Catadioptric projection objective
    72.
    发明授权
    Catadioptric projection objective 有权
    反射折射投影物镜

    公开(公告)号:US07697198B2

    公开(公告)日:2010-04-13

    申请号:US10576265

    申请日:2004-10-15

    IPC分类号: G02B17/08

    摘要: A catadioptric projection objective for projecting a pattern arranged in the object plane of the projection objective into the image plane of the projection objective, having: a first objective part for projecting an object field lying in the object plane into a first real intermediate image; a second objective part for generating a second real intermediate image with the radiation coming from the first objective part; a third objective part for generating a third real intermediate image with the radiation coming from the second objective part; and a fourth objective part for projecting the third real intermediate image into the image plane.

    摘要翻译: 一种反折射投射物镜,用于将布置在投影物镜的物平面中的图案投影到投影物镜的像平面中,具有:第一物镜部分,用于将物平面中的物场投影到第一实际中间像中; 第二目标部分,用于利用来自第一目标部分的辐射产生第二实际中间图像; 第三目标部分,用于利用来自第二目标部分的辐射产生第三实际中间图像; 以及用于将第三实际中间图像投影到图像平面中的第四目标部分。

    Lithography projection objective, and a method for correcting image defects of the same
    73.
    发明授权
    Lithography projection objective, and a method for correcting image defects of the same 有权
    平版印刷投影物镜,以及用于校正图像缺陷的方法

    公开(公告)号:US07692868B2

    公开(公告)日:2010-04-06

    申请号:US12265090

    申请日:2008-11-05

    IPC分类号: G02B9/00 G03B27/42 G03F7/00

    CPC分类号: G03F7/70341 G03F7/7015

    摘要: Projection objectives, as well as related components, systems and methods, are disclosed. In general, a projection objective is configured to image radiation from an object plane to an image plane. A projection objective can include a plurality of optical elements along the optical axis. The plurality of optical elements can include a group of optical elements and a last optical element which is closest to the image plane, and a positioning device configured to move the last optical element relative to the image plane. Typically, a projection objective is configured to be used in a microlithography projection exposure machine.

    摘要翻译: 公开了投影目标以及相关组件,系统和方法。 通常,投影物镜被配置成将来自物体平面的辐射图像到图像平面。 投影物镜可以包括沿着光轴的多个光学元件。 多个光学元件可以包括一组光学元件和最靠近图像平面的最后一个光学元件,以及被配置为相对于图像平面移动最后一个光学元件的定位装置。 通常,投影物镜被配置为用于微光刻投影曝光机。

    Microlithographic projection exposure apparatus
    74.
    发明授权
    Microlithographic projection exposure apparatus 有权
    微光刻投影曝光装置

    公开(公告)号:US07532306B2

    公开(公告)日:2009-05-12

    申请号:US10917371

    申请日:2004-08-13

    IPC分类号: G03B27/42 G03B27/52 G03B27/54

    摘要: A microlithographic projection exposure apparatus contains an illumination system (12) for generating projection light (13) and a projection lens (20; 220; 320; 420; 520; 620; 720; 820; 920; 1020; 1120) with which a reticle (24) that is capable of being arranged in an object plane (22) of the projection lens can be imaged onto a light-sensitive layer (26) that is capable of being arranged in an image plane (28) of the projection lens. The projection lens is designed for immersion mode, in which a final lens element (L5; L205; L605; L705; L805; L905; L1005; L1105) of the projection lens on the image side is immersed in an immersion liquid (34; 334a; 434a; 534a). A terminating element (44; 244; 444; 544; 644; 744; 844; 944; 1044; 1144) that is transparent in respect of the projection light (13) is fastened between the final lens element on the image side and the light-sensitive layer.

