Display panel device
    61.
    发明授权
    Display panel device 失效
    显示面板设备

    公开(公告)号:US07119479B2

    公开(公告)日:2006-10-10

    申请号:US11048813

    申请日:2005-02-03

    IPC分类号: H01J5/16 H01J61/40 H01K1/26

    摘要: A display panel device includes a front sheet that is glued on a front face of a plasma display panel. The front sheet includes a mesh made of a light shield member that has a blackened front surface and a plane size larger than a screen. A length between diagonal lattice points of the mesh is shorter than a cell pitch that is longer one of the cell pitches in the vertical direction and the horizontal direction of the screen. An arrangement direction of the mesh is inclined with respect to an arrangement direction of the cells in the screen.

    摘要翻译: 显示面板装置包括胶合在等离子体显示面板的正面上的前片。 前片包括由遮光构件制成的网,其具有变黑的前表面和大于屏幕的平面尺寸。 网格的对角网格点之间的长度短于在屏幕的垂直方向和水平方向上的单元间距之一更长的单元间距。 网格的布置方向相对于屏幕中的单元的布置方向倾斜。

    Display panel device
    63.
    发明申请
    Display panel device 失效
    显示面板设备

    公开(公告)号:US20050174024A1

    公开(公告)日:2005-08-11

    申请号:US11048813

    申请日:2005-02-03

    摘要: A display panel device includes a front sheet that is glued on a front face of a plasma display panel. The front sheet includes a mesh made of a light shield member that has a blackened front surface and a plane size larger than a screen. A length between diagonal lattice points of the mesh is shorter than a cell pitch that is longer one of the cell pitches in the vertical direction and the horizontal direction of the screen. An arrangement direction of the mesh is inclined with respect to an arrangement direction of the cells in the screen.

    摘要翻译: 显示面板装置包括胶合在等离子体显示面板的正面上的前片。 前片包括由遮光构件制成的网,其具有变黑的前表面和大于屏幕的平面尺寸。 网格的对角网格点之间的长度短于在屏幕的垂直方向和水平方向上的单元间距之一更长的单元间距。 网格的布置方向相对于屏幕中的单元的布置方向倾斜。

    Plasma display panel
    65.
    发明申请
    Plasma display panel 失效
    等离子显示面板

    公开(公告)号:US20050001548A1

    公开(公告)日:2005-01-06

    申请号:US10838352

    申请日:2004-05-05

    摘要: A plasma display panel is provided in which discharge connection in the column direction is prevented without increasing the number of man-hours in a formation process of a partition and without deteriorating ventilation for an exhaust process. A pattern in a plan view of a partition is made a mesh pattern in which vertical patterns are included at inter-row positions in each column. Each of first vertical walls is positioned at a boundary between columns, each of second vertical walls is arranged at a position away from a boundary between columns for each boundary between rows and each of horizontal walls is positioned at a boundary between rows. In the partition, a height of portions where the first vertical wall crosses the horizontal wall and a height of portions where the second vertical wall crosses the horizontal wall are smaller than a height of the other portions of the partition.

    摘要翻译: 提供了一种等离子体显示面板,其中防止排列连接在列方向上,而不增加在隔板的形成过程中的工时数,并且不会使排气过程的通风恶化。 分区的平面视图中的图案被制成网格图案,其中在每列中的行间位置包括垂直图案。 每个第一垂直壁位于柱之间的边界处,每个第二垂直壁布置在离行之间的边界处的位置之间,并且每个水平壁位于行之间的边界处。 在隔壁中,第一垂直壁与水平壁交叉的部分的高度和第二垂直壁与水平壁交叉的部分的高度小于隔板的其他部分的高度。

    Specimen or substrate cutting method using focused charged particle beam
and secondary ion spectroscopic analysis method utilizing the cutting
method
    69.
    发明授权
    Specimen or substrate cutting method using focused charged particle beam and secondary ion spectroscopic analysis method utilizing the cutting method 失效
    使用聚焦带电粒子束的样品或基板切割方法和利用切割方法的二次离子光谱分析方法

    公开(公告)号:US4939364A

    公开(公告)日:1990-07-03

    申请号:US253558

    申请日:1988-10-05

    CPC分类号: H01J37/3056

    摘要: A specimen or substrate cutting method of cutting or processing a predetermined portion of a specimen or substrate in a direction of depth thereof by generating a focused charged particle beam from a particle beam source and irradiating the predetermined portion of the specimen or substrate with the focused charged particle beam is disclosed in which a particle species of the charged particle beam is selected such that each of the melting point of the particle species itself and the melting point of an alloy or compound of the particle species and constituent atoms of the specimen or substrate is not lower than 3/2 times of the temperature of the specimen or substrate in units of absolute temperature. A secondary ion mass-spectroscopic analysis method is also disclosed in which the charged particle beam is used as a probe to mass-analyze secondary charged ion successively generated from the cut portion of the specimen or substrate.

    摘要翻译: 一种样品或基材切割方法,其通过从粒子束源产生聚焦的带电粒子束来在其深度方向上切割或加工样品或基底的预定部分,并用聚焦的带电量照射样品或基底的预定部分 公开了粒子束,其中选择带电粒子束的粒子种类,使得颗粒物质本身的熔点和样品或基底的颗粒物质的合金或化合物的熔点和成分原子的熔点为 不低于样品或基材温度的绝对温度的3/2倍。 还公开了二次离子质谱分析方法,其中使用带电粒子束作为探针,对从样品或基底的切割部分连续产生的二次带电离子进行质量分析。