Abstract:
Disclosed is a flash memory device which includes a memory cell array configured to store data, a randomizer configured to generate a random sequence, to interleave the random sequence using at least one of memory parameters associated with data to be programmed in the memory cell array, and a control logic circuit configured to provide the memory parameters to the randomizer and to control the randomizer.
Abstract:
A memory device includes a memory cell array, a self interleaver configured to interleave and load data on the fly into a buffer circuit using an interleaving scheme, and a control logic configured to control programming of the interleaved data in the memory cell array.
Abstract:
A storage device includes a non-volatile memory device outputting read data from a source area and a memory controller configured to execute an ECC operation on a plurality of vectors in the read data and to write the error-corrected read data into target area of the non-volatile memory device. The memory controller declares that a vector corresponding to a clean area is decoding pass without using a flag bit among the plurality of vectors during the error correction operation.
Abstract:
An method of operating a memory system including a nonvolatile memory device and a controller. The method includes receiving a source word, converting the received source word to a codeword, and programming the converted codeword in the nonvolatile memory device. A length of the converted codeword can be greater than a length of the received source word, and a difference between the numbers of first and second digital bits of the converted codeword can be less than a reference value.
Abstract:
A memory device includes a plurality of multi-bit memory cells. A plurality of input data bits are encoded according to an error correction code to generate a codeword including a plurality of groups of bits. Respective ones of the plurality of multi-bit memory cells are programmed to represent respective ones of the groups of bits of the codeword. The groups of bits of the codeword may be groups of consecutive bits. In some embodiments, the multi-bit memory cells are each configured to store in bits and a length of the codeword is an integer multiple of m. Data may be read from the multi-bit memory cells in page units or cell units to recover the codeword, and the recovered code word may be decode according to the error correction code to recover the input data bits.
Abstract:
A method of modifying data sequences in a memory system comprises receiving program data having a first data sequence, and determining whether the received first data sequence matches one of “m” predefined sequences stored in the memory system. The method further comprises replacing the received first data sequence with a replacement sequence upon determining that the received first data sequence matches one of the “m” predefined sequences, and outputting the replacement sequence from the memory system. The replacement sequence typically comprises pattern bits indicating a pattern of the first data sequence and location bits indicating a start location of the first data sequence.
Abstract:
Provided is a data processing method in a semiconductor memory device. The data processing method arranges data, which is to be programmed in a row and column of a nonvolatile memory device, in a row or column direction. The data processing method encodes the programmed data into a modulation code in the row or column direction such that adjacent pairs of memory cells of the nonvolatile memory device are prevented from being programmed into first and second states.
Abstract:
A data storage device receives write data and includes a controller configured to determine a characteristic of the write data and provide a first control signal in response to the determined characteristic, a randomizer configured to selectively randomize or not randomize the write data in response to the first control signal to thereby generate randomized write data, and a data storage unit configured to store the randomized write data.
Abstract:
Provided are data processing methods for a non-volatile memory. The data processing methods include obtaining read data and erasure information from the non-volatile memory and correcting an error in the read data by referencing the erasure information obtained from the non-volatile memory. Memory systems may be provided. Such memory systems may include a non-volatile memory and a memory controller that is operable to perform an error correction operation according to the methods described herein.
Abstract:
The memory device selects any one of a first memory cell and a second memory cell based on a number of times that the first memory cell is erased, an elapsed time after the first memory cell is erased, a number of times that the second memory cell is erased, and an elapsed time after the second memory cell is erased, and program data in the selected memory cell. The memory device may improve distribution of threshold voltage of memory cells and endurance of the memory cells.