公开(公告)号：US20230057479A1

公开(公告)日：2023-02-23

申请号：US17893073

申请日：2022-08-22

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Justin E. Patterson ,  Heike Tritschler

IPC: G01R31/317 ,  G01R31/28 ,  G06N20/00

Abstract: A device for generating waveforms includes a machine learning system configured to associate waveforms from a device under test to parameters, a user interface configured to allow a user to provide one or more user inputs, and one or more processors configured to execute code that causes the one or more processors to receive one or more inputs through the user interface that include one or more parameters, apply the machine learning system to the received one or more parameters, produce, by the machine learning system, a waveform based on the one or more parameters, and output the produced waveform. Methods of generating waveforms are also presented.

公开(公告)号：US20230050303A1

公开(公告)日：2023-02-16

申请号：US17877829

申请日：2022-07-29

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G06F11/27 ,  G06F11/22 ,  G06F1/02

Abstract: A test and measurement system has a test and measurement instrument, a test automation platform, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive a waveform created by operation of a device under test, generate one or more tensor arrays, apply machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, apply machine learning to a second tensor array of the one of the one or more tensor arrays to produce predicted tuning parameters for the device under test, use the equalizer tap values to produce a Transmitter and Dispersion Eye Closure Quaternary (TDECQ) value, and provide the TDECQ value and the predicted tuning parameters to the test automation platform. A method of testing devices under test includes receiving a waveform created by operation of a device under test, generating one or more tensor arrays, applying machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, applying machine learning to a second tensor array of the one or more tensor arrays to produce predicted tuning parameters for the device under test, using the equalizer tap values to produce a Transmitter Dispersion Eye Closure Quaternary (TDECQ) value, and providing the TDECQ value and the predicted tuning parameters to a test automation platform.

公开(公告)号：US20220373597A1

公开(公告)日：2022-11-24

申请号：US17745797

申请日：2022-05-16

Applicant: Tektronix, Inc.

Inventor： Maria Agoston ,  John J. Pickerd ,  Kan Tan

IPC: G01R31/319 ,  H04B17/00 ,  G01R31/26 ,  H04L1/20

Abstract: A test and measurement system includes a machine learning system, a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: acquire a waveform from the device under test (DUT),transform the waveform into a composite waveform image, and send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT. A method of determining a bit error ratio for a device under test (DUT), includes acquiring one or more waveforms from the DUT, transforming the one or more waveforms into a composite waveform image, and sending the composite waveform image to a machine learning system to obtain a bit error ratio (BER) value for the DUT.

公开(公告)号：US20220268839A1

公开(公告)日：2022-08-25

申请号：US17681617

申请日：2022-02-25

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Keith D. Rule ,  Mark Anderson Smith

IPC: G01R31/3183 ,  G01R31/317 ,  G01R31/319

Abstract: A test and measurement system includes a primary instrument having an input for receiving a test signal for measurement or analysis from a Device Under Test (DUT) and generating a test waveform from the test signal, and a duplicator for sending a copy of the test waveform to one or more secondary instruments. The one or more secondary instruments are each structured to access the copy of the test signal for analysis, and each of the one or more secondary instruments includes a receiver structured to receive a command related to measurement or analysis of the copy of the test waveform, one or more processes for executing the received command, and an output for sending results of the executed command to be displayed on a user interface that is separate from any user interface of the one or more secondary instruments.

公开(公告)号：US11422584B2

公开(公告)日：2022-08-23

申请号：US16677391

申请日：2019-11-07

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd

IPC: G06F1/02 ,  G06F1/03 ,  G01R13/34 ,  G01R13/02

Abstract: A test and measurement instrument for generating an analog waveform, including an interpolator configured to receive a digital signal and output interpolated samples of the digital signal at a sample rate, a filter modulation controller configured to output first filter coefficients at a first time and second filter coefficients at a second time, a convolver configured to generate a convolved signal by convolving the interpolated samples of the digital signal and the first filter coefficients and convolving the interpolated samples of the digital signal and the second filter coefficients; and a digital-to-analog converter configured to convert the convolved signal to an analog signal based on a fixed, constant clock signal.

