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公开(公告)号：US10591539B2
公开(公告)日：2020-03-17
申请号：US16297011
申请日：2019-03-08
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Franco Stellari , Peilin Song
IPC: G01R31/317 , G01R31/311 , G06F17/50
Abstract: A method for automated scan chain diagnostics includes segmenting an image of a device associated with a design layout to allocate pixels to individual design elements, comparing actual emission signatures for the individual design elements to expected emission signatures, and determining whether the actual emission signatures differ from the expected emission signatures by more than a threshold amount to determine if a defect is present.
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公开(公告)号：US20200082054A1
公开(公告)日：2020-03-12
申请号：US16684064
申请日：2019-11-14
Applicant: International Business Machines Corporation
Inventor： Andrea Bahgat Shehata , Peilin Song , Franco Stellari
Abstract: Techniques facilitating integrated circuit identification and reverse engineering are provided. A computer-implemented method can comprise identifying, by a system operatively coupled to a processor, an element within a first elementary cell of one or more elementary cells of an integrated circuit. The method can also comprise matching, by the system, the element with respective elements across the one or more elementary cells including the first elementary cell. The respective elements can be replicas of the element. Further, matching the element with respective elements can be based on a layout analysis of the integrated circuit.
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公开(公告)号：US10521897B2
公开(公告)日：2019-12-31
申请号：US15217074
申请日：2016-07-22
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Andrea Bahgat Shehata , Peilin Song , Franco Stallari
Abstract: A method and apparatus related to developing electromagnetic emission and power models for a target device using photonic emissions thereof are provided. Data of photonic emissions of a target device during a first period of time with the target device in one or more modes is recorded. Data of electromagnetic emissions of the target device during the first period of time with the target device in the one or more modes is also recorded. The recorded data of the photonic emissions and the recorded data of the electromagnetic emissions are correlated to establish one or more electromagnetic emission models for the target device. The one or more electromagnetic emission models enable predictive analysis of emissions by the target device.
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公开(公告)号：US20190353695A1
公开(公告)日：2019-11-21
申请号：US16529398
申请日：2019-08-01
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Raphael P. Robertazzi , Peilin Song , Franco Stellari
Abstract: A method for characterizing an integrated circuit that includes ramping the supply voltage to an integrated circuit as a function of time for each of the transistors in the integrated circuit, and measuring a power supply current for the integrated circuit during the ramping of the power supply voltage. The measured peaks in the power supply current are a current pulse that identifies an operation state in which each of the transistors are in an on state. The peaks in the power supply current are compared to the reference peaks for the power supply current for a reference circuit having a same functionality as the integrated circuit to determine the integrated circuit's fitness.
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公开(公告)号：US10429433B2
公开(公告)日：2019-10-01
申请号：US15354095
申请日：2016-11-17
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Raphael P. Robertazzi , Peilin Song , Franco Stellari
IPC: G01R31/26 , G01R31/30 , G01R31/27 , G01R31/28 , G01R31/311
Abstract: A method for characterizing an integrated circuit that includes ramping the supply voltage to an integrated circuit as a function of time for each of the transistors in the integrated circuit, and measuring a power supply current for the integrated circuit during the ramping of the power supply voltage. The measured peaks in the power supply current are a current pulse that identifies an operation state in which each of the transistors are in an on state. The peaks in the power supply current are compared to the reference peaks for the power supply current for a reference circuit having a same functionality as the integrated circuit to determine the integrated circuit's fitness.
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Patent Agency Ranking
公开(公告)号：US20170067958A1
公开(公告)日：2017-03-09
申请号：US15354095
申请日：2016-11-17
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Raphael P. Robertazzi , Peilin Song , Franco Stellari
CPC classification number: G01R31/2642 , G01R31/2607 , G01R31/2621 , G01R31/275 , G01R31/2855 , G01R31/3004 , G01R31/311
Abstract: A method for characterizing an integrated circuit that includes ramping the supply voltage to an integrated circuit as a function of time for each of the transistors in the integrated circuit, and measuring a power supply current for the integrated circuit during the ramping of the power supply voltage. The measured peaks in the power supply current are a current pulse that identifies an operation state in which each of the transistors are in an on state. The peaks in the power supply current are compared to the reference peaks for the power supply current for a reference circuit having a same functionality as the integrated circuit to determine the integrated circuit's fitness.