    摘要翻译: 微光刻投影曝光装置包括用于产生投影光(13)和投影透镜(20; 220; 320; 420; 520; 620; 720; 820; 920; 1020; 1120)的照明系统(12) 能够布置在投影透镜的物平面(22)中的光源(24)可以被成像到能够被布置在投影透镜的像平面(28)中的感光层(26)上。 投影透镜被设计用于浸没模式,其中在像侧的投影透镜的最终透镜元件(L5; L205; L605; L705; L805; L905; L1005; L1105)浸没在浸没液体(34; 334a ; 434a; 534a)。 关于投影光(13)透明的终端元件(44; 244; 444; 544; 644; 744; 844; 944; 1044; 1144)被紧固在图像侧的最终透镜元件与光 敏感层。

    Illumination System Including Grazing Incidence Mirror For Microlithography Exposure System
    75.
    发明申请
    Illumination System Including Grazing Incidence Mirror For Microlithography Exposure System 审中-公开
    包括用于微光刻曝光系统的放映入射镜的照明系统

    公开(公告)号:US20090073392A1

    公开(公告)日:2009-03-19

    申请号:US11855359

    申请日:2007-09-14

    IPC分类号: G03B21/28 G03B21/06

    CPC分类号: G03F7/70233 G03F7/702

    摘要: In general, in one aspect, the invention features a system that includes a catoptric projection objective having an optical axis and including a plurality of projection objective elements positioned between an object plane and an image plane, the object and image planes being orthogonal to the optical axis, the projection objective being configured so that during operation the projection objective directs radiation reflected at the object plane to the image plane to form an image at the image plane of an object positioned in a field at the object plane, the field having a first dimension of 8 mm or more and a second dimension of 8 mm or more, the first and second dimensions being along orthogonal directions. The system also includes an illumination system including a plurality of illumination system elements, the illumination system being configured so that during operation the illumination system directs the radiation to the field at the object plane, where a chief ray of the radiation has an angle of incidence of 10° or less at the object plane.

    摘要翻译: 通常,在一个方面,本发明的特征在于一种系统,其包括具有光轴并且包括位于物平面和图像平面之间的多个投影物镜元件的反射投影物镜,物体和像平面正交于光学 所述投影物镜被配置为使得在操作期间,投影物镜将在物平面处反射的辐射引导到像平面以在位于物平面处的场中的物体的像平面处形成图像,该场具有第一 尺寸为8mm以上,第二尺寸为8mm以上,第一尺寸和第二尺寸沿正交方向。 该系统还包括包括多个照明系统元件的照明系统,照明系统被配置为使得在操作期间照明系统将辐射引导到物平面处的场,其中辐射的主射线具有入射角 在物平面上为10°以下。

    MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM AND METHOD FOR MANUFACTURING A DEVICE
    76.
    发明申请
    MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM AND METHOD FOR MANUFACTURING A DEVICE 审中-公开
    微型投影光学系统及其制造方法

    公开(公告)号:US20090052073A1

    公开(公告)日:2009-02-26

    申请号:US12233384

    申请日:2008-09-18

    IPC分类号: G02B17/06

    摘要: In some embodiments, a catoptric microlithgraphy projection optical system includes a plurality of reflective optical elements arranged to image radiation from an object field in an object plane to an image field in an image plane. The image field can have a size of at least 1 mm×1 mm. This optical system can have an object-image shift (OIS) of about 75 mm or less. Metrology and testing can be easily implemented despite rotations of the optical system about a rotation axis. Such a catoptric microlithgraphy projection optical system can be implemented in a microlithography tool. Such a microlithography tool can be used to produce microstructured components.

