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公开(公告)号：US20220115576A1
公开(公告)日：2022-04-14
申请号：US17418967
申请日：2019-10-10
Applicant: NUCTECH COMPANY LIMITED , Tsinghua University
Inventor： Ziran ZHAO , Yingxin WANG , Meng CHEN , Xuming MA
IPC: H01L37/02
Abstract: A terahertz detector and a method of manufacturing a terahertz detector, wherein the terahertz detector including a substrate (2) and at least one detection unit. Each detection unit includes: a channel material (1) arranged on the substrate, two electrodes (3, 4) respectively in ohmic contact with both ends of the channel material (1) in a longitudinal direction, and a three-dimensional grapheme (5) in direct or indirect thermal contact with the channel material (1).
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52.发明申请公开(公告)号：US20190277999A1
公开(公告)日：2019-09-12
申请号：US16296686
申请日：2019-03-08
Applicant: NUCTECH COMPANY LIMITED
Inventor： Zhiqiang CHEN , Ziran ZHAO , Yuanjing LI , Xilei LUO , Yingkang JIN , Zhimin ZHENG , Wanlong WU , Lingbo QIAO , Wenguo LIU
Abstract: An extensible millimeter wave security inspection system, a security inspection method for a human body using the extensible millimeter wave security inspection system and an extensible millimeter wave scanning unit are disclosed. The extensible millimeter wave security inspection system includes at least one security inspection passage, at least one scanning units are provided on at least one side of two sides of each security inspection passage, each scanning unit includes at least one millimeter wave transceiving module, the millimeter wave transceiving module includes an array of millimeter wave antennas configured to transmit and receive millimeter wave signals and a millimeter wave transceiver associated with the array of millimeter wave antennas, and the millimeter wave transceiving module is arranged to scan by millimeter wave a target to be inspected in the security inspection passage along a direction in which the security inspection passage extends.
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53.发明申请公开(公告)号：US20180196078A1
公开(公告)日：2018-07-12
申请号：US15868878
申请日：2018-01-11
Applicant: NUCTECH COMPANY LIMITED , Tsinghua University
Inventor： Qingjun ZHANG , Yuanjing LI , Ziran ZHAO , Qiufeng MA , Ge LI , Biao CAO , Qi MAO
Abstract: The present invention discloses a wiping-type sample sampling and feeding device, a card reading apparatus, and a gate machine apparatus. The wiping-type sample sampling and feeding device comprises a thermally desorbing portion for analyzing a substance; a wiping-type sampling portion for wiping the substance on a card or certificate and includes a first wheel, a second wheel and a wiping conveyor belt that travels between the first and second wheels along a first direction; and a card/certificate conveyor portion including a card carrying belt configured to convey a card or certificate along a second direction so that the card or certificate can contact with the wiping conveyor belt during conveyance of the card or certificate, thereby the wiping conveyor belt wipes a surface of the card or certificate, wherein the second direction is substantially perpendicular to the first direction.
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公开(公告)号：US20180195979A1
公开(公告)日：2018-07-12
申请号：US15865520
申请日：2018-01-09
Applicant: Nuctech Company Limited , Tsinghua University
Inventor： Qiang LI , Jianping GU , Bin XU , Yaohong LIU , Ziran ZHAO
IPC: G01N23/046 , G01N23/041 , G01V5/00
Abstract: A method for inspecting a container and an inspection device are disclosed. X-ray scanning is performed on the inspected container to obtain a scanned image. The scanned image is processed to obtain a region of interest. Features of texture units included in the region of interest are calculated. Local descriptions of the texture units are formed based on the features of the texture units. Distinction of each local point is calculated from a local description of each of the texture units so as to obtain a local distinct map of the region of interest. It is determined whether there is an article which is secretly carried in the inspected container using the local distinct map.
