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公开(公告)号:US20230135708A1
公开(公告)日:2023-05-04
申请号:US17965243
申请日:2022-10-13
Applicant: STMicroelectronics International N.V.
Inventor: Praveen Kumar VERMA
IPC: G06F3/06
Abstract: A memory circuit includes an array of memory cells arranged with first word lines connected to a first sub-array storing less significant bits of data and second word lines connected to a second sub-array storing more significant bits of data. A first word line signal is applied to a selected one of the first word lines to read less significant bits from the first sub-array, and a mathematical operation is performed on the read less significant bits to produce modified less significant bits that are written back to the first sub-array. If the read less significant bits are saturated, a second word line signal is applied to a selected one of the second word lines to read more significant bits from the second sub-array, and a mathematical operation is performed on the read more significant bits to produce modified more significant bits that are written back to the second sub-array.
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公开(公告)号:US20230133912A1
公开(公告)日:2023-05-04
申请号:US17515212
申请日:2021-10-29
Applicant: STMICROELECTRONICS APPLICATION GMBH , STMicroelectronics S.r.l. , STMicroelectronics International N.V.
Inventor: Avneep Kumar Goyal , Thomas Szurmant , Misaele Marletti , Alessandro Daolio
IPC: G01R31/317 , G01R31/319 , G01R31/28
Abstract: A trace-data preparation circuit including a filtering circuit to receive traced memory-write data and a First In First Out buffer coupled with the filtering circuit to receive selected memory-write data filtered by the filtering circuit. The trace-data preparation circuit further including a data compression circuit to provide packaging data to a packaging circuit that groups the selected memory-write data.
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公开(公告)号:US20230128466A1
公开(公告)日:2023-04-27
申请号:US17510602
申请日:2021-10-26
Applicant: STMicroelectronics International N.V.
Inventor: Venkata Narayanan SRINIVASAN , Manish SHARMA , Tripti GUPTA
IPC: G01R31/3177 , G06F1/28 , G01R31/317
Abstract: Described herein are integrated circuit chips having test circuitry designed such that independently selectable testing of different power domains using a same scan chain compressor-decompressor circuit may be performed. Also disclosed herein are integrated circuit chips having test circuitry designed such that independently selectable testing of different power domains using multiple different scan chain compressor-decompressor circuits may be performed.
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公开(公告)号:US11610612B2
公开(公告)日:2023-03-21
申请号:US17375149
申请日:2021-07-14
Applicant: STMicroelectronics International N.V.
Inventor: Ashish Kumar , Dipti Arya
Abstract: A row decoder includes decoder logic generating an initial word line signal, and two inverters. The first inverter is formed by a first p-channel transistor having a source coupled to a supply voltage and a gate receiving the initial word line signal. The second inverter is formed by a first n-channel transistor having a drain coupled to a drain of the first p-channel transistor, a source coupled to a shared ground line, and a gate receiving the initial word line signal. An inverse word line signal is generated at the drain of the first n-channel transistor. A second inverter inverts the inverse word line signal to produce a word line signal. Negative bias generation circuitry generates a negative bias voltage on the shared ground line when the initial word line signal is logic high, and otherwise couples the shared ground line to ground.
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公开(公告)号:US20230065623A1
公开(公告)日:2023-03-02
申请号:US17815807
申请日:2022-07-28
Inventor: Vivek Mohan Sharma , Roberto Colombo
Abstract: A processing system includes an error detection circuit configured to receive data bits and ECC bits, calculate further ECC bits as a function of the data bits, and generate a syndrome by comparing the calculated ECC bits with the received ECC bits. When the syndrome corresponds to one of N+K single bit-flip reference syndromes, the error detection circuit asserts a first error signal, and asserts one bit of a bit-flip signature corresponding to a single bit-flip error indicated by the respective single bit-flip reference syndrome.
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公开(公告)号:US20230054364A1
公开(公告)日:2023-02-23
申请号:US17982242
申请日:2022-11-07
Applicant: STMicroelectronics International N.V.
Inventor: Ankur BAL , Sharad GUPTA
Abstract: An estimate of unit current element mismatch error in a digital to analog converter circuit is obtained through a correlation process. Unit current elements of the digital to analog converter circuit are actuated by bits of a thermometer coded signal generated in response to a quantization output signal. A correlation circuit generates the estimates of the unit current element mismatch error from a correlation of a first signal derived from the thermometer coded signal and a second signal derived from the quantization output signal.
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公开(公告)号:US11586907B2
公开(公告)日:2023-02-21
申请号:US16280960
申请日:2019-02-20
Inventor: Surinder Pal Singh , Giuseppe Desoli , Thomas Boesch
Abstract: Embodiments of a device include an integrated circuit, a reconfigurable stream switch formed in the integrated circuit, and an arithmetic unit coupled to the reconfigurable stream switch. The arithmetic unit has a plurality of inputs and at least one output, and the arithmetic unit is solely dedicated to performance of a plurality of parallel operations. Each one of the plurality of parallel operations carries out a portion of the formula: output=AX+BY+C.
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568.
公开(公告)号:US20230050783A1
公开(公告)日:2023-02-16
申请号:US17861384
申请日:2022-07-11
Applicant: STMicroelectronics International N.V.
Inventor: Praveen Kumar VERMA , Harsh RAWAT
IPC: G11C11/419 , G11C11/418
Abstract: A memory array includes memory cells forming a data word location accessed in response to a word line signal. A data sensing circuit configured to sense data on bit lines associated with the memory cells. The sensed data corresponds to a current data word stored at the data word location. A data latching circuit latches the sensed data for the current data word from the data sensing circuit. A data modification circuit then performs a mathematical modify operation on the current data word to generate a modified data word. The modified data word is then applied by a data writing circuit to the bit lines for writing back to the memory cells of the memory array at the data word location. The operations are advantageously performed within a single clock cycle.
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公开(公告)号:US20230018420A1
公开(公告)日:2023-01-19
申请号:US17853026
申请日:2022-06-29
Applicant: STMicroelectronics International N.V.
Inventor: Praveen Kumar VERMA , Promod KUMAR , Harsh RAWAT
IPC: G11C8/20 , G11C11/418
Abstract: A method of corrupting contents of a memory array includes asserting a signal at a reset node to thereby cause starving of current supply to the memory array, and selecting bit lines and complementary bit lines associated with desired columns of the memory array that contain memory cells to have their contents corrupted. For each desired column, a logic state of its bit line and complementary bit line are forced to a same logic state. Each word line associated with desired rows of the memory array that contains memory cells to have their contents corrupted is simultaneously asserted, and then simultaneously deasserted to thereby place each memory cell to have its contents corrupted into a metastable state during a single clock cycle.
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公开(公告)号:US20220416768A1
公开(公告)日:2022-12-29
申请号:US17843780
申请日:2022-06-17
Applicant: STMicroelectronics International N.V.
Inventor: Kailash KUMAR , Manoj KUMAR
IPC: H03K3/012 , H03K3/3565
Abstract: An integrated circuit includes an input pad and a Schmitt trigger coupled to the input pad. The Schmitt trigger includes a main PMOS branch that charges an intermediate node of the Schmitt trigger responsive to voltage transitions at the input node. The Schmitt trigger includes a charging assistance circuit that helps to rapidly charge the intermediate node of the Schmitt trigger. The charging assistance circuit includes a parallel PMOS branch in parallel with the main PMOS branch.
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