摄半导体器件内部的图像以分析异常发生的检查系统。 首先，在红外线照射下获得的图像数据被转换成从左到右反转所获得的图像数据并且存储第一左右颠倒图像数据的第一左右反转图像数据。 接下来，在半导体器件偏置时从异常部分发射的非常弱的光在无照明的情况下被拾取。 然后，非常弱的光的图像数据被转换成其中弱光的图像数据从左到右反转的第二个左至右反转图像数据。 第一和第二左右图像数据被叠加以将指定异常位置的图像叠加在半导体器件中的芯片图案的图像上，并且显示叠加的图像。 此外，在红外线照射装置中，使用与被测量的半导体装置相同的材料制成的滤光器，以形成用于照明的红外线，使得当半导体器件的背面被照射时 利用由滤光器产生的红外线，中断在半导体器件的表面上容易反射的短波长的光，可以获得对半导体器件具有高透射率的红外线。

    Mercaptotetrazolylalkanohydroxamic acids, salts and ester thereof
    50.
    发明授权
    Mercaptotetrazolylalkanohydroxamic acids, salts and ester thereof 失效
    巯基四唑基烷酰氧肟酸，其盐和酯

    公开(公告)号：US4555578A

    公开(公告)日：1985-11-26

    申请号：US493573

    申请日：1983-05-11

    申请人： Wataru Nagata ,  Tsutomu Aoki

    发明人： Wataru Nagata ,  Tsutomu Aoki

    IPC分类号： C08K5/00 ,  A61K31/41 ,  A61P25/30 ,  C07D257/04 ,  C08K5/36

    CPC分类号： C07D257/04 ,  Y02P20/55

    摘要： 5-Mercapto-1H-tetrazole-1-alkanohydroxamic acid, its salts and its esters having the following formula: ##STR1## wherein A is an alkylene group;M is a hydrogen or light metal atom; andR is a hydrogen atom, an alkyl group or a hydroxy-protecting group,and its preparation are disclosed. The compounds are useful as medicines and intermediates.

    摘要翻译： 5-巯基-1H-四唑-1-烷酰氧肟酸，其盐及其酯具有下式：其中A是亚烷基; M是氢或轻金属原子; R是氢原子，烷基或羟基保护基，其制备方法。 该化合物可用作药物和中间体。