Abstract:
A field emission transistor uses carbon nanotubes positioned to extend along a substrate plane rather than perpendicularly thereto. The carbon nanotubes may be pre-manufactured and applied to the substrate and then may be etched to create a gap between the carbon nanotubes and an anode through which electrons may flow by field emission. A planar gate may be positioned beneath the gap to provide a triode structure.
Abstract:
Semiconductor integrated circuit apparatus and electronic apparatus having a leakage current detection circuit where arbitrarily set leakage current detection ratio does not depend on power supply voltage, temperature, or manufacturing variations, and where leakage current detection is straightforward. Semiconductor integrated circuit apparatus extracts a stable potential from the center of two NchMIS transistors, amplifies drain current of an NchMOS transistor taking this potential as a gate potential to a current value of an arbitrary ratio using current mirror circuit, makes this current value flow through NchMOS transistor with the gate and drain connected, and applies drain potential of this NchMOS transistor to the gate of leakage current detection NchMOS transistor.
Abstract:
Techniques for adjusting the voltage across an active filter element include a controlled circuit element and a control circuit element adapted to control the voltage across the controlled circuit element to increase transient load response and to reduce power dissipation.
Abstract:
A power supply circuit is provided for producing a reference current with a prescribable temperature dependence. The circuit includes two current sinks, which at their respective input take up a first input current (I1) or a second input current (I2), and in which current sinks at their respective outputs are connected to a node having a reference potential, the output of at least one current sink being connected via a resistor to the node having the reference potential. The resistor is formed by least two reference resistors with prescribable temperature coefficients that are preferably different from one another.
Abstract:
An AC maintain power signature detection circuit in a power sourcing equipment (PSE) for a Power over Ethernet system injects an AC test signal onto a power port of the PSE. The AC test signal is driven onto a first power terminal of the power port through a sense resistor. The voltages across the sense resistor are measured and scaled by first and second resistor dividers having different resistor ratios. The voltage and the scaled voltage at the first power terminal side of the sense resistor have a peak voltage being proportional to the load impedance of the load coupled to the power port. The comparator compares the scaled voltages measured across the sense resistor and generates the output signal indicative of the load impedance at the power port.
Abstract:
Some of the members constituting a semiconductor element are formed from α-Si and an HSG forming process is implemented to form hemispherical polysilicon grains at some of the members formed from α-Si. Thus, a semiconductor device that is achieved without requiring a great number of manufacturing steps such as film formation and etching, facilitates control of the individual steps and assures reliable electrical connection between the members and a method of manufacturing such a semiconductor device are provided.
Abstract:
An N-shaped nonlinear resistor circuit using floating gate MOSFETs; to realize various N-shaped characteristics that can be approximated by piecewise linear functions of third to seventh orders and further to realize N-shaped V-I characteristics that can variously change those characteristics by use of external voltages. A Λ-type nonlinear resistor circuit (1) and a V-type nonlinear resistor circuit (2) using multi-input floating gate MOSFETs are connected in parallel, and the currents of the Λ-type and V-type nonlinear resistor circuits are added together, thereby providing various N-shaped voltage-current characteristics.