Abstract:
A comparator tracking scheme for an analog-to-digital converter (ADC) may implement a dynamic window size by varying, over time, a number of comparators powered up to convert an analog input signal to a digital output signal. A comparator-tracking scheme may be implemented, for example, in a controller coupled to a plurality of comparators in an ADC. For example, the controller may determine a window size for the ADC and determine a window position for the ADC. The controller may then activate comparators of the ADC within a window centered at the window position and having a width of the window size. The controller may determine a window size by analyzing an output of a filter. When the filter output indicates a rapidly changing analog input signal, the controller may dynamically increase a window size of the ADC, which may increase a number of comparators powered on.
Abstract:
A method of background calibration of aperture center errors in a data communication system is provided. In an implementation, in response to detection of a low sampler output (“0”) in between two high sampler outputs (“1”), the method includes: calculating a signal derivative of an ADC output signal at the time of the detected low output; and adjusting timing at a selected sampler based on the calculated signal derivative. In an example implementation, the method includes watching for bubbles in the thermometer code output, and estimating the first derivative of the signal at the time of the bubble, then estimating the sign of the errors. In an example implementation, the errors are used in a control loop to reduce the aperture center error.
Abstract:
An offset cancellation circuit for canceling an offset voltage in an amplifier is provided herein. The offset cancellation circuit includes a current source configured to provide an offset current, a switching stage comprising first and second switches, and a cascode stage. The cascode stage comprises a first cascode device configured to receive the offset current from the first switch and inject the offset current into a first differential end of the amplifier, and a second cascode device configured to receive the offset current from the second switch and inject the offset current into a second differential end of the amplifier. Offset voltages are common to many differential circuits as a result of mismatch. The injection of current by the offset cancellation circuit can reduce or eliminate an offset voltage, while the cascode stage can prevent parasitic capacitance associated with the offset cancellation circuit from creating further mismatch.
Abstract:
An exemplary continuous-time delta-sigma analog-to-digital converter includes a loop filter, a quantizer, a dynamic element matching circuit, a latch, and a digital-to-analog converter (DAC). The loop filter contains a plurality of integrators coupled in series, including a first integrator and a second integrator; a first positive feedback resistive element, placed in a first positive feedback path between a first output node of the second integrator and a first input node of the first integrator; and a first negative feedback resistive element, placed in a first negative feedback path between a second output node of the second integrator and a second input node of the first integrator. The quantizer is implemented using a domino quantizer. The DAC contains a plurality of DAC units each having a capacitive device, a resistive device, and a switch device coupled between the capacitive device and the resistive device.
Abstract:
Errors in an analog to digital converter that cause generated digital codes to deviate from expected values are corrected. A sample of an analog signal is stored in a storage element. An error signal is then generated, with the error signal representing a deviation of an expected digital code for the strength of a sample of an analog input from a value that would be generated without correction. The error signal is then added to the stored sample. In an embodiment implemented in the context of a SAR ADC, a digital value representing an integral non-linearity error is generated based on a partial digital code (result of a partial conversion of the sample) and an error coefficient. The digital value is converted to analog form by an auxiliary DAC, and added to the stored input sample.
Abstract:
An encoder circuit and A/D converter that can minimize the error of an encoder output with respect to all the possible combinations of thermometer codes are desired to be provided. To this end, an encoder circuit has a logic thereof configured to take a thermometer code as an input and to output as an encoded value a center value of a range in which one or more encoded values are distributed, the one or more encoded values corresponding to positions of one or more boundaries between “0” and “1” appearing in the thermometer code.
Abstract:
Metastable compensation circuitry 700 for detecting and compensating for metastable states of a regenerative latch 209 in a charge redistribution analog to digital converter 201. First and second latches 701a,b each having a selected threshold voltage for monitor corresponding first and second outputs of regenerative latch 209. Detection logic 202a,b 703 detects a selected output state of the first and second latches corresponding to a metastable state of regenerative latch 209. Suppression logic 703 generates an output of a selected logic level in response to the detection of a metastable state by detection logic 702/703.
Abstract:
A high speed A/D converter includes a series of encoder sections for converting a thermometer code to a gray code and an error signal production section for detecting a babble error in the gray code and generating an error signal indicating such a babble error. An error correction section corrects babble errors in the gray code in response to the error signal. The corrected gray code is then converted to a binary code with a gray code to binary code converter. When the high speed A/D converter is incorporated in a semiconductor device, the A/D converter may be tested using a sampling clock having a phase which varies successively with respect to the input analog signal to sample the analog signal, and then evaluating the corresponding generated digital signal.
Abstract:
Between digital data signals, which are expressed using a notation system of three digit symmetric binary numbers (named “HEN2”), and analog signals, at least one way, mutual, or other conversions are made. Three digit symmetric binary numbers (HEN2), are a combination of signals in which at least one of two adjacent digits, at any digit position of one or more digits of 2-based three digit redundant binary numbers with one signal of three digits {n, o, p} expressing a value {−1, 0, 1} as a one-digit signal, is a signal “o” expressing zero. Thus three digits {−1, 0, 1} are used instead of the two digit {0, 1} binary system used in conventional A/D or D/A converters.
Abstract:
A semi-flash type analog/digital converter for eliminating errors in its output signals which are caused by noise. The analog/digital converter includes a D/A converter for outputting a plurality of analog signals which are produced based on a plurality of input signals. A plurality of comparators compare the voltage of an analog input signal, provided via a sample and hold circuit, with the analog signals output from the D/A converter. The output from the comparators are supplied to two latches, which further provide the outputs to a plurality of encoders. One of the encoders encodes the signals provided by one of the latches and outputs signals representative of high order bits of a digital signal. A second encoder, which encodes output signals provided by the other latch, is a correction encoder. The correction encoder corrects the signals provided by the latch if it determines that any of the signals are in error, and outputs signals representing the lower order bits of a digital output signal. The correction encoder includes either a priority control circuit or an adder circuit which performs the correction.