Abstract translation: 一种用于表征集成电路的方法，该集成电路包括使集成电路的电源电压随着集成电路中的每个晶体管的时间而变化，并且在电源电压斜坡期间测量集成电路的电源电流 。 电源电流中测量的峰值是识别每个晶体管处于导通状态的操作状态的电流脉冲。 将电源电流中的峰值与用于具有与集成电路相同功能的参考电路的电源电流的参考峰值进行比较，以确定集成电路的适合度。
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公开(公告)号：US20170010322A1
公开(公告)日：2017-01-12
申请号：US15258535
申请日：2016-09-07
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Jifeng Chen , Dirk Pfeiffer , Thomas M. Shaw , Peilin Song , Franco Stellari
IPC: G01R31/28 , G01R31/311
CPC classification number: G01R31/2855 , G01R31/281 , G01R31/2817 , G01R31/2858 , G01R31/2879 , G01R31/311
Abstract: Systems for reliability testing include a picometer configured to measure a leakage current across a device under test (DUT); a camera configured to measure optical emissions from the DUT based on a timing of the measurement of the leakage current; and a test system configured to apply a stress voltage to the DUT and to correlate the leakage current with the optical emissions using a processor to determine a time and location of a defect occurrence within the DUT by locating instances of increased noise in the leakage current that correspond in time with instances of increased optical emissions.
Abstract translation: 用于可靠性测试的系统包括配置成测量被测器件（DUT）上的漏电流的波长计; 配置为基于所述泄漏电流的测量的定时来测量来自所述DUT的光发射的照相机; 以及被配置为向DUT施加应力电压并且使用处理器将泄漏电流与光发射相关联的测试系统，以通过定位泄漏电流中增加的噪声的实例来确定DUT内的缺陷发生的时间和位置， 在时间上对应于增加的光发射的情况。
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公开(公告)号：US09506983B2
公开(公告)日：2016-11-29
申请号：US14687561
申请日：2015-04-15
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Franco Motika , Dirk Pfeiffer , Peilin Song
IPC: G01R31/3177 , G01R31/3185 , G01R31/3183 , G06F7/58 , G06F21/73
CPC classification number: G01R31/3177 , G01R31/318328 , G01R31/318541 , G01R31/318547 , G06F7/588 , G06F21/73
Abstract: Methods and systems for generating a circuit identification number include determining a propagation time delay across a scan chain of known length; comparing the propagation time delay to a threshold associated with the scan chain length; storing an identifier bit based on the result of the comparison; repeating the steps of determining, comparing, and storing until a number of stored identifier bits reaches a threshold number; and outputting the stored identifier bits.
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公开(公告)号：US11879932B2
公开(公告)日：2024-01-23
申请号：US16169699
申请日：2018-10-24
Applicant: International Business Machines Corporation
Inventor： Franco Stellari , Peilin Song , Naigang Wang
IPC: G01R31/28 , G06F21/73 , G06F11/263
CPC classification number: G01R31/2834 , G01R31/2872 , G06F11/263 , G06F21/73
Abstract: Techniques regarding autonomous identification of aged circuits are provided. For example, one or more embodiments described herein can comprise a system, which can comprise a memory that can store computer executable components. The system can also comprise a processor, operably coupled to the memory, and that can execute the computer executable components stored in the memory. The computer executable components can comprise an identification component, operatively coupled to the processor, that can identify an aged circuit by analyzing a current-voltage characteristic curve for a distortion in a sub-threshold quiescent current signature of the aged circuit.
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公开(公告)号：US11538147B2
公开(公告)日：2022-12-27
申请号：US16684507
申请日：2019-11-14
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Andrea Bahgat Shehata , Peilin Song , Franco Stellari
IPC: G06T7/00 , G06F21/56 , H04L9/40 , H04K3/00 , G01R29/08 , G06F30/3312 , G06F21/55 , G06F11/263
Abstract: A method and apparatus related to developing electromagnetic emission and power models for a target device using photonic emissions thereof are provided. Data of photonic emissions of a target device during a first period of time with the target device in one or more modes is recorded. Data of electromagnetic emissions of the target device during the first period of time with the target device in the one or more modes is also recorded. The recorded data of the photonic emissions and the recorded data of the electromagnetic emissions are correlated to establish one or more electromagnetic emission models for the target device. The one or more electromagnetic emission models enable predictive analysis of emissions by the target device.
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