公开(公告)号：US20210389349A1

公开(公告)日：2021-12-16

申请号：US17345283

申请日：2021-06-11

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd

IPC: G01R13/02

Abstract: A test and measurement instrument includes an input to receive a non-return-to-zero (NRZ) waveform signal from a device under test, a ramp generator to use the NRZ waveform signal to generate a ramp sweep signal, a gate to gate the ramp sweep signal and the NRZ waveform signal to produce gated X-axis and Y-axis data, and a display to display the gated X-axis and Y-axis data as a cyclic loop image. A method of generating a cyclic loop image includes receiving an input waveform, using the input waveform to generate a ramp sweep signal, gating the ramp sweep signal and the input waveform to produce gated X-axis and Y-axis data, and displaying the gated X-axis and Y-axis data as a cyclic loop image.

公开(公告)号：US10904042B2

公开(公告)日：2021-01-26

申请号：US16116677

申请日：2018-08-29

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Pirooz Hojabri

IPC: H03H7/46 ,  H04B17/30 ,  H04L25/03

Abstract: A continuously or step variable passive noise filter for removing noise from a signal received from a DUT added by a test and measurement instrument channel. The noise filter may include, for example, a splitter splits a signal into at least a first split signal and a second split signal. A first path receives the first split signal and includes a variable attenuator and/or a variable delay line which may be set based on the channel response of the DUT which is connected. The variable attenuator and/or the variable delay line may be continuously or stepped variable, as will be discussed in more detail below. A second path is also included to receive the second split signal and a combiner combines a signal from the first path and a signal from the second path into a combined signal.

公开(公告)号：US10145874B2

公开(公告)日：2018-12-04

申请号：US14673747

申请日：2015-03-30

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R27/28 ,  G01R27/06 ,  G01R21/133 ,  G01R23/00 ,  G01R23/02 ,  G01R31/28 ,  G01R27/16

Abstract: A method for determining scattering parameters of a device under test using a real-time oscilloscope. The method includes calculating a reflection coefficient of each port of a device under test with N ports, wherein N is greater than one, based on a first voltage measured by the real-time oscilloscope when a signal is generated from a signal generator. The method also includes determining an insertion loss coefficient of each port of the device under test, including calculating the insertion loss coefficient of the port of the device under test to be measured based on a second voltage measured by the real-time oscilloscope when a signal is generated from a signal generator.

公开(公告)号：US09933458B2

公开(公告)日：2018-04-03

申请号：US14674344

申请日：2015-03-31

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G05B11/32 ,  G01R13/02 ,  H03M1/10 ,  G01R13/22 ,  H03M1/12

CPC classification number: G01R13/0218 ,  G01R13/0272 ,  G01R13/225 ,  H03M1/1052 ,  H03M1/1215

Abstract: A test and measurement instrument including a splitter configured to split an input signal into at least two split signals, at least two harmonic mixers configured to mix an associated split signal with an associated harmonic signal to generate an associated mixed signal, at least two digitizers configured to digitize the associated mixed signal, at least two MIMO polyphase filter arrays configured to filter the associated digitized mixed signal of an associated digitizer of the at least two digitizers, at least two pairs of band separation filters configured to receive the associated digitized mixed signals from each of the MIMO polyphase filter arrays and output a low band of the input signal and a high band of the input signal based on a time different between the at least two digitizers and a phase drift of a local oscillator, and a combiner configured to combine the low band of the input signal and the high band of the input signal to form a reconstructed input signal.

公开(公告)号：US20170328932A1

公开(公告)日：2017-11-16

申请号：US15395416

申请日：2016-12-30

Applicant: TEKTRONIX, INC.

Inventor： Barton T. Hickman ,  John J. Pickerd ,  Pirooz Hojabri ,  Patrick Satarzadeh ,  Khadar Baba Shaik

IPC: G01R13/02 ,  H03M1/12 ,  H03M1/06

CPC classification number: G01R13/0218 ,  G01R13/0272 ,  H03M1/0626 ,  H03M1/12

Abstract: Disclosed are systems and methods related to a noise reduction device employing an analog filter and a corresponding inverse digital filter. The combination and placement of the filters within the systems aids in reducing noise introduced by processing the signal. In some embodiments, the combination of filters may also provide for increased flexibility when de-embedding device under test (DUT) link attenuation at higher frequencies. Further, the filters are adjustable, via a controller, to obtain an increased signal to noise ratio (SNR) relative to a signal channel lacking the combination of filters. Additional embodiments may be disclosed and/or claimed herein.