公开(公告)号：US08133774B2

公开(公告)日：2012-03-13

申请号：US12411494

申请日：2009-03-26

申请人： Alan B. Botula ,  Alvin J. Joseph ,  Edward J. Nowak ,  Yun Shi ,  James A. Slinkman

发明人： Alan B. Botula ,  Alvin J. Joseph ,  Edward J. Nowak ,  Yun Shi ,  James A. Slinkman

IPC分类号： H01L21/00

CPC分类号： H01L21/84 ,  H01L21/76264 ,  H01L27/1203

摘要： At least one conductive via structure is formed from an interconnect-level metal line through a middle-of-line (MOL) dielectric layer, a shallow trench isolation structure in a top semiconductor layer, and a buried insulator layer to a bottom semiconductor layer. The shallow trench isolation structure laterally abuts at least two field effect transistors that function as a radio frequency (RF) switch. The at least one conductive via structure and the at interconnect-level metal line may provide a low resistance electrical path from the induced charge layer in a bottom semiconductor layer to electrical ground, discharging the electrical charge in the induced charge layer. The discharge of the charge in the induced charge layer thus reduces capacitive coupling between the semiconductor devices and the bottom semiconductor layer, and thus secondary coupling between components electrically disconnected by the RF switch is reduced.

摘要翻译： 至少一个导电通孔结构由通过中间线（MOL）电介质层的互连级金属线，顶部半导体层中的浅沟槽隔离结构和到半导体层的掩埋绝缘体层形成。 浅沟槽隔离结构横向邻接用作射频（RF）开关的至少两个场效应晶体管。 所述至少一个导电通孔结构和所述互连级金属线可以提供从底部半导体层中的感应电荷层到电接地的低电阻电路径，从而对感应电荷层中的电荷进行放电。 感应电荷层中的电荷的放电因此减小了半导体器件与底部半导体层之间的电容耦合，因此降低了由RF开关电断开的部件之间的二次耦合。

公开(公告)号：US07999320B2

公开(公告)日：2011-08-16

申请号：US12342527

申请日：2008-12-23

申请人： Alan B. Botula ,  Alvin J. Joseph ,  Edward J. Nowak ,  Yun Shi ,  James A. Slinkman

发明人： Alan B. Botula ,  Alvin J. Joseph ,  Edward J. Nowak ,  Yun Shi ,  James A. Slinkman

IPC分类号： H01L27/01 ,  H01L27/12

CPC分类号： H01L27/1203 ,  H01L21/743 ,  H01L21/76224 ,  H01L21/76251 ,  H01L21/84

摘要： A doped contact region having an opposite conductivity type as a bottom semiconductor layer is provided underneath a buried insulator layer in a bottom semiconductor layer. At least one conductive via structure extends from an interconnect-level metal line through a middle-of-line (MOL) dielectric layer, a shallow trench isolation structure in a top semiconductor layer, and a buried insulator layer and to the doped contact region. The doped contact region is biased at a voltage that is at or close to a peak voltage in the RF switch that removes minority charge carriers within the induced charge layer. The minority charge carriers are drained through the doped contact region and the at least one conductive via structure. Rapid discharge of mobile electrical charges in the induce charge layer reduces harmonic generation and signal distortion in the RF switch. A design structure for the semiconductor structure is also provided.

摘要翻译： 具有与底部半导体层相反的导电类型的掺杂接触区域设置在底部半导体层中的掩埋绝缘体层的下方。 至少一个导电通孔结构从互连级金属线延伸穿过中间线（MOL）电介质层，顶部半导体层中的浅沟槽隔离结构，以及掩埋绝缘体层和掺杂接触区域。 掺杂接触区域被偏置在处于或接近RF开关中的峰值电压的电压，该电压去除感应电荷层内的少数电荷载流子。 少数电荷载体通过掺杂接触区域和至少一个导电通孔结构排出。 诱导电荷层中的移动电荷的快速放电减少了RF开关中的谐波产生和信号失真。 还提供了用于半导体结构的设计结构。

公开(公告)号：US20100035390A1

公开(公告)日：2010-02-11

申请号：US12188366

申请日：2008-08-08

申请人： Hanyi Ding ,  Kai D. Feng ,  Zhong-Xiang He ,  Zhenrong Jin ,  Xuefeng Liu ,  Yun Shi

