摘要:
An object of the present invention is to provide a scanning electron microscope for reducing a process concerning inspection positioning or an input operation, thereby functioning with high precision at high speed. To accomplish the above object, the present invention provides a scanning electron microscope having a function for identifying a desired position on the basis of a pattern registered beforehand, which includes a means for setting information concerning the pattern kind, the interval between a plurality of parts constituting the pattern, and the size of parts constituting the pattern and a means for forming a pattern image composed of a plurality of parts on the basis of the information obtained by the concerned means.
摘要:
A charged-particle beam emitting device which includes the following configuration devices so that a lowering in the image resolution will be suppressed even if a primary beam is tilted relative to a sample: A device for causing orbit of the primary beam to pass through off-axes of a plurality of lenses, and controlling off-axis orbit of the primary beam. This device allows the aberration which occurs in the objective lens at the time of beam tilt to be cancelled out by the aberration which occurs in the other lens. Also, there is provided a device for simultaneously modulating excitations of the plurality of lenses including the objective lens.
摘要:
According to the pattern search method of the present invention, detection of a detection image region relative to an observation image is performed by a pattern matching. An image whose size is substantially the same as that of the observation image is used as the detection image region. The detection image region is relatively displaced with reference to the observation image, thereby detecting a degree of similarity for a common region which is common to both of the region and the image. Displacement range of the detection image region is set in advance. If area of the common region is larger than a predetermined value, calculating the degree of similarity will be performed.
摘要:
A method for determining a depression/protrusion, especially of a line and space pattern formed on a sample, and an apparatus therefor. A charged particle beam is scanned with its direction being inclined to the original optical axis of the charged particle beam or a sample stage is inclined, broadening of a detected signal in a line scanning direction of the charged particle beam is measured, the broadening is compared with that when the charged particle beam is scanned with its direction being parallel to the original optical axis of the charged particle beam, and a depression/protrusion of the scanned portion is determined on the basis of increase/decrease of the broadening.
摘要:
A magnetic recording medium which comprises a first magnetic layer on a base and a second magnetic layer thereon, the first magnetic layer containing magnetic particles having an average particle length (long axis diameter) of 0.4 to 0.7 .mu., the second magnetic layer containing magnetic particles having an average particle length (long axis diameter) of 0.25 to 0.35 .mu., the coercive force of which being 370 to 460 oersteds, and the ratio of coercive force of the upper or second layer to that of the lower or first magnetic layer being 1.05/l to 1.5/l. The magnetic recording medium has excellent sensitivity and frequency characteristics at entire frequency bands with less noise.
摘要:
A boosting circuit includes a plurality of variable capacitors with controllable capacitance values in accordance with the voltage level at first and second terminals of each of the variable capicitors A plurality of first buffer circuits is located at the first terminal side, each acting to increase the voltage level at the corresponding first terminal to a first level. A single second buffer circuit located at the second terminal side cooperating commonly with the variable capacitors, to increase the voltage level at each second terminal. The first level is thus boosted to a second level which results in an output of the circuit concerned. Each variable capacitor is fabricated by a MOS transistor capacitor.
摘要:
An object of the present invention is to provide an edge detection technique and equipment which are capable of stably detecting an edge by suppressing the influence of noise even in the case where the image is obtained by charged particle radiation equipment, such as a scanning electron microscope and has a low S/N ratio. More specifically, the present invention is to propose a technique and equipment which are configured to determine a peak position (edge) on the basis of the following two edge extraction techniques. That is, the present invention is to propose a technique and equipment wherein at least two peaks are formed by using, as edge detection techniques, for example, one peak detection technique having a relatively high sensitivity and the other peak detection technique which is relatively less susceptible to the influence of noise than the one peak detection technique, and wherein a position where the peaks coincide with each other is determined as a true peak position (edge position).
摘要:
Provided are a pattern measuring apparatus and a computer program which determine whether a gap formed in a sample (201) is a core gap (211) or a spacer gap (212). The secondary electron profile of the sample (201) is acquired, the feature quantities of the secondary electron profile at the positions of edges (303, 305) are detected, and based on the detected feature quantities, whether each gap adjacent to each of the edges (303, 305) is the core gap (211) or the spacer gap (212) is determined. Furthermore, the waveform profile of the spacer (207) is previously stored, the secondary electron profile of the sample (201) is acquired, a matching degree of the secondary electron profile and the stored waveform profile at the position of each spacer (207) is detected, and based on the detected matching degree, whether the each gap adjacent to each spacer (207) is the core gap (211) or the spacer gap (212) is determined.
摘要:
According to the pattern search method of the present invention, detection of a detection image region relative to an observation image is performed by a pattern matching. An image whose size is substantially the same as that of the observation image is used as the detection image region. The detection image region is relatively displaced with reference to the observation image, thereby detecting a degree of similarity for a common region which is common to both of the region and the image. Displacement range of the detection image region is set in advance. If area of the common region is larger than a predetermined value, calculating the degree of similarity will be performed.
摘要:
An auto focus unit, comprising a pursuit block, a lens driver, a detection block, and a controller, is provided. The pursuit block pursues the movements of an optical image of the target-object. The auto focus unit brings an optical image of the target-object into focus on a light-receiving surface. The target-object is desired to be brought into focus. The lens driver causes a focus lens to move so that an optical image of a scanning-area is brought into focus. The detection block detects the light intensity of an area including the scanning area. The controller causes the pursuit block to suspend a pursuit of the target-object when the light intensity detected by the detection block is lower than a predetermined threshold value.