Abstract:
A memory system includes: a bit counter and a regression analyzer. The bit counter is configured to generate a plurality of count values based on data read from selected memory cells using a plurality of different read voltages, each of the plurality of count values being indicative of a number of memory cells of a memory device having threshold voltages between pairs of the plurality of different read voltages. The regression analyzer is configured to determine read voltage for the selected memory cells based on the plurality of count values using regression analysis.
Abstract:
A method of operating a memory device is provided. The memory device includes a plurality of multi-level memory cells of which each memory cell includes L levels. Data which is expressed in a binary number is received. A P-length string is generated from the data. The P-length string is converted to a Q-length string. The Q-length string is distributed using I levels by eliminating at least one level from the L levels. P and Q represent binary bit lengths of the P-length string and the Q-length string. Q is greater than P. L represents a maximum number of levels which each multi-level memory cell has. I is smaller than L. The Q-length string is programmed into the plurality of memory cells.
Abstract:
A method of operating a memory controller is provided. The method includes determining a data state based on an input stream including multiple alphabet letters, converting a part of the input stream, which corresponds to a conversion size, into alphabet letters in a lower numeral system when the data state is determined to be a first state among multiple predetermined data states, inserting one of the converted alphabet letters into the input stream, and outputting each of the alphabet letters in the input stream as is when the data state is determined to be a second state among the predetermined data states.