发明人： Hanyi Ding ,  Kai D. Feng ,  Zhong-Xiang He ,  Zhenrong Jin ,  Xuefeng Liu ,  Yun Shi

IPC分类号： H01L21/84

CPC分类号： H01L21/84 ,  H01L21/823462 ,  H01L21/823481 ,  H01L27/1203 ,  H01L27/1207

摘要： A first portion of a top semiconductor layer of a semiconductor-on-insulator (SOI) substrate is protected, while a second portion of the top semiconductor layer is removed to expose a buried insulator layer. A first field effect transistor including a gate dielectric and a gate electrode located over the first portion of the top semiconductor layer is formed. A portion of the exposed buried insulator layer is employed as a gate dielectric for a second field effect transistor. In one embodiment, the gate electrode of the second field effect transistor is a remaining portion of the top semiconductor layer. In another embodiment, the gate electrode of the second field effect transistor is formed concurrently with the gate electrode of the first field effect transistor by deposition and patterning of a gate electrode layer.

摘要翻译： 保护绝缘体上半导体（SOI）衬底的顶部半导体层的第一部分，同时去除顶部半导体层的第二部分以暴露掩埋的绝缘体层。 形成包括位于顶部半导体层的第一部分上方的栅极电介质和栅电极的第一场效应晶体管。 暴露的掩埋绝缘体层的一部分用作第二场效应晶体管的栅极电介质。 在一个实施例中，第二场效应晶体管的栅电极是顶部半导体层的剩余部分。 在另一个实施例中，第二场效应晶体管的栅极通过栅极电极层的沉积和图案化与第一场效应晶体管的栅电极同时形成。

公开(公告)号：US20080002851A1

公开(公告)日：2008-01-03

申请号：US11418821

申请日：2006-05-08

申请人： Yun Shi ,  Guorong Xuan

发明人： Yun Shi ,  Guorong Xuan

IPC分类号： G06T1/00 ,  G06K9/00

CPC分类号： G06T1/0028 ,  G06T2201/0052 ,  G06T2201/0083 ,  G06T2201/0203

摘要： Embodiments related to data hiding using wavelet transforms and histogram shifting are disclosed.

摘要翻译： 公开了与使用小波变换和直方图转换的数据隐藏有关的实施例。

公开(公告)号：US08586423B2

公开(公告)日：2013-11-19

申请号：US13168232

申请日：2011-06-24

申请人： Renata Camillo-Castillo ,  Erik M. Dahlstrom ,  Robert J. Gauthier, Jr. ,  Ephrem G. Gebreselasie ,  Richard A. Phelps ,  Yun Shi ,  Andreas Stricker

发明人： Renata Camillo-Castillo ,  Erik M. Dahlstrom ,  Robert J. Gauthier, Jr. ,  Ephrem G. Gebreselasie ,  Richard A. Phelps ,  Yun Shi ,  Andreas Stricker

IPC分类号： H01L21/02

CPC分类号： H01L29/7315 ,  G06F17/5063 ,  H01L27/0262 ,  H01L29/66393 ,  H01L29/7436

摘要： Device structures, fabrication methods, operating methods, and design structures for a silicon controlled rectifier. The method includes applying a mechanical stress to a region of a silicon controlled rectifier (SCR) at a level sufficient to modulate a trigger current of the SCR. The device and design structures include a SCR with an anode, a cathode, a first region, and a second region of opposite conductivity type to the first region. The first and second regions of the SCR are disposed in a current-carrying path between the anode and cathode of the SCR. A layer is positioned on a top surface of a semiconductor substrate relative to the first region and configured to cause a mechanical stress in the first region of the SCR at a level sufficient to modulate a trigger current of the SCR.

