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    X-RAY IMAGING REFERENCE SCAN
    41.
    发明申请
    X-RAY IMAGING REFERENCE SCAN 审中-公开

    公开(公告)号：US20200232937A1

    公开(公告)日：2020-07-23

    申请号：US16650220

    申请日：2018-09-21

    申请人： KONINKLIJKE PHILIPS N.V.

    发明人： ANDRIY YAROSHENKO ,  THOMAS KOEHLER ,  PETER BENJAMIN THEODOR NÖEL ,  FABIO DE MARCO ,  LUKAS BENEDICT GROMANN ,  KONSTANTIN WILLER

    IPC分类号： G01N23/041 ,  A61B6/00

    摘要： The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector (26) is arranged opposite an X-ray source (12) across an examination region (30) with a grating arrangement (18) arranged between the X-ray source (12) and the X-ray detector (26). During an imaging operation without an object in the examination region (30) the grating arrangement (18) is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector (26) whilst the X-ray detector (26) remains stationary relative to the examination region (30) such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (26). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device (10′″) with less scanning motions.

    Analyzing grid for phase contrast imaging and/or dark-field imaging
    42.
    发明授权
    Analyzing grid for phase contrast imaging and/or dark-field imaging 有权

    公开(公告)号：US10679762B2

    公开(公告)日：2020-06-09

    申请号：US16307675

    申请日：2017-06-08

    申请人： KONINKLIJKE PHILIPS N.V.

    发明人： Thomas Koehler ,  Roger Steadman Booker ,  Matthias Simon ,  Walter Ruetten ,  Herfried Karl Wieczorek

    IPC分类号： G21K1/02 ,  G01N23/041 ,  A61B6/00

    摘要： The invention relates to an analyzing grid for phase contrast imaging and/or dark-field imaging, a detector arrangement for phase contrast imaging and/or dark-field imaging comprising such analyzing grid, an X-ray imaging system comprising such detector arrangement, a method for manufacturing such analyzing grid, a computer program element for controlling such analyzing grid or detector arrangement for performing such method and a computer readable medium having stored such computer program element. The analyzing grid comprises a number of X-ray converting gratings. The X-ray converting gratings are configured to convert incident X-ray radiation into light or charge. The number of X-ray converting gratings comprises at least a first X-ray converting grating and a second X-ray converting grating. Further, the X-ray converting gratings each comprise an array of grating bars, wherein the grating bars within each X-ray converting grating are arranged mutually displaced from each other in a direction perpendicular to the incident X-ray radiation by a specific displacement pitch. Further, the grating bars of the first X-ray converting grating are arranged mutually displaced from the grating bars of the second X-ray converting grating in the direction perpendicular to the incident X-ray radiation by the displacement pitch divided by the number of X-ray converting gratings.

    Single-shot method for edge illumination X-ray phase-contrast tomography
    43.
    发明授权
    Single-shot method for edge illumination X-ray phase-contrast tomography 有权

    公开(公告)号：US10598612B2

    公开(公告)日：2020-03-24

    申请号：US16467683

    申请日：2018-02-01

    申请人： WASHINGTON UNIVERSITY

    发明人： Mark Anthony Anastasio ,  Yujia Chen ,  Huifeng Guan

    IPC分类号： G01N23/00 ,  G01N23/046 ,  G01N23/041 ,  G06T11/00

    摘要： A method and systems of reconstructing a complex-valued X-ray refractive index distribution of an object having undergone X-ray phase-contrast tomography. The method includes acquiring at least one X-ray image of an object using an edge illumination X-ray phase-contrast tomography (EIXPCT) model, discretizing the model, jointly reconstructing the complex-valued refractive index distribution of the object using penalized least squares estimation of real and imaginary parts of the distribution, and solving the penalized least squares estimation using a batch gradient algorithm.

    Omnidirectional scattering- and bidirectional phase-sensitivity with single shot grating interferometry
    44.
    发明授权
    Omnidirectional scattering- and bidirectional phase-sensitivity with single shot grating interferometry 有权

    公开(公告)号：US10514342B2

    公开(公告)日：2019-12-24

    申请号：US15755215

    申请日：2016-07-20

    申请人： PAUL SCHERRER INSTITUT

    发明人： Matias Kagias ,  Marco Stampanoni ,  Zhentian Wang

    IPC分类号： G01N23/041 ,  A61B6/00 ,  G01N23/20 ,  G01N23/201 ,  G01N23/04 ,  A61B6/03 ,  G02B5/18 ,  G21K1/06

    摘要： X-ray scattering imaging can provide complementary information about the unresolved microstructures of a sample. The scattering signal can be accessed with various methods based on coherent illumination, which span from self-imaging to speckle scanning. The directional sensitivity of the existing methods is limited to a few directions on the imaging plane and it requires the scanning of the optical components, or the rotation of either the sample or the imaging setup, if the full range of possible scattering directions is desired. A new arrangement is provided that allows the simultaneous acquisition of the scattering images in all possible directions in a single shot. This is achieved by a specialized phase grating and a device for recording the generated interference fringe with sufficient spatial resolution. The technique decouples the sample dark-field signal with the sample orientation, which can be crucial for medical and industrial applications.

    RADIATION PHASE CONTRAST IMAGING APPARATUS
    47.
    发明申请
    RADIATION PHASE CONTRAST IMAGING APPARATUS 审中-公开

    公开(公告)号：US20190101496A1

    公开(公告)日：2019-04-04

    申请号：US16046004

    申请日：2018-07-26

    申请人： Shimadzu Corporation

    发明人： Takahiro DOKI ,  Kenji KIMURA ,  Taro SHIRAI ,  Satoshi SANO ,  Akira HORIBA ,  Naoki MORIMOTO ,  Hiroshi MIZUSHIMA

    IPC分类号： G01N23/041

    摘要： A radiation phase contrast imaging apparatus is provided with an image signal generation system including an X-ray source and an image signal detector, a plurality of gratings including a first grating and a second grating, a holder for holding a plurality of gratings in a suspended manner, and a position switching mechanism for switching the relative position of the plurality of gratings with respect to the image signal generation system between the retracted position and the detection position. Either one of the plurality of gratings and the image signal generation system is held by a single holder.

    PHASE CONTRAST X-RAY INTERFEROMETRY
    48.
    发明申请
    PHASE CONTRAST X-RAY INTERFEROMETRY 审中-公开

    公开(公告)号：US20190027265A1

    公开(公告)日：2019-01-24

    申请号：US16044111

    申请日：2018-07-24

    申请人： Joyoni Dey ,  Narayan Bhusal ,  Leslie Butler ,  Jonathan P. Dowling ,  Kyungmin Ham ,  Varshni Singh

    发明人： Joyoni Dey ,  Narayan Bhusal ,  Leslie Butler ,  Jonathan P. Dowling ,  Kyungmin Ham ,  Varshni Singh

    IPC分类号： G21K1/06 ,  G01N23/041

    摘要： A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.