EUV light source collector erosion mitigation
    61.
    发明授权
    EUV light source collector erosion mitigation 有权
    EUV光源收集器侵蚀减轻

    公开(公告)号:US07180083B2

    公开(公告)日:2007-02-20

    申请号:US11238828

    申请日:2005-09-28

    IPC分类号: A61N5/06 G01J3/10 H05G2/00

    摘要: An EUV light source collector erosion mitigation system and method is disclosed which may comprise a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma; a replacement material generator positioned to deliver replacement material comprising the capping material to the collector outer surface at a rate sufficient to replace the capping material removed due to the removing interaction. The replacement material generator may comprise a plurality of replacement material generators positioned to respectively deliver replacement material to a selected portion of the collector outer surface, which may comprise a sputtering mechanism sputtering replacement capping material onto the collector outer surface.

    摘要翻译: 公开了一种EUV光源收集器侵蚀缓解系统和方法,其可以包括收集器,其包括多层反射镜收集器,该多层反射镜收集器包括由封装材料构成的收集器外表面,该封盖材料由于与EUV发光等离子体中产生的材料的去除相互作用而被去除 ; 替代材料发生器定位成将包含封盖材料的替换材料以足以代替由于去除相互作用而去除的封盖材料的速率传送到收集器外表面。 替代材料发生器可以包括多个替换材料发生器,其被定位成分别将替代材料递送到集电器外表面的选定部分,其可以包括溅射机构将溅射替换封盖材料涂覆到集电器外表面上。

    EUV light source collector erosion mitigation
    62.
    发明授权
    EUV light source collector erosion mitigation 有权
    EUV光源收集器侵蚀减轻

    公开(公告)号:US07141806B1

    公开(公告)日:2006-11-28

    申请号:US11237649

    申请日:2005-09-27

    IPC分类号: G01J1/00

    摘要: An EUV light source collector erosion mitigation method and apparatus for a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma, is disclosed which may comprise including within an EUV plasma source material a replacement material. The replacement material may comprise the same material as the capping material of the multilayered mirror. The replacement material may comprise a material that is essentially transparent to light in a selected band of EUV light, e.g., a spectrum of EUV light generated in a plasma of a plasma source material. The replacement material may comprise a material not susceptible to being etched by an etching material used to remove deposited plasma source material from the collector, e.g., a halogen etchant.

    摘要翻译: 公开了一种用于收集器的EUV光源收集器侵蚀缓解方法和装置,其包括多层反射镜收集器,其包括由由与在EUV发光等离子体中产生的材料的去除相互作用而被去除的封盖材料组成的收集器外表面。 可以包括在EUV等离子体源材料内包括替换材料。 替代材料可以包括与多层反射镜的封盖材料相同的材料。 替代材料可以包括对EUV光的选定频带中的光基本上透明的材料,例如在等离子体源材料的等离子体中产生的EUV光的光谱。 替代材料可以包括不易被蚀刻材料蚀刻的材料,用于从集电体例如卤素蚀刻剂去除沉积的等离子体源材料。

    EUV LIGHT SOURCE WITH SUBSYSTEM(S) FOR MAINTAINING LPP DRIVE LASER OUTPUT DURING EUV NON-OUTPUT PERIODS
    66.
    发明申请
    EUV LIGHT SOURCE WITH SUBSYSTEM(S) FOR MAINTAINING LPP DRIVE LASER OUTPUT DURING EUV NON-OUTPUT PERIODS 有权
    EUV光源与用于在EUV非输出期间维护LPP驱动激光输出的子系统

    公开(公告)号:US20120080584A1

    公开(公告)日:2012-04-05

    申请号:US13157233

    申请日:2011-06-09

    IPC分类号: H05G2/00 H01L31/00 B01J19/12

    摘要: A device is disclosed herein which may comprise a droplet generator producing droplets of target material; a sensor providing an intercept time signal when a droplet reaches a preselected location; a delay circuit coupled with said sensor, the delay circuit generating a trigger signal delayed from the intercept time signal; a laser source responsive to a trigger signal to produce a laser pulse; and a system controlling said delay circuit to provide a trigger signal delayed from the intercept time by a first delay time to generate a light pulse that is focused on a droplet and a trigger signal delayed from the intercept time by a second delay time to generate a light pulse which is not focused on a droplet.