公开(公告)号：US08492866B1

公开(公告)日：2013-07-23

申请号：US13345881

申请日：2012-01-09

申请人： Frederick G. Anderson ,  Natalie B. Feilchenfeld ,  David L. Harmon ,  Richard A. Phelps ,  Yun Shi ,  Michael J. Zierak

发明人： Frederick G. Anderson ,  Natalie B. Feilchenfeld ,  David L. Harmon ,  Richard A. Phelps ,  Yun Shi ,  Michael J. Zierak

IPC分类号： H01L29/861 ,  H01L31/107 ,  H01L29/30 ,  H01L29/866 ,  H01L29/34 ,  H01L29/74 ,  H01L31/111 ,  H01L29/73 ,  H01L29/739 ,  H01L31/0328 ,  H01L31/0336 ,  H01L31/072 ,  H01L31/109 ,  H01L29/00 ,  H01L29/864

CPC分类号： H01L29/866 ,  H01L21/76 ,  H01L21/76283 ,  H01L27/0255 ,  H01L29/66106

摘要： Disclosed is a Zener diode having a scalable reverse-bias breakdown voltage (Vb) as a function of the position of a cathode contact region relative to the interface between adjacent cathode and anode well regions. Specifically, cathode and anode contact regions are positioned adjacent to corresponding cathode and anode well regions and are further separated by an isolation region. However, while the anode contact region is contained entirely within the anode well region, one end of the cathode contact region extends laterally into the anode well region. The length of this end can be predetermined in order to selectively adjust the Vb of the diode (e.g., increasing the length reduces Vb of the diode and vice versa). Also disclosed are an integrated circuit, incorporating multiple instances of the diode with different reverse-bias breakdown voltages, a method of forming the diode and a design structure for the diode.

摘要翻译： 公开了一种齐纳二极管，其具有作为阴极接触区域相对于相邻阴极和阳极阱区域之间的界面的位置的函数的可分级反向偏压击穿电压（Vb）。 具体地，阴极和阳极接触区域被定位成与相应的阴极和阳极阱区域相邻，并进一步被隔离区域分离。 然而，当阳极接触区域完全包含在阳极阱区域内时，阴极接触区域的一端横向延伸到阳极阱区域中。 为了选择性地调节二极管的Vb（例如，增加长度减小二极管的Vb，反之亦然），可以预定该端的长度。 还公开了一种集成电路，其结合具有不同反向偏压击穿电压的二极管的多个实例，形成二极管的方法和二极管的设计结构。

公开(公告)号：US20120319229A1

公开(公告)日：2012-12-20

申请号：US13596410

申请日：2012-08-28

申请人： Alan B. Botula ,  Beth Ann Rainey ,  Yun Shi

发明人： Alan B. Botula ,  Beth Ann Rainey ,  Yun Shi

IPC分类号： H01L27/12

CPC分类号： H01L27/1203 ,  H01L21/743 ,  H01L29/2003

摘要： Integrated circuits having doped bands in a substrate and beneath high-voltage semiconductor-on-insulator (SOI) devices are provided. In one embodiment, the invention provides an integrated circuit comprising: a semiconductor-on-insulator (SOI) wafer including: a substrate; a buried oxide (BOX) layer atop the substrate; and a semiconductor layer atop the BOX layer; a plurality of high voltage (HV) devices connected in series within the semiconductor layer; a doped band within the substrate and below a first of the plurality of HV devices; and a contact extending from the semiconductor layer and through the BOX layer to the doped band.

摘要翻译： 提供了在衬底中和在绝缘体上绝缘体（SOI）器件上的高压绝缘体（SOI）器件下面具有掺杂带的集成电路。 在一个实施例中，本发明提供一种集成电路，包括：绝缘体上半导体（SOI）晶片，其包括：基板; 衬底上的掩埋氧化物（BOX）层; 以及位于BOX层顶部的半导体层; 在半导体层内串联连接的多个高压（HV）器件; 在所述衬底内并在所述多个HV器件中的第一个之下的掺杂带; 以及从半导体层和BOX层延伸到掺杂带的接触。

公开(公告)号：US20120284111A1

公开(公告)日：2012-11-08

申请号：US13098794

申请日：2011-05-02

申请人： Yun Shi ,  Haik E. Babaian ,  Dong Chen ,  Anand Edwin

发明人： Yun Shi ,  Haik E. Babaian ,  Dong Chen ,  Anand Edwin

IPC分类号： G06Q30/00

CPC分类号： G06Q30/0241

摘要： A graphical user interface for displaying internet advertising metrics and comparisons of internet advertising metrics is provided. The graphical user interface comprises a trending display area that displays a plurality of trending graphs in the same viewable area. Each trending graph displays a different internet advertising metric and is configured to display a plurality of internet advertising trending comparisons. As well, a detail display area displays a detail view of at least one of the trending graphs. The detail view is in the same viewable area as the plurality of trending graphs.