    摘要翻译: 在一些实施例中,反射微结构投影光学系统包括多个反射光学元件,其被布置成将来自物体平面中的物场的辐射图像映像到图像平面中的图像场。 图像场可以具有至少1mm×1mm的尺寸。 该光学系统可以具有约75mm或更小的物体图像偏移(OIS)。 尽管光学系统围绕旋转轴旋转,但可以容易地实现测量和测试。 这种反射式微立方体投影光学系统可以在微光刻工具中实现。 这种微光刻工具可用于生产微结构化组件。

    MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, TOOL AND METHOD OF PRODUCTION
    77.
    发明申请
    MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, TOOL AND METHOD OF PRODUCTION 有权
    微电子投影光学系统,工具和生产方法

    公开(公告)号:US20090051890A1

    公开(公告)日:2009-02-26

    申请号:US12235957

    申请日:2008-09-23

    IPC分类号: G03B27/54

    摘要: A microlithography projection optical system is disclosed. The system can include a plurality of optical elements arranged to image radiation having a wavelength λ from an object field in an object plane to an image field in an image plane. The plurality of optical elements can have an entrance pupil located more than 2.8 m from the object plane. A path of radiation through the optical system can be characterized by chief rays having an angle of 3° or more with respect to the normal to the object plane. This can allow the use of face shifting masks as objects to be imaged, in particular for EUV wavelengths.

    摘要翻译: 公开了一种微光刻投影光学系统。 该系统可以包括多个光学元件,其布置成将具有波长λ的辐射从物体平面中的物体场图像映像到图像平面中的图像场。 多个光学元件可以具有距离物面大于2.8μm的入射光瞳。 通过光学系统的辐射路径的特征在于主要光线相对于物平面的法线具有3°或更大的角度。 这可以允许使用面部移动掩模作为要成像的对象,特别是对于EUV波长。

    CATOPTRIC OBJECTIVES AND SYSTEMS USING CATOPTRIC OBJECTIVES
    78.
    发明申请
    CATOPTRIC OBJECTIVES AND SYSTEMS USING CATOPTRIC OBJECTIVES 有权
    使用目标目标的CATOPR目标和系统

    公开(公告)号:US20090046357A1

    公开(公告)日:2009-02-19

    申请号:US12166406

    申请日:2008-07-02

    IPC分类号: G02B17/06

    摘要: In general, in a first aspect, the invention features a system that includes a microlithography projection optical system. The microlithography projection optical system includes a plurality of elements arranged so that during operation the plurality of elements image radiation at a wavelength λ from an object plane to an image plane. At least one of the elements is a reflective element that has a rotationally-asymmetric surface positioned in a path of the radiation. The rotationally-asymmetric surface deviates from a rotationally-symmetric reference surface by a distance of about λ or more at one or more locations of the rotationally-asymmetric surface.

    摘要翻译: 通常,在第一方面,本发明的特征在于包括微光刻投影光学系统的系统。 微光刻投影光学系统包括多个元件,其被布置成使得在操作期间,多个元件将从物体平面到像平面的波长λ的图像辐射。 元件中的至少一个是具有位于辐射路径中的旋转非对称表面的反射元件。 旋转非对称表面在旋转对称表面的一个或多个位置处偏离旋转对称的参考表面约λ或更大的距离。

    CATOPTRIC OBJECTIVES AND SYSTEMS USING CATOPTRIC OBJECTIVES
    79.
    发明申请
    CATOPTRIC OBJECTIVES AND SYSTEMS USING CATOPTRIC OBJECTIVES 审中-公开
    使用目标目标的CATOPR目标和系统

    公开(公告)号:US20080316451A1

    公开(公告)日:2008-12-25

    申请号:US12198344

    申请日:2008-08-26

    IPC分类号: G03F7/20

    摘要: In general, in one aspect, the invention features an objective arranged to image radiation from an object plane to an image plane, including a plurality of elements arranged to direct the radiation from the object plane to the image plane, wherein the objective has an image side numerical aperture of more than 0.55 and a maximum image side field dimension of more than 1 mm, and the objective is a catoptric objective.

    摘要翻译: 通常,在一个方面,本发明的特征在于设置成将从物体平面到图像平面的辐射成像的目标,包括布置成将来自物体平面的辐射引导到图像平面的多个元件,其中物镜具有图像 侧面数值孔径大于0.55,最大像侧场尺寸大于1 mm,目标是一个反射目标。