    摘要翻译: 本文公开的装置可包括产生目标材料的液滴的液滴发生器; 当液滴到达预选位置时提供拦截时间信号的传感器; 与所述传感器耦合的延迟电路,所述延迟电路产生从截取时间信号延迟的触发信号; 响应于触发信号产生激光脉冲的激光源; 以及控制所述延迟电路的系统,以提供从截取时间延迟第一延迟时间的触发信号,以产生聚焦在液滴上的光脉冲和从截取时间延迟第二延迟时间的触发信号,以产生 不聚焦在液滴上的光脉冲。

    High repetition rate laser produced plasma EUV light source

    公开(公告)号:US20080197297A1

    公开(公告)日:2008-08-21

    申请号:US11471434

    申请日:2006-06-20

    IPC分类号: G01J3/10

    摘要: An EUV light source apparatus and method are disclosed, which may comprise a pulsed laser providing laser pulses at a selected pulse repetition rate focused at a desired target ignition site; a target formation system providing discrete targets at a selected interval coordinated with the laser pulse repetition rate; a target steering system intermediate the target formation system and the desired target ignition site; and a target tracking system providing information about the movement of target between the target formation system and the target steering system, enabling the target steering system to direct the target to the desired target ignition site. The target tracking system may provide information enabling the creation of a laser firing control signal, and may comprise a droplet detector comprising a collimated light source directed to intersect a point on a projected delivery path of the target, having a respective oppositely disposed light detector detecting the passage of the target through the respective point, or a detector comprising a linear array of a plurality of photo-sensitive elements aligned to a coordinate axis, the light from the light source intersecting a projected delivery path of the target, at least one of the which may comprise a plane-intercept detection device. The droplet detectors may comprise a plurality of droplet detectors each operating at a different light frequency, or a camera having a field of view and a two dimensional array of pixels imaging the field of view. The apparatus and method may comprise an electrostatic plasma containment apparatus providing an electric plasma confinement field at or near a target ignition site at the time of ignition, with the target tracking system providing a signal enabling control of the electrostatic plasma containment apparatus. The apparatus and method may comprise a vessel having and intermediate wall with a low pressure trap allowing passage of EUV light and maintaining a differential pressure across the low pressure trap. The apparatus and method may comprise a magnetic plasma confinement mechanism creating a magnetic field in the vicinity of the target ignition site to confine the plasma to the target ignition site, which may be pulsed and may be controlled using outputs from the target tracking system.

    High repetition rate laser produced plasma EUV light source
    68.
    发明授权
    High repetition rate laser produced plasma EUV light source 有权
    高重复率激光产生等离子体EUV光源

    公开(公告)号:US07361918B2

    公开(公告)日:2008-04-22

    申请号:US11471258

    申请日:2006-06-20

    IPC分类号: H01J35/20

    摘要: An EUV light source apparatus and method are disclosed, which may comprise a pulsed laser providing laser pulses at a selected pulse repetition rate focused at a desired target ignition site; a target formation system providing discrete targets at a selected interval coordinated with the laser pulse repetition rate; a target steering system intermediate the target formation system and the desired target ignition site; and a target tracking system providing information about the movement of target between the target formation system and the target steering system, enabling the target steering system to direct the target to the desired target ignition site. The apparatus and method may comprise a vessel having and intermediate wall with a low pressure trap allowing passage of EUV light and maintaining a differential pressure across the low pressure trap.

    摘要翻译: 公开了一种EUV光源装置和方法,其可以包括脉冲激光,其以所选择的脉冲重复频率提供激光脉冲,聚焦在期望的目标点火部位; 目标形成系统,以与激光脉冲重复率配合的选定间隔提供离散目标; 目标转向系统在目标地层系统和期望的目标点火站点之间; 以及目标跟踪系统,其提供关于目标形成系统和目标转向系统之间的目标移动的信息,使得目标转向系统能够将目标定向到期望的目标点火点。 该装置和方法可以包括具有中间壁的容器和具有低压阱的容器,其允许EUV光通过并且保持横跨低压阱的压差。