METHOD AND SYSTEM FOR COLOR OPTIMIZATION IN A DISPLAY
    72.
    发明申请
    METHOD AND SYSTEM FOR COLOR OPTIMIZATION IN A DISPLAY 失效
    用于显示器中颜色优化的方法和系统

    公开(公告)号:US20110090136A1

    公开(公告)日:2011-04-21

    申请号:US12973612

    申请日:2010-12-20

    申请人: Brian Gally

    发明人: Brian Gally

    IPC分类号: G09G3/20 H01R43/00

    CPC分类号: G02B26/001 Y10T29/49117

    摘要: Disclosed herein are iMoD displays optimized by utilizing different materials for one or more different color subpixels. Such optimized displays have improved color gamut over displays where all subpixels are constructed with the same material. Also disclosed are methods for manufacturing such displays and methods for optimizing iMoD displays.

    摘要翻译: 本文公开了通过利用用于一个或多个不同颜色子像素的不同材料来优化的iMoD显示器。 这种优化的显示器在显示器上具有改善的色域,其中所有子像素由相同的材料构成。 还公开了用于制造这种显示器的方法和用于优化iMoD显示器的方法。

    Process control monitors for interferometric modulators
    73.
    发明授权
    Process control monitors for interferometric modulators 有权
    过程控制监视器用于干涉式调制器

    公开(公告)号:US07869055B2

    公开(公告)日:2011-01-11

    申请号:US11841633

    申请日:2007-08-20

    IPC分类号: G01B9/02

    摘要: Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.

    摘要翻译: 公开了使用用于制造MEMS器件的至少一些相同工艺步骤制造的过程控制监视器。 过程控制监视器的分析可以提供关于MEMS器件和器件中的部件或子部件的属性的信息。 该信息可用于识别处理中的错误或优化MEMS器件。 在一些实施例中,过程控制监视器的分析可以利用光学测量。

    ELECTRICAL CHARACTERIZATION OF INTERFEROMETRIC MODULATORS
    74.
    发明申请
    ELECTRICAL CHARACTERIZATION OF INTERFEROMETRIC MODULATORS 失效
    干涉仪调制器的电气特性

    公开(公告)号:US20100321761A1

    公开(公告)日:2010-12-23

    申请号:US12869494

    申请日:2010-08-26

    IPC分类号: G02B26/00

    摘要: Disclosed herein are methods and systems for testing the electrical characteristics of reflective displays, including interferometric modulator displays. In one embodiment, a controlled voltage is applied to conductive leads in the display and the resulting current is measured. The voltage may be controlled so as to ensure that interferometric modulators do not actuate during the resistance measurements. Also disclosed are methods for conditioning interferometric modulator display by applying a voltage waveform that causes actuation of interferometric modulators in the display.

    摘要翻译: 本文公开了用于测试反射显示器的电气特性的方法和系统,包括干涉式调制器显示器。 在一个实施例中,将受控电压施加到显示器中的导电引线,并且测量所得到的电流。 可以控制电压以确保在电阻测量期间干涉式调制器不起动。 还公开了通过施加使显示器中的干涉式调制器致动的电压波形来调节干涉式调制器显示的方法。

    Method of monitoring the manufacture of interferometric modulators
    75.
    发明授权
    Method of monitoring the manufacture of interferometric modulators 失效
    监测干涉式调制器制造方法

    公开(公告)号:US07618831B2

    公开(公告)日:2009-11-17

    申请号:US11281763

    申请日:2005-11-17

    IPC分类号: H01L21/00

    摘要: Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.

    摘要翻译: 公开了使用用于制造MEMS器件的至少一些相同工艺步骤制造的过程控制监视器。 过程控制监视器的分析可以提供关于MEMS器件和器件中的部件或子部件的属性的信息。 该信息可用于识别处理中的错误或优化MEMS器件。 在一些实施例中,过程控制监视器的分析可以利用光学测量。

    ELECTRO-OPTICAL MEASUREMENT OF HYSTERESIS IN INTERFEROMETRIC MODULATORS
    77.
    发明申请
    ELECTRO-OPTICAL MEASUREMENT OF HYSTERESIS IN INTERFEROMETRIC MODULATORS 有权
    干涉仪调制器中电磁光度测量

    公开(公告)号:US20080180680A1

    公开(公告)日:2008-07-31

    申请号:US12031602

    申请日:2008-02-14

    IPC分类号: G01B9/02

    CPC分类号: G02B26/001

    摘要: Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.

    摘要翻译: 本文公开了用于测试干涉式调制器的方法和装置。 可以通过施加时变电压刺激并且从调制器测量所得到的反射率来测试干涉式调制器。

    ELECTRICAL CHARACTERIZATION OF INTERFEROMETRIC MODULATORS
    79.
    发明申请
    ELECTRICAL CHARACTERIZATION OF INTERFEROMETRIC MODULATORS 失效
    干涉仪调制器的电气特性

    公开(公告)号:US20080158646A1

    公开(公告)日:2008-07-03

    申请号:US12041618

    申请日:2008-03-03

    IPC分类号: G02B26/00

    摘要: Disclosed herein are methods and systems for testing the electrical characteristics of reflective displays, including interferometric modulator displays. In one embodiment, a controlled voltage is applied to conductive leads in the display and the resulting current is measured. The voltage may be controlled so as to ensure that interferometric modulators do not actuate during the resistance measurements. Also disclosed are methods for conditioning interferometric modulator display by applying a voltage waveform that causes actuation of interferometric modulators in the display.

    摘要翻译: 本文公开了用于测试反射显示器的电气特性的方法和系统,包括干涉式调制器显示器。 在一个实施例中,将受控电压施加到显示器中的导电引线,并且测量所得到的电流。 可以控制电压以确保在电阻测量期间干涉式调制器不起动。 还公开了通过施加使显示器中的干涉式调制器致动的电压波形来调节干涉式调制器显示的方法。

    SYSTEM AND METHOD OF IMPLEMENTATION OF INTERFEROMETRIC MODULATORS FOR DISPLAY MIRRORS
    80.
    发明申请
    SYSTEM AND METHOD OF IMPLEMENTATION OF INTERFEROMETRIC MODULATORS FOR DISPLAY MIRRORS 有权
    用于显示镜的干涉仪调制器的系统和方法

    公开(公告)号:US20080112031A1

    公开(公告)日:2008-05-15

    申请号:US11969818

    申请日:2008-01-04

    IPC分类号: G02F1/01

    CPC分类号: G02B26/001

    摘要: A specular interferometric modulator array is configured to be at least partially selectably reflective. As such, the array forms a mirror surface having the capability of displaying information to the user while simultaneously being used as a specular mirror. The displayed information may be based on information from an external source, may be programmable, and may be based on user input.

    摘要翻译: 镜面干涉式调制器阵列被配置为至少部分地可选择地反射。 因此,阵列形成具有向用户显示信息的能力的镜面,同时被用作镜面反射镜。 显示的信息可以基于来自外部源的信息,可以是可编程的,并且可以基于用户输入。