Abstract:
The present invention is related to an analogue-to-digital (A/D) converter comprising at least two voltage comparator devices. Each of the voltage comparator devices is arranged for being fed with a same input signal and for generating an own internal voltage reference. The two internal voltage references are different. Each voltage comparator is arranged for generating an output signal indicative of a bit position of a digital approximation of said input signal.
Abstract:
The present invention discloses an analogue-to-digital converter comprising at least two voltage comparator devices. Each of the voltage comparator devices comprises a differential structure of transistors and is arranged for being fed with a same input signal and for generating an own internal voltage reference by means of an imbalance in the differential structure, said two internal voltage references being different. Each voltage comparator is arranged for generating an output signal indicative of a bit position of a digital approximation of the input signal.
Abstract:
Errors in an analog to digital converter that cause generated digital codes to deviate from expected values are corrected. A sample of an analog signal is stored in a storage element. An error signal is then generated, with the error signal representing a deviation of an expected digital code for the strength of a sample of an analog input from a value that would be generated without correction. The error signal is then added to the stored sample. In an embodiment implemented in the context of a SAR ADC, a digital value representing an integral non-linearity error is generated based on a partial digital code (result of a partial conversion of the sample) and an error coefficient. The digital value is converted to analog form by an auxiliary DAC, and added to the stored input sample.
Abstract:
The present invention is to provide an average bubble correction circuit which will expand the range of bubble error correction and will detect the proper position of the 1/0 state-conversion points of the thermometer codes to low down the error rate that caused by the ROM decoding. The average bubble correction circuit is used in the analog to digital converter and will convert the thermometer code obtained from the comparator of the analog to digital converter into the 1/0 state-conversion point.
Abstract:
The invention pertains to a method and corrector (IC6) for correcting an error in a parallel analog-to-digital conversion. Such a correctable error is caused by uncertainties in the reading of the states of parallel comparing elements (IC1, IC2, IC3, IC4) in the converter, said uncertainties being brought about by nonideality, such as non-simultaneous state latching. This error is corrected using a nonlinear cellular neural network preferably such that the real level of the phenomenon compared by means of comparing elements (IC1, IC2, IC3, IC4) is estimated by estimating the states corresponding to correct reading of the comparing elements (IC1, IC2, IC3, IC4) read temporally or otherwise erroneously.
Abstract:
A bubble suppression apparatus is disclosed comprising: a first set of AND gates, wherein each AND gate within the first set has an input configured to receive a binary thermometer code value and one or more adjacent binary thermometer code values; and a second set of AND gates, wherein each AND gate within the second set has an input coupled to two or more outputs of the first set of AND gates.
Abstract:
A high speed A/D converter includes a series of encoder sections for converting a thermometer code to a gray code and an error signal production section for detecting a babble error in the gray code and generating an error signal indicating such a babble error. An error correction section corrects babble errors in the gray code in response to the error signal. The corrected gray code is then converted to a binary code with a gray code to binary code converter. When the high speed A/D converter is incorporated in a semiconductor device, the A/D converter may be tested using a sampling clock having a phase which varies successively with respect to the input analog signal to sample the analog signal, and then evaluating the corresponding generated digital signal.
Abstract:
An analog to digital converter, which, by comparing utput signals of a first comparator group with a reference voltage by a second comparator group and setting this reference voltage to a level lower than an intermediate level of output signals of the first comparator group, generation of the intermediate level signal in the output signals of the second comparator group is prevented, therefore a malfunction of the analog to digital converter can be avoided.
Abstract:
A coding circuit forming a 1-from-N code from an X-from-N code includes partial circuits in which each position of the X-from-N code forms an input value of a partial circuit. Each partial circuit is formed of three emitter-coupled transistor pairs, a current source connected to reference potential, level shift circuits, signal outputs and a symmetrical signal input. Each partial circuit is connected to the partial circuit with the next higher position of the X-from-N code as an input value and to the partial circuit with the next lower position of the X-from-N code as an input value.
Abstract:
The disclosure pertains to parallel analog-digital converters, the first comparator stage of which give a so-called thermometer scale, formed by a sequence of logic "ones" and logic "zeros". According to the disclosure, a corrector stage is added on in series with the comparator stage. If a comparator of the first stage accidentally gives a logic value opposite that given by the two neighboring comparators, the corrector stages forces the accidentally erroneous value to assume the same value as that the values given by the two neighboring comparators, if and only if these values are equal. The disclosed device can be applied to signal processing ADCs.