公开(公告)号：US4433265A

公开(公告)日：1984-02-21

申请号：US156104

申请日：1980-06-03

Applicant: Helmut Fischer ,  Jurgen Schafer ,  Gunter Thomas

Inventor： Helmut Fischer ,  Jurgen Schafer ,  Gunter Thomas

IPC: H01J61/52 ,  H01J61/34 ,  H01J61/64

CPC classification number: H01J61/52

Abstract: To cool the diaphragm of a spectral discharge lamp having an anode and a cathode between which a discharge is established, which discharge is controlled by the diaphragm, a fluid supply and removal duct is connected to a cooling circuit in or on the diaphragm structure to supply, for example, water to cool the diaphragm. The tube or bulb of the lamp may be in form of a jacketed enclosure through which cooling water is conducted, preferably in the same supply and removal circuit as that for the diaphragm structure.

Abstract translation: 为了冷却具有放电建立的阳极和阴极的光谱放电灯的隔膜，该放电由隔膜控制，流体供应和去除管道连接到隔膜结构中或其上的冷却回路以供应 ，例如水冷却隔膜。 灯的管或灯泡可以是带有外壳的外壳的形式，冷却水通过该外壳被传导，优选地在与隔膜结构相同的供应和移除电路中。

公开(公告)号：US20190025172A1

公开(公告)日：2019-01-24

申请号：US16070597

申请日：2017-01-09

Applicant: Helmut Fischer GmbH Institut für Elektronik und Messtechink

Inventor： Helmut Fischer

IPC: G01N3/46

Abstract: A measuring system for detecting measuring signals during a penetration movement of a penetration body into a surface of a test body, in particular for determining the scratch resistance of the surface of the test body, or during a scanning movement of the penetration body on the surface of the test body, in particular for determining the surface roughness, including a housing with a power generating device, which is operatively connected to a penetration body for generating a displacement movement of the penetration body along a longitudinal axis of the housing, and which actuates a penetration movement of the penetration body into the surface of the test body to be examined, or which positions the penetration body on the surface of the test body for scanning, and having at least one first measuring device for measuring the penetration depth into the surface of the test body or a displacement movement of the penetration body along the longitudinal axis of the housing during a scanning movement on the surface of the test body. The power generating device is actuated by a pressure medium for the penetration movement of the penetration body.

公开(公告)号：US20150226586A1

公开(公告)日：2015-08-13

申请号：US14617349

申请日：2015-02-09

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01D11/30

CPC classification number: G01D11/30 ,  G01B5/061 ,  G01B7/06 ,  G01B7/105

Abstract: A method for electrically activating a measurement stand with a movement of at least one measuring probe (26) from a starting position (31) into a measuring position (32) and also a measurement stand for supporting a measuring probe, in particular for measuring the thickness of thin layers, in which a motor (34) is activated by a control arrangement (25), which moves a ram (23) up and down via a drive arrangement (35), wherein a retainer (24) is provided on the ram (23), to which retainer the measuring probe (26) can be fastened, in which a freewheel is activated between the drive arrangement (35) and the ram (33) as soon as the measuring probe (26) or retainer (23) is set down in the measuring position (32) on an item to be measured (14) and the movement of the drive arrangement (35) is decoupled from the vertical movement of the ram (23), wherein a movement speed of the at least one measuring probe (14) from the starting position (31) into the measuring position (32) is reduced by mechanical damping or electrical damping before the measuring position (32) is reached.

Abstract translation: 一种用于使至少一个测量探针（26）从起始位置（31）移动到测量位置（32）中的电动激活测量台的方法，以及用于支撑测量探针的测量支架，特别是用于测量 薄层的厚度，其中电动机（34）由控制装置（25）启动，其通过驱动装置（35）上下移动压头（23），其中保持器（24）设置在 一旦测量探针（26）或保持器（23）一旦可以将测量探头（26）固定到固定器上的活塞（23），其中在驱动装置（35）和压头（33）之间启动自由轮 ）被放置在待测量物品（14）上的测量位置（32）中，并且驱动装置（35）的运动与压头（23）的垂直运动脱离，其中， 从起始位置（31）到测量位置（32）的至少一个测量探头（14）被我减小 在达到测量位置（32）之前的机械阻尼或电阻尼。