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公开(公告)号：US20180178415A1
公开(公告)日：2018-06-28
申请号：US15815819
申请日：2017-11-17
Applicant: Nuctech Company Limited
Inventor： Yanchun WANG , Qingjun ZHANG , Yuanjing LI , Zhiqiang CHEN , Ziran ZHAO , Yinong LIU , Yaohong LIU , Nan BAI
CPC classification number: B29C33/0033 , B22F3/14 , B28B3/025 , B30B11/002 , B30B15/026 , C04B35/50 , C04B35/5156 , C04B35/547 , C04B35/645 , C04B2111/807 , C04B2235/3224 , C04B2235/3895 , C04B2235/94 , G01T1/20
Abstract: A mold and a method of manufacturing GOS ceramic scintillator by using the mold are provided. The mold comprises: a female outer sleeve having a cavity disposed inside; a plurality of female blocks disposed inside the cavity, the plurality of female blocks being put together to form a composite structure having a vertical through hole; and a male upper pressing head and a male lower pressing head, wherein each of the male upper pressing head and the male lower pressing head has a shape consistent with that of the vertical through hole. The disclosure may reduce defects of the related art in hot-pressing-sintering such as a mold has a short retirement period and a high material waste, significantly reduce the cost for production of the GOS ceramic scintillator, and significantly improve a process economy.
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Patent Agency Ranking
56.发明申请公开(公告)号：US20180158659A1
公开(公告)日：2018-06-07
申请号：US15786389
申请日：2017-10-17
Applicant: NUCTECH COMPANY LIMITED
Inventor： Qingjun ZHANG , Yuanjing LI , Ziran ZHAO , Weiping ZHU , Nan BAI , Qiufeng MA
Abstract: Embodiments of the present disclosure relate to a preparation and feed apparatus of a standard sample for calibration of a trace-analysis instrument, and especially to a preparation and feed apparatus of a standard sample for calibration of a gas chromatograph-ion mobility spectrometer. When the trace-analysis instrument is being calibrated by taking advantage of the preparation and feed apparatus according to embodiments of the disclosure, it is unnecessary to use an additional dedicated tool and steps to prepare the sample for testing and to use an organic solvent or a dedicated sample application/dispensing tool, resulting in that the trace-analysis instrument is simple and convenient to carry and use, and the substance for calibration is also convenient to store and exchange; moreover, the trace-analysis instrument is also safe, reliable and environmentally friendly.
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公开(公告)号：US20170213331A1
公开(公告)日：2017-07-27
申请号：US15409738
申请日：2017-01-19
Applicant: Nuctech Company Limited
Inventor： Zhiqiang CHEN , Yuanjing LI , Li ZHANG , Ziran ZHAO , Yaohong LIU , Jianping GU , Zhiming WANG
CPC classification number: G06T7/0002 , G06K9/6245 , G06K9/6298 , G06K2009/4695 , G06T3/0056 , G06T5/002 , G06T2207/10116 , G06T2207/20021 , G06T2207/20052 , G06T2207/20076 , G06T2207/20081
Abstract: A method of evaluating an image quality for an imaging system and the imaging system are provided. The method may comprise: acquiring an image to be evaluated which is generated by the imaging system; extracting a plurality of sub-images from the image; obtaining a coefficient vector indicating a degree of sparsity by applying a sparse decomposition on the plurality of sub-images based on a pre-set redundant sparse representation dictionary; and performing a linear transformation on the coefficient vector so as to obtain an evaluation value for the image quality. The sparse dictionary is learned by only using a few high quality perspective images, and then the image quality is evaluated based on the sparse degree of the image which is obtained by using the sparse dictionary, thereby achieving a convenient and rapid no-reference image quality evaluation.
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公开(公告)号：US20170068003A1
公开(公告)日：2017-03-09
申请号：US15258209
申请日：2016-09-07
Applicant: Nuctech Company Limited , TSINGHUA UNIVERSITY
Inventor： Qingjun ZHANG , Yuanjing LI , Zhiqiang CHEN , Ziran ZHAO , Yinong LIU , Yaohong LIU , Xiang ZOU , Huishao HE , Shuwei LI , Jianping CHANG , Wenjian ZHANG
CPC classification number: G01T7/00 , G01J1/0271 , G01J2001/0276
Abstract: The invention discloses a safety inspection detector and a goods safety inspection system. The safety inspection detector at least comprises a circuit board, a first housing, a second housing, a detection module and a connecting interface. The detection module and the connecting interface are mounted on the circuit board. The first housing is pressed and connected to a first surface of the circuit board, and the second housing is pressed and connected to a second surface of the circuit board. The first housing and the second housing can hermetically wrap the detection module and electronic devices on the circuit board, but bypass the connecting interface to realize leading-out and connection with related interconnected cables by utilizing the connecting interface. The housings can be used for sealing and protecting sensitive electronic devices in the detector, thus being moisture proof and preventing interference.
