摘要:
The invention includes a method of processing a substrate. A substrate is provided within a high-density plasma reactor. A low-density plasma is generated and the substrate is plasma etched under low-density plasma conditions. The invention includes a method of forming a gate stack. A substrate having a plurality of layers is provided. A layer of nitride material is formed over the plurality of layers. The substrate is positioned within a high-density plasma reactor and a composition is flowed into the reactor while maintaining a mass flow within the reactor of at least 200 sccm. A plasma is generated and utilized to etch the nitride material. The invention includes a method of forming a plurality of features over a semiconductive wafer. A layer of nitride material is provided over a wafer surface. The nitride material is etched within a high-density plasma reactor utilizing low-density plasma conditions.
摘要:
Provided is an electrostatic sensing chuck for attracting particles to a portion of a particle contact surface near a deposition electrode, the electrostatic sensing chuck comprising a pixel comprising: a deposition electrode (DE) for selectively establishing an attraction field (Ea) at the particle contact surface; a shield electrode (SE) oppositely biased with respect to the deposition electrode; a charge sensing circuit to measure charge accumulated on each of the deposition electrode and the shield electrode, wherein the charge sensing circuit subtracts a second charge it senses at the shield electrode from a first charge it senses at the deposition electrode, thereby determining accumulated charge at the deposition electrode balanced by accumulated charge at the shield electrode.
摘要:
Provided is, among other things, a dry deposition apparatus for depositing grains on a substrate comprising:an electrostatic chuck having one or more collection zones, wherein the substrate is layered on the chuck for processing;a charged grain delivery apparatus for directing charged grains for electrostatic deposition on the substrate at the locations of the collection zones; andan optical detection device for quantifying the amount of grains deposited.
摘要:
Within an integrated circuit, a contact plug with a height not extending above the level of the gate/wordline nitride is nonetheless provided with a relatively large contact area or landing pad, significantly larger than the source/drain region to which the contact plug is electrically connected. Methods for producing the inventive contact plug include (1) use of a nitride facet etch, either (a) during a nitride spacer formation etch or (b) during a BPSG etch; (2) using at least one of (a) an isotropic photoresist etch or partial descum to narrow BPSG spacers above the gate/wordline nitride, and (b) a nitride step etch to etch the shoulder area of the gate/wordline nitride exposed by a BPSG etch; and (3) polishing a BPSG layer down to the top of a gate/wordline nitride before any doped polysilicon plug fill, masking for BPSG etch and performing a BPSG etch, etching the photoresist layer through a partial descum, and etching the shoulder area of the gate/wordline nitride exposed thereby.
摘要:
An optical fiber cable comprises a stacked plurality of optical fiber ribbons each including a plurality of optical fibers disposed side by side in substantially the same plane and all embedded in a common covering or matrix of the ribbon. A protective outer sheath protects the cable against radial compression loads. Reinforcing members withstand traction loads applied to the cable, which further comprises filler members of a material based on reinforcing fibers and having a coefficient of expansion similar to that of the optical fibers embedded in a connecting matrix. The filler members occupy all or part of a volume delimited by the outside surface of the stacked ribbons and by the inside surface of the outer sheath so that the combination of the stack and the filler members has an external contour in cross-section that is substantially circular. The filler members protect the ribbons against radial and longitudinal loads applied to the cable and oppose contraction of the cable by more than 0.2%.
摘要:
An apparatus for the automated processing of bulk mail which incorporates a number of operating stations that serve to accomplish the various aspects of mail extraction, as well as the subsequent processing of extracted documents, and which are operatively associated with one another to serially process envelopes and extracted documents in continuous fashion and substantially independent of their characteristic features. To this end, the operating stations of the apparatus are configured to be as independent as possible of the characteristics of the envelopes and their contents so that envelopes and contents of varied characteristics can be effectively handled by the apparatus without requiring any significant adjustments. As a result, the apparatus is made capable of processing (as a single job if desired) envelopes and contents of varied characteristics, reducing the need to remove non-conforming envelopes and contents from further processing, and increasing the versatility and productivity of the apparatus.
摘要:
An invention provides an arrangement for accomplishing three objects. The first is correcting distortions caused by probe geometry in probe microscope or profilometer data. The second is calculating apparent probe data from models. The third is deducing the shape of the probe tip from a standard or reference sample. The correction of distorted images data is done by mathematically placing one or more known or hypothetical tip surfaces at one or more points of the distorted image surface to provide a reconstructed surface, which is the envelope surface formed by all such tip surfaces. The calculation of probe microscope image data from one or more mathematical models of sample surfaces is done by mathematically placing one or more known or hypothetical inverted probe tip surface at one or more points on the mathematical model surface, and taking the image surface to be the envelope formed by all such tip surfaces. The deduction of probe tip shape from an image of a known standard or reference surface at one or more points of the image surface, and taking the probe tip surface to be the envelope of all such standard or reference surfaces.
摘要:
An apparatus including: a display including an array of picture elements which are configurable to provide information to a user; a first sensor for sensing force applied to the display by the user, the first sensor comprising a substantially transparent conductive member extending over at least a portion of the array of picture elements and configured to be deformable by the user, the first sensor being configured to provide an output associated with the deformation of the conductive member.
摘要:
A fiber optic cable has at least one fiber and at least one buffer tube surrounding the fiber, with the fiber being loosely held within the buffer tube. A jacket surrounds the tube where the at least one buffer tube is constructed from an extruded transparent polymer, allowing the arrangement of the fiber within the buffer tube to be visible along the entire length of the tube.