公开(公告)号：US20140203802A1

公开(公告)日：2014-07-24

申请号：US14119953

申请日：2012-05-24

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B7/06

CPC classification number: G01B7/10 ,  G01B7/105 ,  Y10T29/49071

Abstract: The invention relates to a measuring probe for measuring the thickness of thin layers with a housing (14), having at least one sensor element (17), which is received in the housing (14) at least slightly moveably along a longitudinal axis (16) and which comprises at least one winding device (44), which is allocated to the longitudinal axis (16), having a spherical positioning cap (21) facing the outer front face of the housing (14), said cap being arranged in the longitudinal axis (16), wherein the spherical positioning cap (21) has a basic body (55) that has a cylindrical core section (56) and a pol cap (58) arranged on a front face of the core section (56), wherein the winding device (44) is allocated to the spherical positioning cap (21), said winding device being formed from a discoidal or annular carrier (49) with at least one Archimedean coil (51) arranged thereon and with the basic body (55) consisting of a ferritic material and the pol cap consisting of a hard metal.

Abstract translation: 本发明涉及一种用于测量具有壳体（14）的薄层厚度的测量探针，该壳体具有至少一个传感器元件（17），其被容纳在壳体（14）中，沿着纵向轴线（16）至少可微地移动 ），并且其包括分配给纵向轴线（16）的至少一个卷绕装置（44），其具有面向壳体（14）的外前表面的球形定位盖（21），所述盖布置在 纵轴（16），其中所述球形定位盖（21）具有基本体（55），所述基体具有布置在所述芯部（56）的前表面上的圆柱形芯部（56）和极帽（58） 其中所述卷绕装置（44）被分配给所述球形定位盖（21），所述卷绕装置由盘形或环形载体（49）形成，其中至少一个阿弥式线圈（51）布置在其上并具有基体（55 ）由铁素体材料和由硬质金属组成的极帽组成。

公开(公告)号：US08745889B2

公开(公告)日：2014-06-10

申请号：US12724961

申请日：2010-03-16

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B5/02

CPC classification number: G01B7/105 ,  G01B5/0004

Abstract: The invention relates to a measurement stand for holding a measuring probe intended in particular for measuring the thickness of thin layers, and to a method for controlling the measurement stand.

Abstract translation: 本发明涉及一种用于保持特别用于测量薄层厚度的测量探针的测量台，以及一种用于控制测量台的方法。

公开(公告)号：US20140014977A1

公开(公告)日：2014-01-16

申请号：US14001310

申请日：2012-02-24

Applicant: Helmut Fischer ,  Andreas Plössl

Inventor： Helmut Fischer ,  Andreas Plössl

IPC: H01L33/02 ,  H01L31/18 ,  H01L31/02

CPC classification number: H01L33/02 ,  H01L31/02 ,  H01L31/06875 ,  H01L31/18 ,  H01L31/1892 ,  H01L31/1896 ,  H01L33/0079 ,  H01L33/641 ,  H01L2924/0002 ,  H01S5/0217 ,  H01S5/02272 ,  H01S5/02476 ,  Y02E10/544 ,  Y02P70/521 ,  H01L2924/00

Abstract: An optoelectronic semiconductor device includes an optoelectronic semiconductor layer sequence on a metal carrier element, which includes as a first component silver and as a second component a material having a lower coefficient of thermal expansion than silver, wherein the first and second components are intermixed in the metal carrier element.

Abstract translation: 光电半导体器件包括在金属载体元件上的光电子半导体层序列，其包括作为第一组分银和作为第二组分的具有比银更低的热膨胀系数的材料，其中第一和第二组分混合在 金属载体元件。

公开(公告)号：US20100241397A1

公开(公告)日：2010-09-23

申请号：US12724961

申请日：2010-03-16

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B5/06

CPC classification number: G01B7/105 ,  G01B5/0004

Abstract: The invention relates to a measurement stand for holding a measuring probe intended in particular for measuring the thickness of thin layers, and to a method for controlling the measurement stand.