Abstract translation: 本发明公开了一种安全检查检测器和货物安全检查系统。 安全检查检测器至少包括电路板，第一壳体，第二壳体，检测模块和连接接口。 检测模块和连接接口安装在电路板上。 第一壳体被按压并连接到电路板的第一表面，并且第二壳体被按压并连接到电路板的第二表面。 第一壳体和第二壳体可以将检测模块和电子设备封装在电路板上，但绕过连接接口，通过利用连接接口实现与相关互连电缆的导出和连接。 这些外壳可用于密封和保护检测器中敏感的电子设备，从而防潮并防止干扰。
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公开(公告)号：US20160294070A1
公开(公告)日：2016-10-06
申请号：US14246261
申请日：2014-04-07
Applicant: Nuctech Company Limited , Tsinghua University
Inventor： Ziran ZHAO , Zhiqiang CHEN , Yuanjing LI , Wanlong WU , Yinong LIU , Jieqing YANG , Wenguo LIU , Bin SANG , Lei ZHENG
CPC classification number: H01Q21/08 , G03H5/00 , H01Q1/50 , H01Q1/525 , H01Q5/378 , H01Q9/045 , H01Q9/0457 , H01Q13/02 , H01Q21/0081 , H01Q21/065
Abstract: There is provided a wideband patch antenna and an antenna array. The antenna includes a dielectric substrate of a rectangle shape, a radiation patch formed on a top surface of the dielectric substrate, a coupling patch formed on the top surface of the dielectric substrate and extending from a side of the dielectric substrate to a position from the radiation patch by a distance, a metal support arranged on the lower surface of the dielectric substrate and extending from the edge of the lower surface of the dielectric substrate downward to the ground, a layer of air having a predetermined thickness being formed between the lower surface of the dielectric substrate and the ground. According to the embodiments, it is possible to improve the directivity of the wideband microstrip antenna while maintaining its small size.
Abstract translation: 提供了宽带贴片天线和天线阵列。 该天线包括矩形电介质基片，形成在电介质基底的顶表面上的辐射贴片，形成在电介质基底的顶表面上并从电介质基片一侧延伸到从 辐射贴片一段距离，金属支架布置在电介质基片的下表面上并从电介质基底的下表面的边缘向下延伸到地面，具有预定厚度的空气层形成在下表面 的电介质基片和地面。 根据实施例，可以在保持其小尺寸的同时提高宽带微带天线的方向性。
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60.发明申请公开(公告)号：US20160187502A1
公开(公告)日：2016-06-30
申请号：US14981953
申请日：2015-12-29
Applicant: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
Inventor： Kejun KANG , Shuwei LI , Qingjun ZHANG , Yuanjing LI , Yulan LI , Ziran ZHAO , Yinong LIU , Yaohong LIU , Weibin ZHU , Xiaolin ZHAO , Huishao HE
CPC classification number: G01T7/00 , G01T1/1603 , G01T1/17 , G01T1/2006 , G01V5/0016 , G06T1/0014 , G09G2320/0626 , G09G2320/0646 , G21K1/02 , H01L27/30 , H04N5/3698 , H04N5/57 , H05G1/36
Abstract: The present invention discloses an X-ray beam intensity monitoring device and an X-ray inspection system. The X-ray beam intensity monitoring device comprises an intensity detecting module and a data processing module, wherein the intensity detecting module is adopted to be irradiated by the X-ray beam and send a detecting signal, the data processing module is coupled with the intensity detecting module to receive the detecting signal and output an X-ray beam intensity monitoring signal, wherein the X-ray beam intensity monitoring signal includes a dose monitoring signal of the X-ray beam and a brightness correction signal of the X-ray beam. The X-ray beam intensity monitoring device can simultaneously perform dose monitoring and brightness monitoring, thereby improving the service efficiency of the X-ray beam intensity monitoring device. Moreover, the monitoring result of the X-ray beam intensity can be more accurate and reliable.
Abstract translation: 本发明公开了一种X射线束强度监测装置和X射线检查系统。 X射线束强度监测装置包括强度检测模块和数据处理模块，其中强度检测模块被X射线束照射并发送检测信号，数据处理模块与强度 检测模块，用于接收检测信号并输出X射线束强度监测信号，其中X射线束强度监测信号包括X射线束的剂量监测信号和X射线束的亮度校正信号。 X射线束强度监测装置可以同时进行剂量监测和亮度监测，从而提高X射线束强度监测装置的使用效率。 此外，X射线束强度的监测结果可以更准确可靠。
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