摘要翻译： 提供了一种用于显示互联网广告指标和互联网广告指标比较的图形用户界面。 图形用户界面包括在同一可视区域中显示多个趋势图的趋势显示区域。 每个趋势图显示不同的互联网广告指标，并被配置为显示多个互联网广告趋势比较。 同样，细节显示区域显示至少一个趋势图的详细视图。 细节视图与多个趋势图在同一可视区域。

公开(公告)号：US20120104496A1

公开(公告)日：2012-05-03

申请号：US13345871

申请日：2012-01-09

申请人： Alan B. Botula ,  Alvin J. Joseph ,  Edward J. Nowak ,  Yun Shi ,  James A. Slinkman

发明人： Alan B. Botula ,  Alvin J. Joseph ,  Edward J. Nowak ,  Yun Shi ,  James A. Slinkman

IPC分类号： H01L27/088 ,  G06F17/50

CPC分类号： H01L21/84 ,  H01L21/76264 ,  H01L27/1203

摘要： At least one conductive via structure is formed from an interconnect-level metal line through a middle-of-line (MOL) dielectric layer, a shallow trench isolation structure in a top semiconductor layer, and a buried insulator layer to a bottom semiconductor layer. The shallow trench isolation structure laterally abuts at least two field effect transistors that function as a radio frequency (RF) switch. The at least one conductive via structure and the at interconnect-level metal line may provide a low resistance electrical path from the induced charge layer in a bottom semiconductor layer to electrical ground, discharging the electrical charge in the induced charge layer. The discharge of the charge in the induced charge layer thus reduces capacitive coupling between the semiconductor devices and the bottom semiconductor layer, and thus secondary coupling between components electrically disconnected by the RF switch is reduced.

摘要翻译： 至少一个导电通孔结构由通过中间线（MOL）电介质层的互连级金属线，顶部半导体层中的浅沟槽隔离结构和到半导体层的掩埋绝缘体层形成。 浅沟槽隔离结构横向邻接用作射频（RF）开关的至少两个场效应晶体管。 所述至少一个导电通孔结构和所述互连级金属线可以提供从底部半导体层中的感应电荷层到电接地的低电阻电路径，从而对感应电荷层中的电荷进行放电。 感应电荷层中的电荷的放电因此减小了半导体器件与底部半导体层之间的电容耦合，因此降低了由RF开关电断开的部件之间的二次耦合。

公开(公告)号：US08120110B2

公开(公告)日：2012-02-21

申请号：US12188381

申请日：2008-08-08

申请人： Hanyi Ding ,  Kai D. Feng ,  Zhong-Xiang He ,  Zhenrong Jin ,  Xuefeng Liu ,  Yun Shi

发明人： Hanyi Ding ,  Kai D. Feng ,  Zhong-Xiang He ,  Zhenrong Jin ,  Xuefeng Liu ,  Yun Shi

IPC分类号： H01L27/12

CPC分类号： H01L27/088 ,  H01L21/823462 ,  H01L21/823481 ,  H01L27/1207

摘要： A first field effect transistor includes a gate dielectric and a gate electrode located over a first portion of a top semiconductor layer in a semiconductor-on-insulator (SOI) substrate. A second field effect transistor includes a portion of a buried insulator layer and a source region and a drain region located underneath the buried insulator layer. In one embodiment, the gate electrode of the second field effect transistor is a remaining portion of the top semiconductor layer. In another embodiment, the gate electrode of the second field effect transistor is formed concurrently with the gate electrode of the first field effect transistor by deposition and patterning of a gate electrode layer. The first field effect transistor may be a high performance device and the second field effect transistor may be a high voltage device. A design structure for the semiconductor structure is also provided.

摘要翻译： 第一场效应晶体管包括栅极电介质和位于绝缘体上半导体（SOI））衬底中顶部半导体层的第一部分上方的栅电极。 第二场效应晶体管包括掩埋绝缘体层的一部分和位于掩埋绝缘体层下方的源区和漏区。 在一个实施例中，第二场效应晶体管的栅电极是顶部半导体层的剩余部分。 在另一个实施例中，第二场效应晶体管的栅极通过栅极电极层的沉积和图案化与第一场效应晶体管的栅电极同时形成。 第一场效应晶体管可以是高性能器件，第二场效应晶体管可以是高电压器件。 还提供了用于半导体结构的设计结构。