LDPC codes and stochastic decoding for optical transmission
    51.
    发明授权
    LDPC codes and stochastic decoding for optical transmission 有权
    用于光传输的LDPC码和随机解码

    公开(公告)号:US08099645B2

    公开(公告)日:2012-01-17

    申请号:US12195525

    申请日:2008-08-21

    Abstract: A method for error correction and a decoder using low density parity check (LDPC) codes includes initializing extrinsic probability information between variable nodes and check nodes in a bipartite graph including generating a Bernoulli sequence according to a probability of a bit having a value one. Parity checking is performed in accordance with a parity check equation. If the parity check equation is not satisfied, then extrinsic information is updated in check nodes from variable nodes using a parity node update logic circuit in a first half iteration, extrinsic information is updated in variable nodes from check nodes using a variable node update logic circuit in a second half iteration, and the variable nodes are updated with a probability based upon the extrinsic information passed between check nodes and variable nodes wherein the probability represents a likelihood that an ith bit is a one. Information bits are passed when the parity check equation is satisfied or a predetermined number of iterations has been reached.

    Abstract translation: 用于纠错的方法和使用低密度奇偶校验(LDPC)码的解码器包括在二分图中的可变节点和校验节点之间初始化外在概率信息,包括根据具有值1的比特的概率生成伯努利序列。 根据奇偶校验方程执行奇偶校验。 如果奇偶校验方程不满足,则在第一半迭代中使用奇偶校验节点更新逻辑电路,从可变节点的校验节点中更新外部信息,使用可变节点更新逻辑电路从校验节点在变量节点中更新外部信息 在第二半迭代中,并且基于在校验节点和可变节点之间传递的外部信息的概率来更新变量节点,其中概率表示第i位是一个的可能性。 当满足奇偶校验等式或达到预定数量的迭代时,信息比特被传递。

    Junction profile engineering using staged thermal annealing
    54.
    发明授权
    Junction profile engineering using staged thermal annealing 有权
    接头型材工程采用分段热退火

    公开(公告)号:US08058134B2

    公开(公告)日:2011-11-15

    申请号:US12618052

    申请日:2009-11-13

    Abstract: An annealing method includes performing an activation annealing on a wafer with a peak temperature of greater than about 1200° C., wherein the activation annealing has a first duration; and performing a defect-recovery annealing on the wafer at a defect-recovery temperature lower than the peak temperature for a second duration. The second duration is longer than the first duration. The annealing method includes no additional annealing steps at temperatures greater than about 1200° C., and no room-temperature cooling step exists between the activation annealing and the defect-recovery annealing.

    Abstract translation: 退火方法包括在峰值温度大于约1200℃的晶片上进行激活退火,其中活化退火具有第一持续时间; 以及在低于所述峰值温度的缺陷恢复温度下对所述晶片进行缺陷恢复退火,持续第二持续时间。 第二个持续时间比第一个持续时间长。 退火方法在大于约1200℃的温度下不包括额外的退火步骤,并且在活化退火和缺陷恢复退火之间不存在室温冷却步骤。

    Photonic filter bank for high-speed analog-to-digital conversion
    59.
    发明授权
    Photonic filter bank for high-speed analog-to-digital conversion 有权
    用于高速模数转换的光子滤波器组

    公开(公告)号:US07973688B2

    公开(公告)日:2011-07-05

    申请号:US12200219

    申请日:2008-08-28

    CPC classification number: G02F7/00

    Abstract: An analog to digital converter (ADC) structure and method includes a photonic filter bank having at least two filters. The at least two filters are configured to create a corresponding spectral tributary from an input signal at a target rate, and the at least two filters are configured to exhibit orthogonality properties between respective tributaries. An optical/electrical (O/E) converter is coupled to each of the at least two filters in a respective spectral tributary to convert an optical input to an electrical output. An analog to digital converter (ADC) is coupled to each of the O/E converters in a respective spectral tributary to sample the electrical output at a fraction of a target rate and to convert a sampled analog electrical output into a digital signal. A synthesis filter is coupled to each of the ADCs in a respective spectral tributary to reconstruct the input signal digitally at the target rate.

    Abstract translation: 模数转换器(ADC)结构和方法包括具有至少两个滤波器的光子滤波器组。 所述至少两个滤波器被配置为以目标速率从输入信号创建相应的频谱支路,并且所述至少两个滤波器被配置为在各个支路之间呈现正交性质。 光/电(O / E)转换器耦合到相应频谱支路中的至少两个滤波器中的每一个,以将光输入转换成电输出。 模数转换器(ADC)被耦合到相应频谱支路中的每个O / E转换器,以一小部分目标速率对电输出进行采样,并将采样的模拟电输出转换为数字信号。 合成滤波器耦合到相应频谱支路中的每个ADC,以目标速率数字地重构输入信号。

    Dummy Pattern Design for Thermal Annealing
    60.
    发明申请
    Dummy Pattern Design for Thermal Annealing 有权
    用于热退火的虚拟样式设计

    公开(公告)号:US20110156149A1

    公开(公告)日:2011-06-30

    申请号:US12651029

    申请日:2009-12-31

    CPC classification number: H01L21/324 H01L27/0207 H01L27/11

    Abstract: The present disclosure provides a semiconductor structure including a semiconductor substrate having a device region and a dummy region adjacent the device region; a plurality of active regions in the device region; and a plurality of dummy active regions in the dummy region, where each of the active regions has a first dimension in a first direction and a second dimension in a second direction perpendicular to the first direction, and the first dimension is substantially greater than the second dimension; and each of the dummy active regions has a third dimension in the first direction and a fourth dimension in the second direction, and the third dimension is substantially greater than the fourth dimension. The plurality of dummy active regions are configured such that thermal annealing effect in the dummy region is substantially equal to that of the device region.

    Abstract translation: 本公开提供了一种半导体结构,其包括具有器件区域和邻近器件区域的虚设区域的半导体衬底; 所述器件区域中的多个有源区; 以及所述虚拟区域中的多个虚拟有源区域,其中所述有源区域中的每一个具有在第一方向上的第一尺寸和与所述第一方向垂直的第二方向上的第二尺寸,并且所述第一尺寸基本上大于所述第二尺寸 尺寸; 并且所述虚拟有源区域中的每一个具有在所述第一方向上的第三尺寸和在所述第二方向上的第四尺寸,并且所述第三尺寸基本上大于所述第四尺寸。 多个虚拟有源区域被配置为使得虚拟区域中的热退火效应基本上等于器件区域的热退火效果。

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