Abstract translation: 本发明涉及一种用于保持特别用于测量薄层厚度的测量探针的测量台，以及一种用于控制测量台的方法。

公开(公告)号：US07448250B2

公开(公告)日：2008-11-11

申请号：US11454486

申请日：2006-06-16

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B21/08 ,  G01B7/06

CPC classification number: G01B7/105

Abstract: The invention relates to a calibration standard, especially for the calibration of devices for the non-destructive measurement of the thickness of thin layers, with a carrier layer (12) consisting of a basic material and a standard (17) applied on the carrier layer (12), said standard having the thickness of the layer to be measured at which the device is to be calibrated, with the carrier layer (12) comprising a plane-parallel measuring surface (16) to its bearing surface (14), that the standard (17) comprises a bearing surface (18) plane-parallel with its measuring surface (19) for bearing on the measuring surface (16) of the carrier layer (12), and that the standard (17) is permanently provided on the carrier layer (12) by means of plating by rubbing.

Abstract translation: 本发明涉及一种校准标准，特别是用于校准用于薄层厚度的非破坏性测量的装置，其中载体层（12）由施加在载体层上的基本材料和标准物（17）组成， （12），所述标准具有要被校准的待测量层的厚度，载体层（12）包括与其支承表面（14）的平面平行的测量表面（16），所述载体层 标准（17）包括与其测量表面（19）平行平行的支承表面（18），用于承载在载体层（12）的测量表面（16）上，并且标准件（17）永久地设置在 载体层（12）通过摩擦电镀。

公开(公告)号：US20080262792A1

公开(公告)日：2008-10-23

申请号：US11664402

申请日：2005-09-30

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G06F17/18

CPC classification number: G05B23/0267 ,  G01D1/14 ,  G05B2219/32195 ,  Y02P90/22

Abstract: The invention relates to a method for emitting measuring values on a display (27) for a display device. According to said method, the measuring values that are recorded by a measuring device (24) on at least one test object (11) are forwarded to a signal processing device; a measuring value is detected at each measuring point (14-21) on the test object (11), or a plurality of measuring values are detected at each measuring point (14-21) on the test object (11); the average value is determined at each measuring point (14-21), from the number of detected measuring values; the average values of the respective measuring points (14-21) on at least one test object (11) are sorted according to the rank thereof in an evaluation device comprising an electronic calculator; and said average values are represented on the display (27) together with an upper and a lower boundary line.

Abstract translation: 本发明涉及一种在显示装置的显示器（27）上发射测量值的方法。 根据所述方法，由至少一个测试对象（11）上的测量设备（24）记录的测量值被转发到信号处理设备; 在测试对象（11）上的每个测量点（14-21）处检测到测量值，或者在测试对象（11）上的每个测量点（14-21）检测到多个测量值; 根据检测到的测量值的数量在每个测量点（14-21）确定平均值; 在包括电子计算器的评估装置中，根据其等级对至少一个测试对象（11）上的相应测量点（14-21）的平均值进行排序; 并且所述平均值与上边界线和下边界线一起在显示器（27）上表示。

公开(公告)号：US07428671B2

公开(公告)日：2008-09-23

申请号：US10452482

申请日：2003-06-02

Applicant: Johann Pfeiffer ,  Helmut Fischer

Inventor： Johann Pfeiffer ,  Helmut Fischer

IPC: G11C29/00 ,  G11C7/00

CPC classification number: G11C29/26 ,  G11C11/401 ,  G11C2029/1206

Abstract: A memory module has a memory cell configuration. For the purpose of testing the memory cell configuration, the memory module has a test structure with at least two test circuits, which are disposed in a distributed fashion on the memory module and are connected to one another via a common test switching bus, which can be connected to an address bus of the memory module via a decoupling circuit during a test operation.

Abstract translation: 存储器模块具有存储单元配置。 为了测试存储器单元配置，存储器模块具有测试结构，其具有至少两个测试电路，它们以分布的方式设置在存储器模块上，并且通过公共测试开关总线彼此连接，这可以 在测试操作期间通过去耦电路连接到存储器模块的地址总线。